Near-ambient pressure–x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, 2s, 2p, 3s, 3p, and the Auger LMM NAP-XPS spectra from argon gas, a material that could not be analyzed at moderate pressures by conventional methods. A small N 1s signal from residual nitrogen gas in the chamber is also present in the survey spectrum.
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Research Article| July 16 2019
Argon gas, by near-ambient pressure XPS
Dhananjay I. Patel;
Paul Dietrich ;
Dhananjay I. Patel, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford; Argon gas, by near-ambient pressure XPS. Surf. Sci. Spectra 1 June 2019; 26 (1): 014024. https://doi.org/10.1116/1.5110408
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