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The influence of radio frequency sputter variables on the composition of YBa₂Cu₃O₇ films

J. D. Klein; A. Yen

J. Vac. Sci. Technol. A 8, 1–6 (1990) https://doi.org/10.1116/1.577065

View articletitled, The influence of radio frequency sputter variables on the composition of YBa2Cu3O7 films

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Preparation of TbFe films by magnetron sputtering using multiphase target

Yoshio Murakami; Takayuki Shingyoji; Kenichi Hijikata

J. Vac. Sci. Technol. A 8, 7–12 (1990) https://doi.org/10.1116/1.576992

Abstract

View articletitled, Preparation of TbFe films by magnetron sputtering using multiphase target

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Influences of noble gases (Ne, Ar, and Kr) on magnetic properties of ion‐beam‐sputtered Fe/SiO₂ multilayer films

Masakatsu Senda; Yasuhiro Nagai

J. Vac. Sci. Technol. A 8, 13–18 (1990) https://doi.org/10.1116/1.577046

Abstract

View articletitled, Influences of noble gases (Ne, Ar, and Kr) on magnetic properties of ion‐beam‐sputtered Fe/SiO2 multilayer films

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Diffusion welding of silver interlayers coated onto base metals by planar‐magnetron sputtering

R. S. Rosen; M. E. Kassner

J. Vac. Sci. Technol. A 8, 19–29 (1990) https://doi.org/10.1116/1.577064

Abstract

View articletitled, Diffusion welding of silver interlayers coated onto base metals by planar‐magnetron sputtering

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Model of energetic electron transport in magnetron discharges

T. E. Sheridan; M. J. Goeckner; J. Goree

J. Vac. Sci. Technol. A 8, 30–37 (1990) https://doi.org/10.1116/1.577093

Abstract

View articletitled, Model of energetic electron transport in magnetron discharges

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On the temperature dependence of the deposition rate of amorphous, hydrogenated carbon films

H. Kersten; G. M. W. Kroesen

J. Vac. Sci. Technol. A 8, 38–42 (1990) https://doi.org/10.1116/1.576403

Abstract

View articletitled, On the temperature dependence of the deposition rate of amorphous, hydrogenated carbon films

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The crystallographic and electroluminescent characteristics of ZnS:Mn thin films prepared by radio frequency ion‐plating technique

Shigeyuki Kiyota; Keiko Terai; Norifumi Kikuchi; Takuma Kojima; N. Shin‐ichi Takahashi; Shouichi Kurita

J. Vac. Sci. Technol. A 8, 43–48 (1990) https://doi.org/10.1116/1.576416

Abstract

View articletitled, The crystallographic and electroluminescent characteristics of ZnS:Mn thin films prepared by radio frequency ion‐plating technique

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Gas‐phase evolution and convective heat transfer in closed‐cell vapor transport of organic thin films in microgravity and unit gravity

M. K. Debe; R. J. Poirier; E. L. Cook; L. R. Miller; M. S. Spiering; S. P. Floeder

J. Vac. Sci. Technol. A 8, 49–60 (1990) https://doi.org/10.1116/1.576373

Abstract

View articletitled, Gas‐phase evolution and convective heat transfer in closed‐cell vapor transport of organic thin films in microgravity and unit gravity

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Adsorption and thermal dissociation of disilane (Si₂H₆) on Si(100)2×1

Y. Suda; D. Lubben; T. Motooka; J. E. Greene

J. Vac. Sci. Technol. A 8, 61–67 (1990) https://doi.org/10.1116/1.576356

Abstract

View articletitled, Adsorption and thermal dissociation of disilane (Si2H6) on Si(100)2×1

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Epitaxial growth of transition metal dichalcogenides on cleaved faces of mica

Keiji Ueno; Koichiro Saiki; Toshihiro Shimada; Atsushi Koma

J. Vac. Sci. Technol. A 8, 68–72 (1990) https://doi.org/10.1116/1.576983

Abstract

View articletitled, Epitaxial growth of transition metal dichalcogenides on cleaved faces of mica

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Analysis and reduction of conductor stress in magnetic bubble memory devices

H. Umezaki; S. Isomae; T. Sato; T. Toyooka; R. Suzuki

J. Vac. Sci. Technol. A 8, 73–78 (1990) https://doi.org/10.1116/1.576990

Abstract

View articletitled, Analysis and reduction of conductor stress in magnetic bubble memory devices

