The development of a nanolithography technique utilizing ultrashort wavelength of surface plasmons (SPs) is presented in this article. The mask consists of silver thin film perforated with two-dimensional hole arrays exhibiting superior confinement due to SPs with a wavelength equal to of that of the illuminating light (365 nm). This short wavelength of SPs can confine the field on an area much smaller compared to the excitation light wavelength, leading to the higher resolution lithography than conventional photolithography methods. Finite-difference time-domain simulations show significantly enhanced electric field and tight confinement of the near-field profile obtained from silver plasmonic masks, where features as small as 30 nm can be resolved. Furthermore, the lithography experiments have been performed with demonstration of sub-100 nm spatial resolution.
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November 2004
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
The 48th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
1-4 June 2004
San Diego, California (USA)
Research Article|
December 14 2004
Sub-100 nm lithography using ultrashort wavelength of surface plasmons Available to Purchase
W. Srituravanich;
W. Srituravanich
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
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N. Fang;
N. Fang
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
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S. Durant;
S. Durant
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
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M. Ambati;
M. Ambati
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
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C. Sun;
C. Sun
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
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W. Srituravanich
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
N. Fang
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
S. Durant
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
M. Ambati
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
C. Sun
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597
X. Zhang
a)
Center for Scalable and Integrated Nanomanufacturing, University of California at Los Angeles
, Los Angeles, California 90095-1597a)
Author to whom correspondence should be addressed; electronic mail: [email protected]
J. Vac. Sci. Technol. B 22, 3475–3478 (2004)
Article history
Received:
June 04 2004
Accepted:
October 04 2004
Citation
W. Srituravanich, N. Fang, S. Durant, M. Ambati, C. Sun, X. Zhang; Sub-100 nm lithography using ultrashort wavelength of surface plasmons. J. Vac. Sci. Technol. B 1 November 2004; 22 (6): 3475–3478. https://doi.org/10.1116/1.1823437
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