In this study, we generated 25 multielectron beam (MEB) using an InGaN photocathode with a negative electron affinity state irradiating with 25 multilaser beam. The uniformity of the MEB and the total electron beam current were evaluated. A laser beam was split into 25 laser beams using a spatial light modulator. The coefficient of variation (CV) of laser power was 20%. The CV of quantum efficiency was 1.1%. The CV of electron beam current was 12%, and the total current was about 1.2 μA. These results will enhance the development of the MEB‐defect inspection using the InGaN photocathode.
REFERENCES
1.
M.
Mukhtar
, “Assessing a multi-electron beam application approach for semiconductor process metrology,” Ph.D. thesis
(State University of New York Polytechnic Institute
, 2018
).2.
A. L.
Eberle
, S.
Mikula
, R.
Schalek
, J.
Lichtman
, M. L.
Knothe Tate
, and D.
Zeidler
, J. Microsc.
259
, 114
(2015
). 3.
E.
Ma
, K.
Chou
, X.
Liu
, W.
Ren
, X.
Hu
, and F.
Wang
, Proc. SPIE
10810
, 1081014
(2018
). 4.
E.
Ma
et al., Proc. SPIE
10959
, 109591R
(2018
). 5.
W.
Ren
et al., Proc. SPIE
11177
, 111770D
(2020
). 6.
Y.
Zhang
and P.
Kruit
, J. Vac. Sci. Technol. B
25
, 2239
(2007
). 7.
D. A.
Orlov
, U.
Weigel
, D.
Schwalm
, A. S.
Terekhov
, and A.
Wolf
, Nucl. Instrum. Methods Phys. Res. A
532
, 418
(2004
). 8.
D. A.
Orlov
, M.
Hoppe
, U.
Weigel
, D.
Schwalm
, A. S.
Terekhov
, and A.
Wolf
, Appl. Phys. Lett.
78
, 2721
(2001
). 9.
F.
Machuca
, Z.
Liu
, J. R.
Maldonado
, S. T.
Coyle
, P.
Pianetta
, and R. F. W.
Pease
, J. Vac. Sci. Technol. B
22
, 3565
(2004
). 10.
Z.
Liu
et al., Appl. Phys. Lett.
85
, 1541
(2004
). 11.
D.
Sato
, T.
Nishitani
, Y.
Honda
, and H.
Amano
, J. Vac. Sci. Technol. B
38
, 012603
(2020
). 12.
A. W.
Baum
, J. E.
Schneider
, R. F. W.
Pease
, M. A.
McCord
, W. E.
Spicer
, K. A.
Costello
, and V. W.
Aebi
, J. Vac. Sci. Technol. B
15
, 2707
(1997
). 13.
J. E.
Schneider
et al., J. Vac. Sci. Technol. B
16
, 3192
(1998
). 14.
K.
Aulenbacher
, J.
Schuler
, D. V.
Harrach
, E.
Reichert
, J.
Röthgen
, A.
Subashev
, V.
Tioukine
, and Y.
Yashin
, J. Appl. Phys.
92
, 7536
(2002
). 15.
W. E.
Spicer
, Appl. Phys.
130
, 115
(1977
). 16.
F.
Machuca
, Z.
Liu
, Y.
Sun
, P.
Pianetta
, W. E.
Spicer
, and R. F. W.
Pease
, J. Vac. Sci. Technol. B
21
, 1863
(2003
). 17.
T.
Nishitani
, M.
Tabuchi
, H.
Amano
, T.
Maekawa
, M.
Kuwahara
, and T.
Meguro
, J. Vac. Sci. Technol. B
32
, 06F901
(2014
). 18.
T.
Nishitani
, T.
Maekawa
, M.
Tabuchi
, T.
Meguro
, Y.
Honda
, and H.
Amano
, Proc. SPIE
9363
, 93630T
(2015
). 19.
D.
Sato
, A.
Honda
, A.
Koizumi
, T.
Nishitani
, Y.
Honda
, and H.
Amano
, Microelectron. Eng.
223
, 111229
(2020
). 20.
H.
Toyoda
, T.
Inoue
, N.
Mukozaka
, T.
Hara
, and M. H.
Wu
, Dig. Tech. Pap. SID Int. Symp.
45
, 559
(2014
). 21.
N.
Thakahashi
, S.
Tanaka
, M.
Ichikawa
, C. Q.
Yong
, and M.
Kamada
, J. Phys. Soc. Jpn.
66
, 2798
(1997
). 22.
T.
Nishitani
, M.
Tabuchi
, K.
Motoki
, T.
Takashima
, A.
Era
, and Y.
Takeda
, J. Phys. Conf. Ser.
298
, 012010
(2011
). 23.
D.
Sato
, T.
Nishitani
, Y.
Honda
, and H.
Amano
, Jpn. J. Appl. Phys.
55
, 05FH05
(2016
). 24.
J.
Grames
, R.
Suleiman
, P. A.
Adderley
, J.
Clark
, J.
Hansknecht
, D.
Machie
, M.
Poelker
, and M. L.
Stutzman
, Phys. Rev. Accel. Beams
14
, 043501
(2011
). 25.
N.
Chanlek
, J. D.
Herbert
, R. M.
Jones
, L. B.
Jones
, K. J.
Middleman
, and B. L.
Militsyn
, J. Phys. D: Appl. Phys.
47
, 055110
(2014
). 26.
G. A.
Mulhollan
, A. V.
Subashiev
, J. E.
Clendenin
, E. L.
Garwin
, R. E.
Kirby
, T.
Maruyama
, and R.
Prepost
, Phys. Lett. A
282
, 309
(2001
). © 2021 Author(s). Published under an exclusive license by the AVS.
2021
Author(s)
You do not currently have access to this content.