Because scanning probe microscopes produce three‐dimensional data of almost any solid they have a strong potential as metrological tools. Results are presented from the first international intercomparison between four national metrology laboratories. On three‐dimensional calibration standards the mean deviations between instruments were typically <2% in the x direction, <5% in the y direction, and <10% in the z direction. Eight samples were circulated for roughness measurements and 19 roughness parameters were calculated for each image. In the range where the scanning probe microscope measurements overlapped with classical techniques (profilometers) the agreement was good. Also a gauge block of hardened steel (≊900 HV) with an array of Vickers indentations having diagonal lengths ranging from 3 to 60 μm was circulated and measured.
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March 1996
This content was originally published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Research Article|
March 01 1996
International intercomparison of scanning tunneling microscopy
G. Barbato;
G. Barbato
Instituto di Metrologia ‘‘G. Colonetti,’’ Strada della Cacce 73, I‐10135, Italy
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K. Carneiro;
K. Carneiro
Danish Institute of Fundamental Metrology, Building 307, Anker Engelunds Vej 1, DK‐2800 Lyngby, Denmark
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D. Cuppini;
D. Cuppini
CNR‐Instituto di Lavorazione Metalli, Orbassano, Torino, Italy
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J. Garnaes;
J. Garnaes
Danish Institute of Fundamental Metrology, Building 307, Anker Engelunds Vej 1, DK‐2800 Lyngby, Denmark
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G. Gori;
G. Gori
GF Galileo SMA Srl, Via A. Einstein, 35, I‐50013 Campi Bisenzio, Italy
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G. Hughes;
G. Hughes
Forbairt, Irish National Science and Technology Agency, Ballymun Road, Glasnevin, Dublin 9, Ireland
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C. P. Jensen;
C. P. Jensen
Danish Institute of Fundamental Metrology, Building 307, Anker Engelunds Vej 1, DK‐2800 Lyngby, Denmark
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J. F. Jo/rgensen;
J. F. Jo/rgensen
Danish Institute of Fundamental Metrology, Building 307, Anker Engelunds Vej 1, DK‐2800 Lyngby, Denmark
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O. Jusko;
O. Jusko
Physikalisch‐Technische Bundesanstalt, Bundesallee 100, D‐38116 Braunschweig, Germany
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S. Livi;
S. Livi
GF Galileo SMA Srl, Via A, Einstein 35, I‐50013 Campi Bisenzio, Italy
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H. McQuoid;
H. McQuoid
Forbairt, Irish National Science and Technology Agency, Ballymun Road, Glasnevin, Dublin 9, Ireland
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L. Nielsen;
L. Nielsen
Danish Institute of Fundamental Metrology, Building 307, Anker Engelunds Vej 1, DK‐2800 Lyngby, Denmark
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G. B. Picotto;
G. B. Picotto
Instituto di Metrologia ‘‘G. Colonetti,’’ Strada della Cacce 73, I‐10135, Italy
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G. Wilkening
G. Wilkening
Physikalisch‐Technische Bundesanstalt, Bundesallee 100, D‐38116 Braunschweig, Germany
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J. Vac. Sci. Technol. B 14, 1531–1535 (1996)
Article history
Received:
July 24 1995
Accepted:
November 29 1995
Citation
G. Barbato, K. Carneiro, D. Cuppini, J. Garnaes, G. Gori, G. Hughes, C. P. Jensen, J. F. Jo/rgensen, O. Jusko, S. Livi, H. McQuoid, L. Nielsen, G. B. Picotto, G. Wilkening; International intercomparison of scanning tunneling microscopy. J. Vac. Sci. Technol. B 1 March 1996; 14 (2): 1531–1535. https://doi.org/10.1116/1.589133
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