The effects of process parameters on pattern embossing into hydrogen silsesquioxane films and the pattern degradation of hydrogen silsesquioxane were investigated. Methylisobutylketone (MIBK) was used to dilute hydrogen silsesquioxane, and NX-1000 (Nanonex) was used to imprint hydrogen silsesquioxane embossed with a Si grating mold at under . The imprint results were observed by scanning electron microscopy and correlated to the analysis results of Fourier transform infrared spectroscopy (FTIR) and nanoindentation. The FTIR results show that network-type bonding was promoted by dilution with MIBK and increasing baking temperatures from . High-temperature thermal-cycle heat treatment can promote the formation of network bonds, which make hydrogen silsesquioxane film undergo plastic deformation more easily. In contrast, low-temperature thermal-cycle heat treatment can result in hydrogen silsesquioxane having a highly viscous response and high time-dependent deformation behavior. The diluted hydrogen silsesquioxane film under prebaking at for and imprinting at for under resulted in a high-fidelity pattern replication without pattern degradation after aging at room temperature for .
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July 2006
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Research Article|
July 18 2006
Study of nanoimprint pattern transfer on hydrogen silsesquioxane
Sun Zen Chen;
Sun Zen Chen
a)
Center for Nano-Science and Technology, University System of Taiwan,
National Tsing Hua University
, Hsinchu, Taiwan, Republic of China
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Jen Fu Liu;
Jen Fu Liu
Institute of Electronics Engineering,
National Tsing Hua University
, Hsinchu, Taiwan, Republic of China
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Henry J. H. Chen;
Henry J. H. Chen
Department of Electrical Engineering,
National Chi Nan University
, Nantou, Taiwan, Republic of China
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Fon Shan Huang
Fon Shan Huang
Institute of Electronics Engineering,
National Tsing Hua University
, Hsinchu, Taiwan, Republic of China
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a)
Electronic mail: szchen@mx.nthu.edu.tw
J. Vac. Sci. Technol. B 24, 1934–1940 (2006)
Article history
Received:
June 21 2005
Accepted:
June 15 2006
Citation
Sun Zen Chen, Jen Fu Liu, Henry J. H. Chen, Fon Shan Huang; Study of nanoimprint pattern transfer on hydrogen silsesquioxane. J. Vac. Sci. Technol. B 1 July 2006; 24 (4): 1934–1940. https://doi.org/10.1116/1.2221314
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