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March 2008
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
ISSN 1071-1023
EISSN 1520-8567
Review Article
Characterization of semiconducting polymers for thin film transistors
J. Vac. Sci. Technol. B 26, 445–457 (2008)
https://doi.org/10.1116/1.2889407
Regular Articles
Fabrication process for cantilevers with integrated tunnel junctions
J. Vac. Sci. Technol. B 26, 481–486 (2008)
https://doi.org/10.1116/1.2836428
SiC via fabrication for wide-band-gap high electron mobility transistor/microwave monolithic integrated circuit devices
L. F. Voss; K. Ip; S. J. Pearton; R. J. Shul; M. E. Overberg; A. G. Baca; C. Sanchez; J. Stevens; M. Martinez; M. G. Armendariz; G. A. Wouters
J. Vac. Sci. Technol. B 26, 487–494 (2008)
https://doi.org/10.1116/1.2837849
Optical and electrical properties of amorphous zinc tin oxide thin films examined for thin film transistor application
J. Vac. Sci. Technol. B 26, 495–501 (2008)
https://doi.org/10.1116/1.2839860
Improvement on cold carbon field-electron emitter for commercial x-ray tube
J. Vac. Sci. Technol. B 26, 502–505 (2008)
https://doi.org/10.1116/1.2839861
Multilayer soft mold for UV imprinting the pitch dot array
J. Vac. Sci. Technol. B 26, 514–517 (2008)
https://doi.org/10.1116/1.2839880
Electrical biasing and time dependent evolution of defects in poly(triphenylamine)-butane vinyl organic semiconductor devices
J. Vac. Sci. Technol. B 26, 518–524 (2008)
https://doi.org/10.1116/1.2842300
Defects in CdHgTe grown by molecular beam epitaxy on (211)B-oriented CdZnTe substrates
J. Vac. Sci. Technol. B 26, 525–533 (2008)
https://doi.org/10.1116/1.2868782
Optimization of resolution-enhancement technology and dual-layer bottom-antireflective coatings in hypernumerical aperture lithography
J. Vac. Sci. Technol. B 26, 534–540 (2008)
https://doi.org/10.1116/1.2870220
Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout
M. Cocuzza; I. Ferrante; A. Ricci; E. Giuri; L. Scaltrito; D. Bich; A. Merialdo; P. Schina; R. Correale
J. Vac. Sci. Technol. B 26, 541–550 (2008)
https://doi.org/10.1116/1.2870221
Effects of Mo seeding on the formation of Si nanodots during low-energy ion bombardment
J. Vac. Sci. Technol. B 26, 551–558 (2008)
https://doi.org/10.1116/1.2870222
Electrical properties of conductive and resistive ZnSe layers
D. C. Oh; I. H. Im; S. H. Park; T. Hanada; T. Yao; J. S. Song; J. H. Chang; H. Makino; C. S. Han; K. H. Koo
J. Vac. Sci. Technol. B 26, 559–565 (2008)
https://doi.org/10.1116/1.2884758
Comparison of deep silicon etching using and plasmas in the Bosch process
J. Vac. Sci. Technol. B 26, 576–581 (2008)
https://doi.org/10.1116/1.2884763
High-aspect-ratio nanopillar structures fabricated by nanoimprinting with elongation phenomenon
J. Vac. Sci. Technol. B 26, 582–584 (2008)
https://doi.org/10.1116/1.2889396
Indium-doped ZnO nanospirals synthesized by thermal evaporation
J. Vac. Sci. Technol. B 26, 585–588 (2008)
https://doi.org/10.1116/1.2889418
Fabrication of suspended dielectric mirror structures via xenon difluoride etching of an amorphous germanium sacrificial layer
J. Vac. Sci. Technol. B 26, 593–597 (2008)
https://doi.org/10.1116/1.2890673
Simulation study on stress and deformation of polymeric patterns during the demolding process in thermal imprint lithography
J. Vac. Sci. Technol. B 26, 598–605 (2008)
https://doi.org/10.1116/1.2890693
