This article will address the development of a porous silicon cathode technology which shows promise in solving the existing problems, specifically unstable, low current density, nonreproducible and high voltage emission, encountered by other cathode technologies. Monolithic two‐ and three‐terminal devices have been designed, manufactured, and characterized. All of these devices have resulted in stable, reproducible operating characteristics that follow the Fowler–Nordheim model. Vacuum transport of the electrons and temperature independence (to 250 °C) of the current–voltage characteristics have been confirmed. Appreciable emission current has been observed with macroscopic fields on the order of 104 V/cm, thus indicating a large submicroscopic field enhancement due to the geometrical nature of the porous silicon.
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May 1996
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
The eighth international vacuum microelectronics conference
31 Jul − 3 Aug 1995
Portland, Oregon (USA)
Research Article|
May 01 1996
Porous silicon field emission cathode development
J. R. Jessing;
J. R. Jessing
Electrical Engineering Department, Institute for Solid State Electronics, Texas A&M University, College Station, Texas 77843‐3128
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D. L. Parker;
D. L. Parker
Electrical Engineering Department, Institute for Solid State Electronics, Texas A&M University, College Station, Texas 77843‐3128
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M. H. Weichold
M. H. Weichold
Electrical Engineering Department, Institute for Solid State Electronics, Texas A&M University, College Station, Texas 77843‐3128
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J. Vac. Sci. Technol. B 14, 1899–1901 (1996)
Article history
Received:
August 03 1995
Accepted:
January 12 1996
Citation
J. R. Jessing, D. L. Parker, M. H. Weichold; Porous silicon field emission cathode development. J. Vac. Sci. Technol. B 1 May 1996; 14 (3): 1899–1901. https://doi.org/10.1116/1.588950
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