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Current Issue
Volume 42,
Issue 6,
November 2024

Focus and Coverage

Journal of Vacuum Science & Technology B covers microelectronics and nanometer structures with an emphasis on processing, measurement, and phenomena associated with micrometer, nanometer structures and devices and vacuum science and technology.

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Editor's Picks
Research Article
Shiva Mudide, Nick Keller et al.
Accurate fabrication of high-aspect ratio (HAR) structures in applications from semiconductor devices to x-ray observatories is essential for their optimal performance because their performance ...
Research Article
Ungdon Ham, Ji-Soo Yoon et al.
We present the design and implementation of an advanced manipulator system for use in low-temperature scanning tunneling microscope (STM) setups, specifically in an ultrahigh vacuum (UHV) chamber ...
Research Article
Chen Tang, Toshiaki Tanaka et al.
The development of chemically amplified resists requires many experiments to optimize the chemical composition, which includes the type of monomer molecules and their component ratios, initiator ...
Most Recent
Research Article
Shengzhou Huang, Dongjie Wu et al.
In this paper, an efficient approach to mask optimization for digital micromirror device lithography is proposed, leveraging an enhanced particle swarm optimization algorithm, which significantly ...
Research Article
Amelia Turnquist, Naoyuki Kofuji et al.
To investigate the impact of plasma-induced stress on line wiggling, pattern deformation was compared with and without hardmask exposure to the plasma during etching of porous SiOCH (p-SiOCH) with ...
Research Article
C. J. Edgcombe, J. Huns
Further results from an earlier computation by density functional theory for the ground state of a capped (5,5) carbon nanotube in the zero applied field show details of (a) self-consistent charge ...

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