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Analysis of growth inhomogeneities in CdTe films by scanning electron microscopy and photoluminescence studies

J. Landa‐Garcia; M. Cardenas; G. Contreras Puente; J. G. Mendoza‐Alvarez; F. Sanchez‐Sinencio; O. Zelaya

J. Vac. Sci. Technol. A 8, 79–83 (1990) https://doi.org/10.1116/1.576991

Abstract

View articletitled, Analysis of growth inhomogeneities in CdTe films by scanning electron microscopy and photoluminescence studies

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Infrared‐laser interferometric thermometry: A nonintrusive technique for measuring semiconductor wafer temperatures

V. M. Donnelly; J. A. McCaulley

J. Vac. Sci. Technol. A 8, 84–92 (1990) https://doi.org/10.1116/1.576993

Abstract

View articletitled, Infrared‐laser interferometric thermometry: A nonintrusive technique for measuring semiconductor wafer temperatures

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Ion beam profiling and end‐point detection with microfocused secondary ion mass spectroscopy

H. T. Lin; S. Balakrishnan; J. F. McDonald; J. C. Corelli

J. Vac. Sci. Technol. A 8, 93–98 (1990) https://doi.org/10.1116/1.576994

View articletitled, Ion beam profiling and end‐point detection with microfocused secondary ion mass spectroscopy

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The characterization of titanium nitride by x‐ray photoelectron spectroscopy and Rutherford backscattering

M. J. Vasile; A. B. Emerson; F. A. Baiocchi

J. Vac. Sci. Technol. A 8, 99–105 (1990) https://doi.org/10.1116/1.576995

Abstract

View articletitled, The characterization of titanium nitride by x‐ray photoelectron spectroscopy and Rutherford backscattering

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Comparison of the attenuation lengths and the inelastic mean‐free path for photoelectrons in silver

A. Jablonski; S. Tougaard

J. Vac. Sci. Technol. A 8, 106–116 (1990) https://doi.org/10.1116/1.577041

Abstract

View articletitled, Comparison of the attenuation lengths and the inelastic mean‐free path for photoelectrons in silver

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Distinguishing thin film and substrate contributions in microindentation hardness measurements

Charles Feldman; Fred Ordway; Jean Bernstein

J. Vac. Sci. Technol. A 8, 117–122 (1990) https://doi.org/10.1116/1.577042

Abstract

View articletitled, Distinguishing thin film and substrate contributions in microindentation hardness measurements

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Theoretical investigation of chemical bonding at aluminum/polyimide interface

A. Selmani

J. Vac. Sci. Technol. A 8, 123–126 (1990) https://doi.org/10.1116/1.577043

Abstract

View articletitled, Theoretical investigation of chemical bonding at aluminum/polyimide interface

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Modification to thermal emissions by clusters on their own metallic surface

Oscar Biblarz

J. Vac. Sci. Technol. A 8, 127–133 (1990) https://doi.org/10.1116/1.577044

Abstract

View articletitled, Modification to thermal emissions by clusters on their own metallic surface

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Room temperature reaction between polycrystalline Ni/Al bilayers deposited in ultrahigh vacuum

M. W. Ruckman; L. Jiang; Myron Strongin

J. Vac. Sci. Technol. A 8, 134–140 (1990) https://doi.org/10.1116/1.577045

Abstract

View articletitled, Room temperature reaction between polycrystalline Ni/Al bilayers deposited in ultrahigh vacuum

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The cryogenic diffusion pump and its implementation in a complete fusion reactor forevacuum system

J. L. Hemmerich; E. Küssel

J. Vac. Sci. Technol. A 8, 141–144 (1990) https://doi.org/10.1116/1.577047

Abstract

View articletitled, The cryogenic diffusion pump and its implementation in a complete fusion reactor forevacuum system

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A compact three‐axis cryogenic ultrahigh vacuum manipulator

H. Dürr; Th. Fauster; R. Schneider

J. Vac. Sci. Technol. A 8, 145–146 (1990) https://doi.org/10.1116/1.577048

Abstract

View articletitled, A compact three‐axis cryogenic ultrahigh vacuum manipulator

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An ultrahigh vacuum compatible gimbled inspection mirror and ceramic scraper for the vacuum generators ESCALAB

