The authors present a new Monte Carlo tool capable of simulating electron trajectories in nanotube forests, taking into account the underlying nanoscale nature of the material. The scattering angle distribution is adaptively modified at each step of the simulation according to the local environment (how the nanotubes are positioned, their diameters, and internanotube distances). This provides additional degrees of freedom in the Monte Carlo simulation that are directly related to the internal structure of the nanotube forest, allowing the model to closely match experimental data.
REFERENCES
1.
K. G.
McKay
, Secondary Electron Emission: Recent Advances in Electronics
(Academic
, New York
, 1948
), Vol. 1
, p. 65
.2.
E. M.
Baroody
, Phys. Rev.
78
, 780
(1950
).3.
A. J.
Dekker
, Phys. Rev. Lett.
4
, 55
(1960
).4.
C. G. H.
Walker
, M. M.
El-Gomati
, A. M. D.
Assa’d
, and M.
Zadražil
, Scanning
30
, 365
(2008
).5.
L.
Reimer
, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
(Springer
, Berlin
, 1998
), Vol. 45
, p. 135
.6.
D. C.
Joy
, Monte Carlo Modeling for Electron Microscopy and Microanalysis
(Oxford University Press
, New York
, 1995
), Vol. 9
, p. 25
.7.
S.
Pendyala
, J. W.
McGowan
, P. H. R.
Orth
, and P. W.
Zitzewitz
, Rev. Sci. Instrum.
45
, 1347
(1974
).8.
D.
Shapira
, T. A.
Lewis
, L. D.
Hulett
, Jr., and Z.
Ciao
, Nucl. Instrum. Methods Phys. Res. A
449
, 396
(2000
).9.
R. H.
Baughman
, A. A.
Zakhidov
, and W. A.
de Heer
, Science
297
, 787
(2002
).10.
T.
Brintlinger
, Y. -F.
Chen
, T.
Dürkop
, E.
Cobas
, M. S.
Fuhrer
, J. D.
Barry
, and J.
Melngailis
, Appl. Phys. Lett.
81
, 2454
(2002
).11.
A.
Nojeh
, W. -K.
Wong
, A. W.
Baum
, R. F. W.
Pease
, and H.
Dai
, Appl. Phys. Lett.
85
, 112
(2004
).12.
P.
Finnie
, K.
Kaminska
, Y.
Homma
, D. G.
Austing
, and J.
Lefebvre
, Nanotechnology
19
, 335202
(2008
).13.
Y.
Homma
, S.
Suzuki
, Y.
Kobayashi
, M.
Nagase
, and D.
Takagi
, Appl. Phys. Lett.
84
, 1750
(2004
).14.
W. K.
Wong
, A.
Nojeh
, and R. F. W.
Pease
, Scanning
28
, 219
(2006
).15.
W.
Yi
et al., J. Appl. Phys.
89
, 4091
(2001
).16.
W. S.
Kim
et al., Appl. Phys. Lett.
81
, 1098
(2002
).17.
J.
Lee
, J.
Park
, K.
Sim
, and W.
Yi
, J. Vac. Sci. Technol. B
27
, 626
(2009
).18.
A.
Rivacoba
and F. J. G.
de Abajo
, Phys. Rev. B
67
, 085414
(2003
).19.
I.
Kyriakou
, D.
Emfietzoglou
, R.
Garcia-Molina
, I.
Abril
, and K.
Kostarelos
, Appl. Phys. Lett.
94
, 263113
(2009
).20.
D.
Emfietzoglou
, I.
Kyriakou
, R.
Garcia-Molina
, I.
Abril
, and K.
Kostarelos
, J. Appl. Phys.
108
, 054312
(2010
).21.
A.
Nojeh
, B.
Shan
, K.
Cho
, and R. F. W.
Pease
, Phys. Rev. Lett.
96
, 056802
(2006
).22.
M. K.
Alam
, S. P.
Eslami
, and A.
Nojeh
, Physica E (Amsterdam)
42
, 124
(2009
).23.
M.
Dapor
, Electron-Beam Interactions with Solids: Application of Monte Carlo Method to Electron Scattering Problems
(Springer
, New York
, 2003
), Vol. 186
, p. 69
.24.
M. K.
Alam
, P.
Yaghoobi
, and A.
Nojeh
, Scanning
31
, 221
(2009
).25.
R.
Browning
, T. Z.
Li
, B.
Chui
, J.
Ye
, R. F. W.
Pease
, Z.
Czyzewski
, and D. C.
Joy
, Scanning
17
, 250
(1995
).26.
W. R.
Leo
, Techniques for Nuclear and Particle Physics Experiments: A How To Approach
(Springer
, New York
, 2005
), Vol. 1
, p. 24
.27.
28.
N. W. M.
Ritchie
, Surf. Interface Anal.
37
, 1006
(2005
).29.
D.
Drouin
, A. R.
Couture
, D.
Joly
, X.
Tastet
, V.
Aimez
, and R.
Gauvin
, Scanning
29
, 92
(2007
).30.
D. N.
Futaba
et al., Nature Mater.
5
, 987
(2006
).© 2010 American Vacuum Society.
2010
American Vacuum Society
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