Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at greater than 2500 Pa. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, minerals, and/or polymeric materials that outgas significantly. In this submission, we show NAP-XPS survey and Ca 2p, O 1s, and C 1s narrow scans from calcite, which was analyzed here without external charge compensation. Quantitation of the peaks in the narrow scan gives a ratio that is very close to the theoretical 1:1:3 ratio expected for Ca:C:O in the material. The small N 1s signal in the survey spectrum is attributed to residual nitrogen gas in the analysis chamber.

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