Douglas Jayne

J. Vac. Sci. Technol. A 8, 147–148 (1990) https://doi.org/10.1116/1.577049

View articletitled, An ultrahigh vacuum compatible gimbled inspection mirror and ceramic scraper for the vacuum generators ESCALAB

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A warning concerning the use of glass capillary arrays in gas dosing: Potential chemical reactions

P. K. Leavitt; P. A. Thiel

J. Vac. Sci. Technol. A 8, 148–149 (1990) https://doi.org/10.1116/1.577050

Abstract

View articletitled, A warning concerning the use of glass capillary arrays in gas dosing: Potential chemical reactions

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Reusable quartz crystals for thickness monitoring in thin film deposition

W. K. Chao; H. K. Wong

J. Vac. Sci. Technol. A 8, 150–151 (1990) https://doi.org/10.1116/1.577051

Abstract

View articletitled, Reusable quartz crystals for thickness monitoring in thin film deposition

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A graphite thermal evaporation source for aluminum

Y. A. Folz; J. S. Hickmann; L. F. M. Braun; R. E. Francke

J. Vac. Sci. Technol. A 8, 151–152 (1990) https://doi.org/10.1116/1.577052

Abstract

View articletitled, A graphite thermal evaporation source for aluminum

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High‐resolution electron microscope observation of ‘‘atomic bridge’’ formation between two interacting gold particles

Ken‐ichi Murooka; Masanori Mitome; Yasumasa Tanishiro; Kunio Takayanagi

J. Vac. Sci. Technol. A 8, 153–154 (1990) https://doi.org/10.1116/1.577053

Abstract

View articletitled, High‐resolution electron microscope observation of ‘‘atomic bridge’’ formation between two interacting gold particles

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Electron interferometry using a coherent beam from point electron source

Akira Tonomura

J. Vac. Sci. Technol. A 8, 155–159 (1990) https://doi.org/10.1116/1.577054

Abstract

View articletitled, Electron interferometry using a coherent beam from point electron source

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First‐principles theory of the scanning tunneling microscopy simulation

Masaru Tsukada; Katsuyoshi Kobayashi; Shuhei Ohnishi

J. Vac. Sci. Technol. A 8, 160–165 (1990) https://doi.org/10.1116/1.577055

Abstract

View articletitled, First‐principles theory of the scanning tunneling microscopy simulation

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Electronic‐structure theory of the dimers adatoms and stacking fault model on Si(111) reconstructed surface—comparison with scanning tunneling spectroscopy

Mari Fujita; Hideo Nagayoshi; Akio Yoshimori

J. Vac. Sci. Technol. A 8, 166–169 (1990) https://doi.org/10.1116/1.577056

Abstract

View articletitled, Electronic‐structure theory of the dimers adatoms and stacking fault model on Si(111) reconstructed surface—comparison with scanning tunneling spectroscopy

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Simulation of scanning tunneling microscope image based on electronic states of surface/tip system

Katsuyoshi Kobayashi; Masaru Tsukada

J. Vac. Sci. Technol. A 8, 170–173 (1990) https://doi.org/10.1116/1.577057

Abstract

View articletitled, Simulation of scanning tunneling microscope image based on electronic states of surface/tip system

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Effect of the microscopic electronic states of the tip on the scanning tunneling microscopy image

S. Ohnishi; M. Tsukada

J. Vac. Sci. Technol. A 8, 174–176 (1990) https://doi.org/10.1116/1.577058

Abstract

View articletitled, Effect of the microscopic electronic states of the tip on the scanning tunneling microscopy image

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The Wentzel–Kramers–Brillouin method in multidimensional tunneling: Application to scanning tunneling microscopy

Z. H. Huang; T. E. Feuchtwang; P. H. Cutler; E. Kazes

J. Vac. Sci. Technol. A 8, 177–181 (1990) https://doi.org/10.1116/1.577059

Abstract

View articletitled, The Wentzel–Kramers–Brillouin method in multidimensional tunneling: Application to scanning tunneling microscopy

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Angle‐resolved tunneling between two atomic planes

T. Ezaki; H. Enomoto; M. Baba; Y. Ikeda; S. Oguro; E. Kuramochi; H. Ozaki

J. Vac. Sci. Technol. A 8, 182–185 (1990) https://doi.org/10.1116/1.577060

Abstract

View articletitled, Angle‐resolved tunneling between two atomic planes

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Model studies of tunneling time

