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Surface Science Spectra is an international journal & database devoted to supporting authors in publishing their data. SSS is an AVS archival journal and electronic database, that publishes basic materials characterization data that is peer-reviewed and available for you to plot yourself. Much of the data in SSS has also been made accessible through the interactive data analysis tool: eSpectra. More specifically, SSS publishes XPS, AES, SIMS, Spectroscopic Ellipsometry, LEIS, and UV-vis data on a wide range of materials in both regular and focused topic issues for use by individual investigators and as a reference for analytical laboratories.
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Featured Articles
Research Article
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October 23 2023
Mattia Benedet, Davide Barreca et al.
Nanocomposite systems based on iron(III) oxide (Fe2O3) and graphitic carbon nitride (gCN) possess a great potential as photo(electro)catalysts for environmental remediation and energy generation. In ...
Research Article
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August 29 2023
Elena Vaníčková, Stanislav Průša et al.
Low energy ion scattering is an analytical technique with extreme surface sensitivity. It enables qualitative and quantitative elemental analysis of the outermost atomic layer. Straightforward ...
Research Article
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August 25 2023
Gerald E. Jellison, Jr.
The optical functions of uniaxial ZnO are determined from 200 to 850 nm (6.2–1.46 eV) using three different ellipsometric techniques: (1) standard spectroscopic two-modulator generalized ellipsometry ...
Editor's Picks
Research Article
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November 27 2023
Pierre-Marie Deleuze, Nicolas Gauthier et al.
Monochromatic Cr Kα radiation (5414.8 eV) was used to acquire high-energy photoelectron spectroscopy data on pure W and bulk WSe2 compound. The reported spectra include a survey scan and ...
Research Article
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November 16 2023
Gioele Pagot, Mattia Benedet et al.
Nickel oxide (NiO) thin films are of great importance for a variety of technological applications, especially in (photo)electrocatalysis for clean energy production and pollutant degradation. In this ...
Research Article
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November 15 2023
Dong Zheng, Christopher N. Young et al.
Hard X-ray Photoelectron Spectroscopy (HAXPES) using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered potassium iodide (KI) sample. Survey data, ...
Most Recent
Research Article
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December 07 2023
C. Zborowski, A. Vanleenhove et al.
Hafnium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Hafnium obtained using monochromatic Cr Kα radiation at 5414.8 eV include ...
Research Article
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November 27 2023
Dong Zheng, Christopher N. Young et al.
Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered W sample. Survey data, high-resolution scans of all ...
Research Article
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November 27 2023
Pierre-Marie Deleuze, Nicolas Gauthier et al.
Monochromatic Cr Kα radiation (5414.8 eV) was used to acquire high-energy photoelectron spectroscopy data on pure W and bulk WSe2 compound. The reported spectra include a survey scan and ...

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