Depth profiles of thin, latex films using gas cluster ion beam (GCIB) secondary ion mass spectrometry (SIMS) show an oscillation of surfactants and polymer signal that is related to the organization of the particles in the film as layers. These results demonstrate the application of GCIB-SIMS to the distribution of water soluble species with molecular sensitivity, which has implications to film performance in areas of adhesion, appearance, and cohesion. Specifically, surfactant species were found at the highest concentrations at the air interface, decreasing through the top few particle layers to a steady state, whereas salt-rich species (sulfates, oligomers) were found at every particle boundary with a high concentration at the substrate interface.
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Research Article|
May 21 2018
Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling
Special Collection:
Special Issue: AVS 64
Michaeleen L. Pacholski;
Michaeleen L. Pacholski
a)
The Dow Chemical Company
, 400 Arcola Rd., Collegeville, Pennsylvania 19426
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Zhaohui Qu;
Zhaohui Qu
Rohm and Haas (China) Holding Co., Ltd. (a Member of The Dow Chemical Company)
, No. 936 Zhangheng Road, Zhangjiang Hi-Tech Park, Pudong New District, Shanghai 201203, China
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Wuye Ouyang;
Wuye Ouyang
Rohm and Haas (China) Holding Co., Ltd. (a Member of The Dow Chemical Company)
, No. 936 Zhangheng Road, Zhangjiang Hi-Tech Park, Pudong New District, Shanghai 201203, China
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Zhibo Zheng;
Zhibo Zheng
Beijing National Laboratory for Molecular Sciences, Key Laboratory of Polymer Chemistry and Physics of Ministry of Education, College of Chemistry and Molecular Engineering, Peking University
, Beijing 100871, China
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Rong Wang
Rong Wang
Beijing National Laboratory for Molecular Sciences, Key Laboratory of Polymer Chemistry and Physics of Ministry of Education, College of Chemistry and Molecular Engineering, Peking University
, Beijing 100871, China
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a)
Electronic mail: [email protected]
J. Vac. Sci. Technol. B 36, 03E105 (2018)
Article history
Received:
January 30 2018
Accepted:
May 04 2018
Citation
Michaeleen L. Pacholski, Zhaohui Qu, Wuye Ouyang, Zhibo Zheng, Rong Wang; Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling. J. Vac. Sci. Technol. B 1 May 2018; 36 (3): 03E105. https://doi.org/10.1116/1.5024044
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