SiO2 layers deposited at temperatures (lower than 700 °C) have attracted a great deal of attention for a large variety of applications, since they can be used for dielectric isolation, a needed approach for multilayer, multifunctional coatings that exhibit two or more properties simultaneously. A similar phenomenon occurred with Si-rich SiO2, a two-phase material in which excess silicon, introduced during the deposition process of the films, forms a Si inclusion phase uniformly embedded in a SiO2 matrix, modifying its optical and electrical characteristics. In this short review, the synthesis methods to obtain high electronic quality SiO2 deposited films at low temperatures, as well as Si-rich SiO2 films (mainly the chemical vapor deposition technique in different versions), precursor materials, and characteristic properties, will be described together with some of their applications, beyond integrated circuit technology, that have become relevant in recent times. This is the case of solar filters, antireflecting coatings for solar cell panels, light emitting devices or liquid crystal displays, and bioimaging and theranostic applications.
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Review Article|
April 17 2023
Low temperature (<700 °C) SiO2 and Si-rich SiO2 films: Short review
Ciro Falcony
;
Ciro Falcony
a)
(Conceptualization, Methodology, Writing – original draft, Writing – review & editing)
1
Departamento de Física, Centro de Investigación y Estudios Avanzados del IPN
, Av. IPN 2508, CDMX, Mexico 07360, Mexico
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Denise Estrada-Wiese
;
Denise Estrada-Wiese
(Writing – original draft, Writing – review & editing)
2
Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE)
, Luis Enrique Erro 1, Tonantzintla, Puebla 72840, Mexico
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Jessica De Anda
;
Jessica De Anda
(Writing – original draft, Writing – review & editing)
1
Departamento de Física, Centro de Investigación y Estudios Avanzados del IPN
, Av. IPN 2508, CDMX, Mexico 07360, Mexico
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Oscar Pérez-Díaz
;
Oscar Pérez-Díaz
(Writing – original draft)
2
Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE)
, Luis Enrique Erro 1, Tonantzintla, Puebla 72840, Mexico
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Mariano Aceves-Mijares
Mariano Aceves-Mijares
(Conceptualization, Methodology, Writing – original draft, Writing – review & editing)
2
Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE)
, Luis Enrique Erro 1, Tonantzintla, Puebla 72840, Mexico
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a)
Electronic mail: cfalcony@fis.cinvestav.mx
J. Vac. Sci. Technol. B 41, 030801 (2023)
Article history
Received:
January 27 2023
Accepted:
March 24 2023
Citation
Ciro Falcony, Denise Estrada-Wiese, Jessica De Anda, Oscar Pérez-Díaz, Mariano Aceves-Mijares; Low temperature (<700 °C) SiO2 and Si-rich SiO2 films: Short review. J. Vac. Sci. Technol. B 1 May 2023; 41 (3): 030801. https://doi.org/10.1116/6.0002531
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