CVD Cu₂O and CuO Nanosystems Characterized by XPS Available to Purchase

In the present investigation, X-ray photoelectron and X-ray excited Auger electron spectroscopy analyses of the principal core levels (O 1s, Cu 2p, and Cu LMM) of Cu₂O and CuO nanosystems are proposed. The samples were obtained by chemical vapor deposition starting from a novel second-generation copper(II) precursor, Cu(hfa)₂·TMEDA (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; TMEDA=N,N,N′,N′-tetramethylethylenediamine), under a dry O₂ atmosphere. The obtained route led to pure, homogeneous and single-phase Cu(I) and Cu(II) oxide nanosystems at temperatures of 300 and 500 °C, respectively, whose chemical nature could be conveniently distinguished by analyzing the Cu 2p band shape and position, as well as by evaluating the Auger parameters. The samples were characterized by O/Cu atomic ratios greater than the expected stoichiometric values, due to marked interactions with the outer atmosphere attributed to their high surface-to-volume ratio.