Polysilicon thin film transistor (TFT)-based displays are increasingly found in cell phones, mobile communicators, PDAs, portable DVD players, and mobile computers because they have high resolution and low power consumption. The AKT plasma-enhanced chemical vapor deposition system made by Applied Materials is used to deposit multilayer dielectric films including precursor low-hydrogen-content amorphous silicon for manufacturing these displays. The polysilicon film is converted from an amorphous precursor film by an excimer laser annealing process. Production of a good quality polysilicon precursor film requires that the hydrogen content of the film be controlled below 2%. Achieving low hydrogen content requires uniform treatment at high temperature after deposition. This article describes the design and performance of the large, high temperature heat chamber integrated in a cluster-tool-based deposition system for both preheat and postannealing of the substrate. [Q. Shang, J. K. Kardokus, and A. Hosokawa, U.S. patent pending (Dec. 2000).]
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September 2001
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Research Article|
September 01 2001
Low temperature polysilicon chemical vapor deposition system for thin film transistor liquid crystal diode Available to Purchase
Akihiro Hosokawa;
Akihiro Hosokawa
AKT, an Applied Materials Company, 3101 Scott Boulevard, Santa Clara, California 95054
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Q. Shang;
Q. Shang
AKT, an Applied Materials Company, 3101 Scott Boulevard, Santa Clara, California 95054
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J. Kardokus;
J. Kardokus
AKT, an Applied Materials Company, 3101 Scott Boulevard, Santa Clara, California 95054
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W. Blonigan
W. Blonigan
AKT, an Applied Materials Company, 3101 Scott Boulevard, Santa Clara, California 95054
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Akihiro Hosokawa
Q. Shang
J. Kardokus
W. Blonigan
AKT, an Applied Materials Company, 3101 Scott Boulevard, Santa Clara, California 95054
J. Vac. Sci. Technol. B 19, 1981–1984 (2001)
Article history
Received:
May 31 2001
Accepted:
August 06 2001
Citation
Akihiro Hosokawa, Q. Shang, J. Kardokus, W. Blonigan; Low temperature polysilicon chemical vapor deposition system for thin film transistor liquid crystal diode. J. Vac. Sci. Technol. B 1 September 2001; 19 (5): 1981–1984. https://doi.org/10.1116/1.1406150
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