Patterning chalcogenide glass by direct resist-free thermal nanoimprint
J. Vac. Sci. Technol. B 26, 606–610 (2008)
https://doi.org/10.1116/1.2890699
Assessment of the performance of scanning capacitance microscopy for -type gallium nitride
J. Vac. Sci. Technol. B 26, 611–617 (2008)
https://doi.org/10.1116/1.2890705
Comparative study on temperature-dependent characteristics of single- and double-heterojunction bipolar transistors
Wei-Hsin Chen; Tzu-Pin Chen; Chi-Jhung Lee; Ching-Wen Hung; Kuei-Yi Chu; Li-Yang Chen; Tsung-Han Tsai; Wen-Chau Liu
J. Vac. Sci. Technol. B 26, 618–623 (2008)
https://doi.org/10.1116/1.2890707
Optimization of electrical characteristics of gadolinium incorporated GaAs -type metal-oxide semiconductor capacitors with silicon-interface-passivation layer
Sung Il Park; Injo Ok; Hyoung-Sub Kim; Feng Zhu; Manhong Zhang; Jung Hwan Yum; Zhao Han; Jack C. Lee
J. Vac. Sci. Technol. B 26, 624–626 (2008)
https://doi.org/10.1116/1.2890708
Characteristics of an composite-emitter heterojunction bipolar transistor (CEHBT)
J. Vac. Sci. Technol. B 26, 627–631 (2008)
https://doi.org/10.1116/1.2897318
Three-dimensional metal patterning over nanostructures by reversal imprint
J. Vac. Sci. Technol. B 26, 632–635 (2008)
https://doi.org/10.1116/1.2897319
Effect of growth temperature on InGaSb metamorphic layers and the fabrication of InGaSb diodes
J. Vac. Sci. Technol. B 26, 636–642 (2008)
https://doi.org/10.1116/1.2898493
Novel method for measuring nanofriction by atomic force microscope
J. Vac. Sci. Technol. B 26, 643–650 (2008)
https://doi.org/10.1116/1.2890694
Enhanced growth of anodic alumina nanochannels on Ga-ion pre-irradiated aluminum
J. Vac. Sci. Technol. B 26, 651–654 (2008)
https://doi.org/10.1116/1.2890706
Sidewall passivation assisted by a silicon coverplate during and HBr inductively coupled plasma etching of InP for photonic devices
J. Vac. Sci. Technol. B 26, 666–674 (2008)
https://doi.org/10.1116/1.2898455
Synthesis of epitaxial silicon nanowires on Si(111) substrates using ultrahigh vacuum magnetron sputtering
J. Vac. Sci. Technol. B 26, 675–677 (2008)
https://doi.org/10.1116/1.2898489
Brief Reports and Comments
Deep-UV exposure of poly(methyl methacrylate) at 254 nm using low-pressure mercury vapor lamps
J. Vac. Sci. Technol. B 26, 682–685 (2008)
https://doi.org/10.1116/1.2890688
PAPERS FROM THE 20th INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE
Applications
Fabrication and operation of triode electron emitters as ion source for miniature mass spectrometer
J. Vac. Sci. Technol. B 26, 689–693 (2008)
https://doi.org/10.1116/1.2835065
Injection-locked millimeter wave oscillator based on field-emission cathodes
J. Vac. Sci. Technol. B 26, 694–697 (2008)
https://doi.org/10.1116/1.2897324
Fabrication of field-emission cathode ray tube with a unique nanostructure carbon electron emitter
J. Vac. Sci. Technol. B 26, 698–701 (2008)
https://doi.org/10.1116/1.2837853
Development of high spatial resolution x-ray radiography system equipped with multiwalled carbon nanotube field emission cathode
J. Vac. Sci. Technol. B 26, 702–705 (2008)
https://doi.org/10.1116/1.2894879
Carbon nanotube cold cathodes for application in low current x-ray tubes
J. Vac. Sci. Technol. B 26, 706–710 (2008)
https://doi.org/10.1116/1.2802092
Development of a super-high-sensitivity image sensor using active-matrix high-efficiency electron emission device
