To fabricate master templates of high-density patterned magnetic media, the authors developed a high-resolution and high-throughput rotary stage electron beam mastering system. They accomplished the fabrication of discrete track media groove patterns with track pitch, and also a dense bit array with both track and bit pitch of for bit patterned media under the conditions of a bit rate of at acceleration voltage. The high resolution and high throughput are derived from using a continuous stage movement flyback lithography (CSFL) function. CSFL is enabled by differentiated capabilities, such as an electron optical column that achieves a large beam current at a small beam diameter, and a friction-driven slider stage that provides a highly accurate positioning capability and a dynamic focus correction feature and -theta stage driving. The CSFL capability, working in conjunction with a blankingless beam shift lithography (BLSL), is very effective for fabricating various kinds of servo pattern elements, such as grooves and dots, grooves and right-angled grooves, grooves and half-pitch-shift dot arrays, and various pit length patterns, to construct effective servo patterns.
Skip Nav Destination
,
,
,
,
,
,
,
,
,
,
Article navigation
November 2008
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Research Article|
December 01 2008
Potential of a rotary stage electron beam mastering system for fabricating patterned magnetic media
T. Miyazaki;
T. Miyazaki
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japan
Search for other works by this author on:
K. Hayashi;
K. Hayashi
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japan
Search for other works by this author on:
K. Kobayashi;
K. Kobayashi
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japan
Search for other works by this author on:
Y. Kuba;
Y. Kuba
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japan
Search for other works by this author on:
H. Ohyi;
H. Ohyi
a)
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japan
Search for other works by this author on:
T. Obara;
T. Obara
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
O. Mizuta;
O. Mizuta
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
N. Murayama;
N. Murayama
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
N. Tanaka;
N. Tanaka
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
Y. Kawamura;
Y. Kawamura
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
H. Uemoto
H. Uemoto
Ricoh Company, Ltd.
, 1005 Shimo-Ogino, Atsugi, Kanagawa 243-0298, Japan
Search for other works by this author on:
T. Miyazaki
K. Hayashi
K. Kobayashi
Y. Kuba
H. Ohyi
a)
T. Obara
O. Mizuta
N. Murayama
N. Tanaka
Y. Kawamura
H. Uemoto
Crestec Corporation
, 1-9-2, Owada, Hachioji, Tokyo, 192-0045, Japana)
Electronic mail: [email protected]
J. Vac. Sci. Technol. B 26, 2611–2618 (2008)
Article history
Received:
June 20 2008
Accepted:
October 07 2008
Citation
T. Miyazaki, K. Hayashi, K. Kobayashi, Y. Kuba, H. Ohyi, T. Obara, O. Mizuta, N. Murayama, N. Tanaka, Y. Kawamura, H. Uemoto; Potential of a rotary stage electron beam mastering system for fabricating patterned magnetic media. J. Vac. Sci. Technol. B 1 November 2008; 26 (6): 2611–2618. https://doi.org/10.1116/1.3013277
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Future of plasma etching for microelectronics: Challenges and opportunities
Gottlieb S. Oehrlein, Stephan M. Brandstadter, et al.
Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications
Haochen Zhao, Suho Park, et al.
Exploring SiC CVD growth parameters compatible with remote epitaxy
Daniel J. Pennachio, Jenifer R. Hajzus, et al.
Related Content
Probe current, probe size, and the practical brightness for probe forming systems
J. Vac. Sci. Technol. B (April 2008)
Sub- 50 nm resolution surface electron emission lithography using nano-Si ballistic electron emitter
J. Vac. Sci. Technol. B (December 2008)
Active-matrix nanocrystalline Si electron emitter array with a function of electronic aberration correction for massively parallel electron beam direct-write lithography: Electron emission and pattern transfer characteristics
J. Vac. Sci. Technol. B (October 2013)
Dual hierarchical biomimic superhydrophobic surface with three energy states
Appl. Phys. Lett. (July 2009)
Nanometer scale marker for fluorescent microscopy
Rev. Sci. Instrum. (June 2005)