Z. H. Huang; P. H. Cutler; T. E. Feuchtwang; E. Kazes; H. Q. Nguyen; T. E. Sullivan

J. Vac. Sci. Technol. A 8, 186–191 (1990) https://doi.org/10.1116/1.577061

Abstract

View articletitled, Model studies of tunneling time

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Statistical treatment on the formation of Si(100) 2×n surface

Akira Tamura

J. Vac. Sci. Technol. A 8, 192–194 (1990) https://doi.org/10.1116/1.577062

Abstract

View articletitled, Statistical treatment on the formation of Si(100) 2×n surface

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Epitaxial growth of silicon on Si(001) by scanning tunneling microscopy

R. J. Hamers; U. K. Köhler; J. E. Demuth

J. Vac. Sci. Technol. A 8, 195–200 (1990) https://doi.org/10.1116/1.577063

Abstract

View articletitled, Epitaxial growth of silicon on Si(001) by scanning tunneling microscopy

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Scanning tunneling microscopy study of diffusion, growth, and coarsening of Si on Si(001)

Y.‐W. Mo; R. Kariotis; B. S. Swartzentruber; M. B. Webb; M. G. Lagally

J. Vac. Sci. Technol. A 8, 201–206 (1990) https://doi.org/10.1116/1.577066

Abstract

View articletitled, Scanning tunneling microscopy study of diffusion, growth, and coarsening of Si on Si(001)

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Island and step structures on molecular beam epitaxy grown Si(001) surfaces

A. J. Hoeven; D. Dijkkamp; E. J. van Loenen; J. M. Lenssinck; J. Dieleman

J. Vac. Sci. Technol. A 8, 207–209 (1990) https://doi.org/10.1116/1.577067

Abstract

View articletitled, Island and step structures on molecular beam epitaxy grown Si(001) surfaces

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Observations of strain effects on the Si(001) surface using scanning tunneling microscopy

B. S. Swartzentruber; Y. W. Mo; M. B. Webb; M. G. Lagally

J. Vac. Sci. Technol. A 8, 210–213 (1990) https://doi.org/10.1116/1.577068

Abstract

View articletitled, Observations of strain effects on the Si(001) surface using scanning tunneling microscopy

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Surface diffractometry and lattice imaging of scanning tunneling microscopy images

J. E. Demuth; U. Koehler; R. J. Hamers

J. Vac. Sci. Technol. A 8, 214–217 (1990) https://doi.org/10.1116/1.577069

Abstract

View articletitled, Surface diffractometry and lattice imaging of scanning tunneling microscopy images

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Scanning tunneling microscopy study of Si (001) and Si (110) surface structures resulting from different thermal cleaning treatments

D. Dijkkamp; E. J. van Loenen; A. J. Hoeven; J. Dieleman

J. Vac. Sci. Technol. A 8, 218–221 (1990) https://doi.org/10.1116/1.577070

Abstract

View articletitled, Scanning tunneling microscopy study of Si (001) and Si (110) surface structures resulting from different thermal cleaning treatments

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Corrugation of Si surfaces and profiles of tip apexes

Masahiko Tomitori; Fumikazu Iwawaki; Nobuo Hirano; Futoshi Katsuki; Osamu Nishikawa

J. Vac. Sci. Technol. A 8, 222–225 (1990) https://doi.org/10.1116/1.577071

Abstract

View articletitled, Corrugation of Si surfaces and profiles of tip apexes

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Determination of surface atomic positions by scanning tunneling microscope observations

Russell Becker; James Vickers

J. Vac. Sci. Technol. A 8, 226–232 (1990) https://doi.org/10.1116/1.577072

Abstract

View articletitled, Determination of surface atomic positions by scanning tunneling microscope observations

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Field ion‐scanning tunneling microscopy of alkali metal adsorption on the Si(100) surface

T. Hashizume; Y. Hasegawa; I. Kamiya; T. Ide; I. Sumita; S. Hyodo; T. Sakurai; H. Tochihara; M. Kubota; Y. Murata

J. Vac. Sci. Technol. A 8, 233–237 (1990) https://doi.org/10.1116/1.577073

Abstract

View articletitled, Field ion‐scanning tunneling microscopy of alkali metal adsorption on the Si(100) surface

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Cluster formation of Li on the Si(111)7×7 surface