Nobuyasu Negishi; Takanobu Sato; Youhei Matsuba; Ryota Tanaka; Tomonari Nakada; Kazuto Sakemura; Yoshiyuki Okuda; Atsushi Watanabe; Takamasa Yoshikawa; Kiyohide Ogasawara; Masakazu Nanba; Saburo Okazaki; Kenkichi Tanioka; Norifumi Egami; Nobuyoshi Koshida
J. Vac. Sci. Technol. B 26, 711–715 (2008)
https://doi.org/10.1116/1.2894896
Characteristics of nanosilicon ballistic cold cathode in aqueous solutions as an active electrode
J. Vac. Sci. Technol. B 26, 716–719 (2008)
https://doi.org/10.1116/1.2837858
Evidence of electronic cooling from resonance states of nanocrystalline graphite field emitters
J. Vac. Sci. Technol. B 26, 720–723 (2008)
https://doi.org/10.1116/1.2837870
Field emission at nanometer distances for high-resolution positioning
J. Vac. Sci. Technol. B 26, 724–729 (2008)
https://doi.org/10.1116/1.2894898
Characterization
Thermal-field treatment for creating single-crystal tungsten tips with ultimate sharpness
J. Vac. Sci. Technol. B 26, 738–744 (2008)
https://doi.org/10.1116/1.2835069
Multi-walled nanotube polymer composite degradation under high emission current regime as revealed by mass spectrometry
J. Vac. Sci. Technol. B 26, 745–750 (2008)
https://doi.org/10.1116/1.2894895
Modification of the field enhancement factor for a field emitter with a surrounding electrode stabilized using a field effect transistor
J. Vac. Sci. Technol. B 26, 751–754 (2008)
https://doi.org/10.1116/1.2827502
Polymer embedded C nanopearls field emission cathodes for time of flight mass spectrometers
J. Vac. Sci. Technol. B 26, 755–759 (2008)
https://doi.org/10.1116/1.2805247
Arrays
Field emission characteristics of a lanthanum monosulfide cold cathode array fabricated using microelectromechanical systems technology
J. Vac. Sci. Technol. B 26, 764–769 (2008)
https://doi.org/10.1116/1.2837893
One-dimensional combined field and thermionic emission model and comparison with experimental results
J. Vac. Sci. Technol. B 26, 770–777 (2008)
https://doi.org/10.1116/1.2884755
Field electron emission from free-standing flexible PDMS-supported carbon-nanotube-array films
J. Vac. Sci. Technol. B 26, 778–781 (2008)
https://doi.org/10.1116/1.2827503
Electron-emission properties of silicon field-emitter arrays in gaseous ambient for charge-compensation device
Mitsuaki Takeuchi; Toshihiko Kojima; Atsushi Oowada; Yasuhito Gotoh; Masayoshi Nagao; Hiroshi Tsuji; Junzo Ishikawa; Sigeki Sakai; Tsunenobu Kimoto
J. Vac. Sci. Technol. B 26, 782–787 (2008)
https://doi.org/10.1116/1.2897335
Theory
Possibility of generating terahertz radiation by photomixing with clusters of carbon nanotubes
J. Vac. Sci. Technol. B 26, 794–799 (2008)
https://doi.org/10.1116/1.2837894
Energy exchange in field emission from semiconductors
J. Vac. Sci. Technol. B 26, 800–805 (2008)
https://doi.org/10.1116/1.2822944
Modeling of linear carbon nanotube nanotriodes with improved field uniformity
J. Vac. Sci. Technol. B 26, 806–812 (2008)
https://doi.org/10.1116/1.2831504
Electroluminescence of silicon nanoclusters excited by tunneling carrier injection
J. Vac. Sci. Technol. B 26, 813–820 (2008)
https://doi.org/10.1116/1.2830626
Work functions of cathode surfaces with adsorbed atoms based on ab initio calculations
J. Vac. Sci. Technol. B 26, 821–825 (2008)
https://doi.org/10.1116/1.2830624
Fitting nonlinear Fowler-Nordheim plots of field emission strips with a self-consistent parallel plane model
J. Vac. Sci. Technol. B 26, 826–830 (2008)
https://doi.org/10.1116/1.2839884
