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Letters
Reaching homogeneous field emission current from clusters of emitters with nonuniform heights
In Special Collection:
Vacuum Nanoelectronics
J. Vac. Sci. Technol. B 41, 010601 (2023)
https://doi.org/10.1116/6.0002315
A novel thermionic crystal electron emission effect similar to Kikuchi lines
J. Vac. Sci. Technol. B 41, 010602 (2023)
https://doi.org/10.1116/6.0002375
ARTICLES
Electronic and Optoelectronic Materials, Devices and Processing
Fabrication, and Direct Current and cryogenic analysis of SF6-treated AlGaN/GaN Schottky barrier diodes
Quentin Fornasiero; Nicolas Defrance; Sylvie Lepilliet; Vanessa Avramovic; Yvon Cordier; Eric Frayssinet; Marie Lesecq; Nadir Idir; Jean-Claude De Jaeger
J. Vac. Sci. Technol. B 41, 012202 (2023)
https://doi.org/10.1116/6.0002125
Large-area 1D selective emitter for thermophotovoltaic applications in the mid-infrared
J. Vac. Sci. Technol. B 41, 012203 (2023)
https://doi.org/10.1116/6.0002198
Limitations of the independent control of ion flux and energy distribution function in high-density inductively coupled chlorine plasmas
J. Vac. Sci. Technol. B 41, 012205 (2023)
https://doi.org/10.1116/6.0002236
Observation of ground loop signals in GaN monolithically integrated devices
J. Vac. Sci. Technol. B 41, 012207 (2023)
https://doi.org/10.1116/6.0002245
Inelastic cotunneling in the Coulomb-blockade transport of donor-atom transistors
J. Vac. Sci. Technol. B 41, 012208 (2023)
https://doi.org/10.1116/5.0097509
Lithography
Long, stitch-free slot waveguide with s-bend tapered couplers for IR-sensing applications using electron beam lithography
J. Vac. Sci. Technol. B 41, 012601 (2023)
https://doi.org/10.1116/6.0002187
Surface property control for 193 nm immersion resist by addition of Si compound
J. Vac. Sci. Technol. B 41, 012602 (2023)
https://doi.org/10.1116/6.0002128
Effect of water vapor pressure on positive and negative tone electron-beam patterning of poly(methyl methacrylate)
J. Vac. Sci. Technol. B 41, 012604 (2023)
https://doi.org/10.1116/6.0002118
Nanoscale Science and Technology
Processing of experimental current-voltage characteristics of single tip emitters taking into account the functional dependence of the emission area on the applied voltage
In Special Collection:
Vacuum Nanoelectronics
J. Vac. Sci. Technol. B 41, 012801 (2023)
https://doi.org/10.1116/6.0002305
Spongy TiO2 layers deposited by gig-lox sputtering processes: Contact angle measurements
C. Spampinato; S. Valastro; E. Smecca; V. Arena; G. Mannino; A. La Magna; C. Corsaro; F. Neri; E. Fazio; A. Alberti
J. Vac. Sci. Technol. B 41, 012802 (2023)
https://doi.org/10.1116/6.0002225
On the charge density and potential near the surface of a field emitter
In Special Collection:
Vacuum Nanoelectronics
J. Vac. Sci. Technol. B 41, 012803 (2023)
https://doi.org/10.1116/6.0002278
Systematic study of InP/InGaAsP heated plasma etching and roughness improvement for integrated optical devices
J. Vac. Sci. Technol. B 41, 012804 (2023)
https://doi.org/10.1116/6.0002167
Implementation of high-performance and high-yield nanoscale hafnium zirconium oxide based ferroelectric tunnel junction devices on 300 mm wafer platform
In Special Collection:
Neuromorphic Materials, Devices, and Processing
Maximilian Liehr; Jubin Hazra; Karsten Beckmann; Vineetha Mukundan; Ioannis Alexandrou; Timothy Yeow; Joseph Race; Kandabara Tapily; Steven Consiglio; Santosh K. Kurinec; Alain C. Diebold; Nathaniel Cady
J. Vac. Sci. Technol. B 41, 012805 (2023)
https://doi.org/10.1116/6.0002097
Microelectronic and Nanoelectronic Devices
High sensitivity CIP2A detection for oral cancer using a rapid transistor-based biosensor module
Minghan Xian; Jenna L. Stephany; Chan-Wen Chiu; Chao-Ching Chiang; Fan Ren; Cheng-Tse Tsai; Siang-Sin Shan; Yu-Te Liao; Josephine F. Esquivel-Upshaw; Stephen J. Pearton
J. Vac. Sci. Technol. B 41, 013201 (2023)
https://doi.org/10.1116/6.0002175
Close-packed silicon field emitter arrays with integrated anode fabricated by electron-beam lithography
In Special Collection:
Vacuum Nanoelectronics
J. Vac. Sci. Technol. B 41, 013202 (2023)
https://doi.org/10.1116/6.0002295
Exploring electromechanical utility of GaAs interdigitated transducers; using finite-element-method-based parametric analysis and experimental comparison
Brian D. Rummel; Leonid Miroshnik; Andrew B. Li; Grant D. Heilman; Ganesh Balakrishnan; Talid Sinno; Sang M. Han
J. Vac. Sci. Technol. B 41, 013203 (2023)
https://doi.org/10.1116/6.0002169
Measurement and Characterization
Bulk and surface chemical compositions and microstructure properties of CaF2:Y3+ material
J. Vac. Sci. Technol. B 41, 014001 (2023)
https://doi.org/10.1116/6.0002279
Vacuum Measurement and Technology
System for interpolating work function for a cold-field emitter
In Special Collection:
Vacuum Nanoelectronics
J. Vac. Sci. Technol. B 41, 014201 (2023)
https://doi.org/10.1116/6.0002283
Transmission conductance of a cylindrical tube with wall pumping
J. Vac. Sci. Technol. B 41, 014202 (2023)
https://doi.org/10.1116/6.0002177
Future of plasma etching for microelectronics: Challenges and opportunities
Gottlieb S. Oehrlein, Stephan M. Brandstadter, et al.
Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications
Haochen Zhao, Suho Park, et al.
Filtering the beam from an ionic liquid ion source
Alexander C. G. Storey, Aydin Sabouri, et al.