Yukio Hasegawa; I. Kamiya; T. Hashizume; T. Sakurai; H. Tochihara; M. Kubota; Y. Murata

J. Vac. Sci. Technol. A 8, 238–240 (1990) https://doi.org/10.1116/1.577074

Abstract

View articletitled, Cluster formation of Li on the Si(111)7×7 surface

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Au‐induced reconstructions of the Si(111) surface

T. Hasegawa; K. Takata; S. Hosaka; S. Hosoki

J. Vac. Sci. Technol. A 8, 241–244 (1990) https://doi.org/10.1116/1.577075

Abstract

View articletitled, Au‐induced reconstructions of the Si(111) surface

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Gallium growth and reconstruction on the Si(100) surface

A. A. Baski; J. Nogami; C. F. Quate

J. Vac. Sci. Technol. A 8, 245–248 (1990) https://doi.org/10.1116/1.577076

Abstract

View articletitled, Gallium growth and reconstruction on the Si(100) surface

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Initial stage deposition of Ag on the Si(100)2×1 surface studied by scanning tunneling microscopy

T. Hashizume; R. J. Hamers; J. E. Demuth; K. Markert; T. Sakurai

J. Vac. Sci. Technol. A 8, 249–250 (1990) https://doi.org/10.1116/1.577077

Abstract

View articletitled, Initial stage deposition of Ag on the Si(100)2×1 surface studied by scanning tunneling microscopy

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The growth of Ag films on Si(100)

A. Brodde; D. Badt; St. Tosch; H. Neddermeyer

J. Vac. Sci. Technol. A 8, 251–254 (1990) https://doi.org/10.1116/1.577078

Abstract

View articletitled, The growth of Ag films on Si(100)

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Real‐time observation of oxygen and hydrogen adsorption on silicon surfaces by scanning tunneling microscopy

H. Tokumoto; K. Miki; H. Murakami; H. Bando; M. Ono; K. Kajimura

J. Vac. Sci. Technol. A 8, 255–258 (1990) https://doi.org/10.1116/1.577079

Abstract

View articletitled, Real‐time observation of oxygen and hydrogen adsorption on silicon surfaces by scanning tunneling microscopy

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Atomic hydrogen chemisorption on the Si(111) 7×7 surface

Toshio Sakurai; Y. Hasegawa; T. Hashizume; I. Kamiya; T. Ide; I. Sumita; H. W. Pickering; S. Hyodo

J. Vac. Sci. Technol. A 8, 259–261 (1990) https://doi.org/10.1116/1.577080

Abstract

View articletitled, Atomic hydrogen chemisorption on the Si(111) 7×7 surface

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Scanning tunneling microscopy of silicon surfaces in air: Observation of atomic images

Y. Nakagawa; A. Ishitani; T. Takahagi; H. Kuroda; H. Tokumoto; M. Ono; K. Kajimura

J. Vac. Sci. Technol. A 8, 262–265 (1990) https://doi.org/10.1116/1.577081

Abstract

View articletitled, Scanning tunneling microscopy of silicon surfaces in air: Observation of atomic images

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Hydrogen terminated Si(100) surfaces studied by scanning tunneling microscopy, x‐ray photon spectroscopy, and Auger electron spectroscopy

Masaaki Niwa; Hiroshi Iwasaki; Shigehiko Hasegawa

J. Vac. Sci. Technol. A 8, 266–269 (1990) https://doi.org/10.1116/1.577082

Abstract

View articletitled, Hydrogen terminated Si(100) surfaces studied by scanning tunneling microscopy, x‐ray photon spectroscopy, and Auger electron spectroscopy

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Tunneling barrier height imaging and polycrystalline Si surface observations

S. Hosaka; K. Sagara; T. Hasegawa; K. Takata; S. Hosoki

J. Vac. Sci. Technol. A 8, 270–274 (1990) https://doi.org/10.1116/1.577083

Abstract

View articletitled, Tunneling barrier height imaging and polycrystalline Si surface observations

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Scanning tunneling microscopy/spectroscopy of a‐Si:H/SiN_x interface of thin film transistors

H. Nejoh

J. Vac. Sci. Technol. A 8, 275–279 (1990) https://doi.org/10.1116/1.577084

Abstract

View articletitled, Scanning tunneling microscopy/spectroscopy of a‐Si:H/SiNx interface of thin film transistors

