Defects in polymeric lithographic stencils fabricated by the UV-cured nanoimprint technique result from fundamental surface interactions between template and resist in addition to the presence of particles and contaminants. Repeated and molecularly clean separations of the template from the cured resist are a requirement for successful application of the imprint method yet little is understood about their dependence on interfacial physics and chemistry. The process of interfacial separation of several model acrylate nanoimprint resist formulations cured in contact with clean (no release treatment) and release-treated silica glass surfaces has been quantitatively investigated. The results show that interfacial fracture energies are resist formulation dependent, that the resist-release layer systems studied are not chemically stable and that the release process is more complex than simple fracture at a glass-organic interface.
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July 2007
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Research Article|
June 19 2007
Adhesion between template materials and UV-cured nanoimprint resists
F. A. Houle;
F. A. Houle
a)
IBM Almaden Research Center
, 650 Harry Road, San Jose, California 95120
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Eric Guyer;
Eric Guyer
Department of Materials Science and Engineering,
Stanford University
, Stanford, California 94305
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D. C. Miller;
D. C. Miller
IBM Almaden Research Center
, 650 Harry Road, San Jose, California 95120
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Reinhold Dauskardt
Reinhold Dauskardt
Department of Materials Science and Engineering,
Stanford University
, Stanford, California 94305
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a)
Electronic mail: [email protected]
J. Vac. Sci. Technol. B 25, 1179–1185 (2007)
Article history
Received:
February 06 2007
Accepted:
May 09 2007
Citation
F. A. Houle, Eric Guyer, D. C. Miller, Reinhold Dauskardt; Adhesion between template materials and UV-cured nanoimprint resists. J. Vac. Sci. Technol. B 1 July 2007; 25 (4): 1179–1185. https://doi.org/10.1116/1.2746336
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