Cone-shaped metal field emitter arrays were fabricated on a single heavily doped polysilicon layer. From the observation of the metal field emitter fabricated on the single-polysilicon layer, it was noticed that the irregular shape of the gate aperture was caused by the large grain size of heavily doped polysilicon after oxidation. Therefore, in order to obtain a good shape, the double layers of polysilicon where one was heavily doped and the other was not doped were used. The undoped polysilicon layer was consumed for the gate oxide layer and the doped polysilicon layer was used to serve as a conducting cathode layer. The small grain size of the undoped polysilicon after oxidation led to an improved shape of the gate aperture which rendered a stable emission characteristic.
Skip Nav Destination
Article navigation
March 1997
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
The 9th international vacuum microelectronics conference
7-12 Jul 1996
St.Petersburg (Russia)
Research Article|
March 01 1997
Fabrication of metal field emitter arrays on polycrystalline silicon
II Hwan Kim;
II Hwan Kim
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
Search for other works by this author on:
Chun Gyoo Lee;
Chun Gyoo Lee
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
Search for other works by this author on:
Yeo Hwan Kim;
Yeo Hwan Kim
Department of Electronics Engineering, Kwandong University, Kangwon-do 215-800, Korea
Search for other works by this author on:
Byung Gook Park;
Byung Gook Park
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
Search for other works by this author on:
Jong Duk Lee
Jong Duk Lee
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
Search for other works by this author on:
J. Vac. Sci. Technol. B 15, 468–471 (1997)
Article history
Received:
August 25 1996
Accepted:
November 04 1996
Citation
II Hwan Kim, Chun Gyoo Lee, Yeo Hwan Kim, Byung Gook Park, Jong Duk Lee; Fabrication of metal field emitter arrays on polycrystalline silicon. J. Vac. Sci. Technol. B 1 March 1997; 15 (2): 468–471. https://doi.org/10.1116/1.589601
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Fabrication of metal field emitter arrays for low voltage and high current operation
J. Vac. Sci. Technol. B (March 1998)
Fabrication and characterization of volcano-shaped field emitters surrounded by planar gates
J. Vac. Sci. Technol. B (March 1997)
Characteristics and circuit model of a field emission triode
J. Vac. Sci. Technol. B (March 1998)
Lateral field emitter arrays with high emission currents and wide operation region by high field activation
J. Vac. Sci. Technol. B (February 2003)
Field activated lateral-type polysilicon emitter with extremely high emission current and very low turn-on voltage
J. Vac. Sci. Technol. B (May 2001)