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GaAs epitaxy and heteroepitaxy: A scanning tunneling microscopy study

D. K. Biegelsen; L.‐E. Swartz; R. D. Bringans

J. Vac. Sci. Technol. A 8, 280–283 (1990) https://doi.org/10.1116/1.577085

Abstract

View articletitled, GaAs epitaxy and heteroepitaxy: A scanning tunneling microscopy study

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Dispersion of evanescent band gap states in Fe clusters on GaAs(110)

Joseph A. Stroscio; P. N. First; R. A. Dragoset; L. J. Whitman; D. T. Pierce; R. J. Celotta

J. Vac. Sci. Technol. A 8, 284–288 (1990) https://doi.org/10.1116/1.577086

Abstract

View articletitled, Dispersion of evanescent band gap states in Fe clusters on GaAs(110)

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Scanning tunneling spectroscopy of metal surfaces

Y. Kuk; P. J. Silverman

J. Vac. Sci. Technol. A 8, 289–292 (1990) https://doi.org/10.1116/1.577087

Abstract

View articletitled, Scanning tunneling spectroscopy of metal surfaces

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Thermal roughening studied by scanning tunneling microscopy

J. W. M. Frenken; R. J. Hamers; J. E. Demuth

J. Vac. Sci. Technol. A 8, 293–296 (1990) https://doi.org/10.1116/1.577088

Abstract

View articletitled, Thermal roughening studied by scanning tunneling microscopy

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Scanning tunneling microscopy study of the structure of sulfur [2(3)^1/2×2(3)^1/2] R 30° overlayer on rhenium (0001)

D. F. Ogletree; C. Ocal; B. Marchon; G. A. Somorjai; M. Salmeron; T. Beebe; W. Siekhaus

J. Vac. Sci. Technol. A 8, 297–301 (1990) https://doi.org/10.1116/1.577089

Abstract

View articletitled, Scanning tunneling microscopy study of the structure of sulfur [2(3)1/2×2(3)1/2] R 30° overlayer on rhenium (0001)

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Superstructures of sulfur on stepped copper surfaces observed by scanning tunneling microscopy

S. Rousset; S. Gauthier; O. Siboulet; W. Sacks; M. Belin; J. Klein

J. Vac. Sci. Technol. A 8, 302–304 (1990) https://doi.org/10.1116/1.577090

Abstract

View articletitled, Superstructures of sulfur on stepped copper surfaces observed by scanning tunneling microscopy

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Nucleation and growth of a monolayer oxide on Cu(110)

F. M. Chua; Y. Kuk; P. J. Silverman

J. Vac. Sci. Technol. A 8, 305–307 (1990) https://doi.org/10.1116/1.577091

Abstract

View articletitled, Nucleation and growth of a monolayer oxide on Cu(110)

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Scanning tunneling microscopy images of carburized nickel alloys

Shûzi Harada; Masaki Goda

J. Vac. Sci. Technol. A 8, 308–310 (1990) https://doi.org/10.1116/1.577092

Abstract

View articletitled, Scanning tunneling microscopy images of carburized nickel alloys

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Scanning tunneling microscopy and transmission electron microscopy studies of Au and Pd clusters grown on a clean graphite surface

A. Humbert; M. Dayez; S. Sangay; C. Chapon; C. R. Henry

J. Vac. Sci. Technol. A 8, 311–313 (1990) https://doi.org/10.1116/1.577094

Abstract

View articletitled, Scanning tunneling microscopy and transmission electron microscopy studies of Au and Pd clusters grown on a clean graphite surface

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Real‐space images of noble metal (Cu, Ag, Au) thin films by scanning tunneling microscopy

H. S. Kim; Y. C. Zheng; P. J. Bryant

J. Vac. Sci. Technol. A 8, 314–316 (1990) https://doi.org/10.1116/1.577095

Abstract

View articletitled, Real‐space images of noble metal (Cu, Ag, Au) thin films by scanning tunneling microscopy

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Microfabrication of integrated scanning tunneling microscope

Thomas R. Albrecht; Shinya Akamine; Mark J. Zdeblick; Calvin F. Quate

J. Vac. Sci. Technol. A 8, 317–318 (1990) https://doi.org/10.1116/1.577096

Abstract

View articletitled, Microfabrication of integrated scanning tunneling microscope

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A dual tunneling‐unit scanning tunneling microscope

