We experimentally demonstrate a low-cost transfer process of GeSn ribbons to insulating substrates for short-wave infrared (SWIR) sensing/imaging applications. By releasing the original compressive GeSn layer to nearly fully relaxed state GeSn ribbons, the room-temperature spectral response of the photodetector is further extended to 3.2 μm, which can cover the entire SWIR range. Compared with the as-grown GeSn reference photodetectors, the fabricated GeSn ribbon photodetectors have a fivefold improvement in the light-to-dark current ratio, which can improve the detectivity for high-performance photodetection. The transient performance of a GeSn ribbon photodetector is investigated with a rise time of about 40 μs, which exceeds the response time of most GeSn (Ge)-related devices. In addition, this transfer process can be applied on various substrates, making it a versatile technology that can be used for various applications ranging from optoelectronics to large-area electronics. These results provide insightful guidance for the development of low-cost and high-speed SWIR photodetectors based on Sn-containing group IV low-dimensional structures.
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July 2024
Research Article|
June 12 2024
Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications
Special Collection:
Developing SiGeSn Technology: Materials and Devices
Haochen Zhao
;
Haochen Zhao
(Data curation, Formal analysis, Investigation, Methodology, Validation, Visualization, Writing – original draft)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Suho Park;
Suho Park
(Conceptualization, Methodology, Writing – review & editing)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Guangyang Lin;
Guangyang Lin
(Investigation, Methodology)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Yuying Zhang
;
Yuying Zhang
(Methodology)
2
Department of Materials Science and Engineering, University of Delaware
, Newark, Delaware 19716
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Tuofu Zhama;
Tuofu Zhama
(Methodology)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Chandan Samanta
;
Chandan Samanta
(Methodology)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Lorry Chang
;
Lorry Chang
(Methodology)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Xiaofeng Zhu
;
Xiaofeng Zhu
(Methodology)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716
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Xu Feng;
Xu Feng
(Methodology)
3
Surface Analysis Facility, University of Delaware
, Newark, Delaware 19716
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Kevin O. Díaz-Aponte
;
Kevin O. Díaz-Aponte
(Methodology)
4
Department of Physics and Engineering, Delaware State University
, Dover, Delaware 19901
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Lin Cong
;
Lin Cong
(Methodology)
4
Department of Physics and Engineering, Delaware State University
, Dover, Delaware 19901
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Yuping Zeng
Yuping Zeng
a)
(Conceptualization, Funding acquisition, Methodology, Project administration, Supervision, Writing – review & editing)
1
Department of Electrical and Computer Engineering, University of Delaware
, Newark, Delaware 19716a)Author to whom correspondence should be addressed: [email protected]
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a)Author to whom correspondence should be addressed: [email protected]
J. Vac. Sci. Technol. B 42, 042205 (2024)
Article history
Received:
February 20 2024
Accepted:
May 15 2024
Citation
Haochen Zhao, Suho Park, Guangyang Lin, Yuying Zhang, Tuofu Zhama, Chandan Samanta, Lorry Chang, Xiaofeng Zhu, Xu Feng, Kevin O. Díaz-Aponte, Lin Cong, Yuping Zeng; Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications. J. Vac. Sci. Technol. B 1 July 2024; 42 (4): 042205. https://doi.org/10.1116/6.0003561
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