Application of a general electron emission equation to surface nonuniformity and current density variation
Kevin L. Jensen; John J. Petillo; Eric J. Montgomery; Zhigang Pan; Donald W. Feldman; Patrick G. O’Shea; Nathan A. Moody; M. Cahay; Joan E. Yater; Jonathan L. Shaw
J. Vac. Sci. Technol. B 26, 831–837 (2008)
https://doi.org/10.1116/1.2827508
Carbon Nanotubes
Toward a lateral carbon nanotube based field emission triode
J. Vac. Sci. Technol. B 26, 838–841 (2008)
https://doi.org/10.1116/1.2805248
In situ field emission characterization of multiwalled carbon nanotubes
J. Vac. Sci. Technol. B 26, 842–846 (2008)
https://doi.org/10.1116/1.2837895
Field emission properties of single-walled carbon nanotube with amphoteric doping by encapsulation of TTF and TCNQ
J. Vac. Sci. Technol. B 26, 847–850 (2008)
https://doi.org/10.1116/1.2870223
Fabrication of transparent single wall carbon nanotube films with low sheet resistance
J. Vac. Sci. Technol. B 26, 851–855 (2008)
https://doi.org/10.1116/1.2827507
Effect of electrical aging on field emission from carbon nanotube field emitter arrays
J. Vac. Sci. Technol. B 26, 856–859 (2008)
https://doi.org/10.1116/1.2884757
Novel Materials
Improving the electron emission properties of ion-beam-synthesized nanocomposites by pulsed laser annealing
J. Vac. Sci. Technol. B 26, 860–863 (2008)
https://doi.org/10.1116/1.2824970
Improvement of emission efficiency of nanocrystalline silicon planar cathodes
J. Vac. Sci. Technol. B 26, 864–867 (2008)
https://doi.org/10.1116/1.2839886
Cold field emission from HfC(310)
J. Vac. Sci. Technol. B 26, 868–871 (2008)
https://doi.org/10.1116/1.2812535
Improved field emission characteristics of individual carbon nanotube coated with boron nitride nanofilm
Yuji Morihisa; Chiharu Kimura; Makoto Yukawa; Hidemitsu Aoki; Takumi Kobayashi; Shigeki Hayashi; Seiji Akita; Yoshikazu Nakayama; Takashi Sugino
J. Vac. Sci. Technol. B 26, 872–875 (2008)
https://doi.org/10.1116/1.2822990
Extension of lifetime of silicon field emitter arrays in oxygen ambient by carbon negative ion implantation
J. Vac. Sci. Technol. B 26, 876–879 (2008)
https://doi.org/10.1116/1.2837896
Density control of carbon nanofibers on titanium buffer layer using electroplated Ni catalyst
J. Vac. Sci. Technol. B 26, 880–884 (2008)
https://doi.org/10.1116/1.2839888
Field emission properties of metallic nanostructures self-assembled on nanoporous alumina and silicon templates
M. Cahay; K. Garre; J. W. Fraser; D. J. Lockwood; V. Semet; Vu Thien Binh; B. Kanchibotla; S. Bandyopadhyay; L. Grazulis; B. Das
J. Vac. Sci. Technol. B 26, 885–890 (2008)
https://doi.org/10.1116/1.2824979
Field emission from lanthanum monosulfide thin films grown on the (100) magnesium oxide substrates
J. Vac. Sci. Technol. B 26, 891–897 (2008)
https://doi.org/10.1116/1.2837909
Letters
Fabrication of nanopores with subnanometer precision on poly(methyl methacrylate) nanofibers by in situ electron beam irradiation
J. Vac. Sci. Technol. B 26, L28–L31 (2008)
https://doi.org/10.1116/1.2894897
Future of plasma etching for microelectronics: Challenges and opportunities
Gottlieb S. Oehrlein, Stephan M. Brandstadter, et al.
Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications
Haochen Zhao, Suho Park, et al.
Machine learning driven measurement of high-aspect-ratio nanostructures using Mueller matrix spectroscopic ellipsometry
Shiva Mudide, Nick Keller, et al.