Hideki Kawakatsu; Toshiro Higuchi

J. Vac. Sci. Technol. A 8, 319–323 (1990) https://doi.org/10.1116/1.577097

Abstract

View articletitled, A dual tunneling‐unit scanning tunneling microscope

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New versatile room‐temperature field ion scanning tunneling microscopy

Toshi Sakurai; T. Hashizume; Y. Hasegawa; I. Kamiya; N. Sano; K. Yokoyama; H. Tanaka; I. Sumita; S. Hyodo

J. Vac. Sci. Technol. A 8, 324–326 (1990) https://doi.org/10.1116/1.577098

Abstract

View articletitled, New versatile room‐temperature field ion scanning tunneling microscopy

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High‐temperature scanning tunneling microscope

M. O. Watanabe; K. Tanaka; A. Sakai

J. Vac. Sci. Technol. A 8, 327–329 (1990) https://doi.org/10.1116/1.577099

Abstract

View articletitled, High‐temperature scanning tunneling microscope

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A versatile low‐temperature scanning tunneling microscope

Ch. Renner; Ph. Niedermann; A. D. Kent; O/. Fischer

J. Vac. Sci. Technol. A 8, 330–332 (1990) https://doi.org/10.1116/1.577100

Abstract

View articletitled, A versatile low‐temperature scanning tunneling microscope

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An ultrahigh vacuum scanning tunneling microscope with a new inchworm mechanism

N. Shimizu; T. Kimura; T. Nakamura; I. Umebu

J. Vac. Sci. Technol. A 8, 333–335 (1990) https://doi.org/10.1116/1.577101

Abstract

View articletitled, An ultrahigh vacuum scanning tunneling microscope with a new inchworm mechanism

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Differential conductance imaging under alternate current tunneling bias

A. Yagi; S. Tsukada; Y. Takahashi; S. Morita; Y. Sugawara; T. Okada; S. Imai; N. Mikoshiba

J. Vac. Sci. Technol. A 8, 336–338 (1990) https://doi.org/10.1116/1.577102

Abstract

View articletitled, Differential conductance imaging under alternate current tunneling bias

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An ultrahigh vacuum scanning tunneling microscope for the investigation of clean surfaces

R. Wiesendanger; D. Buergler; G. Tarrach; D. Anselmetti; H. R. Hidber; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 8, 339–344 (1990) https://doi.org/10.1116/1.577103

Abstract

View articletitled, An ultrahigh vacuum scanning tunneling microscope for the investigation of clean surfaces

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A scanning tunneling microscope for ultrahigh vacuum atom–surface interaction studies

D. R. Peale; B. H. Cooper

J. Vac. Sci. Technol. A 8, 345–349 (1990) https://doi.org/10.1116/1.577104

Abstract

View articletitled, A scanning tunneling microscope for ultrahigh vacuum atom–surface interaction studies

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Scanning tunneling microscope combined with optical microscope for large sample measurement

M. Yasutake; C. Miyata

J. Vac. Sci. Technol. A 8, 350–353 (1990) https://doi.org/10.1116/1.577105

Abstract

View articletitled, Scanning tunneling microscope combined with optical microscope for large sample measurement

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Long‐scan imaging by scanning tunneling microscopy

Rigoberto García Cantú; Miguel A. Huerta Garnica

J. Vac. Sci. Technol. A 8, 354–356 (1990) https://doi.org/10.1116/1.576395

Abstract

View articletitled, Long‐scan imaging by scanning tunneling microscopy

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A compact scanning tunneling microscopy control and data acquisition system based on a Macintosh II workstation

S. Grafström; J. Kowalski; R. Neumann; O. Probst; M. Wörtge

J. Vac. Sci. Technol. A 8, 357–362 (1990) https://doi.org/10.1116/1.576396

Abstract

View articletitled, A compact scanning tunneling microscopy control and data acquisition system based on a Macintosh II workstation

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Scanning probe microscopy: Current status and future trends

H. Kumar Wickramasinghe

J. Vac. Sci. Technol. A 8, 363–368 (1990) https://doi.org/10.1116/1.576397

Abstract

View articletitled, Scanning probe microscopy: Current status and future trends

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From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope

S. A. C. Gould; B. Drake; C. B. Prater; A. L. Weisenhorn; S. Manne; H. G. Hansma; P. K. Hansma; J. Massie; M. Longmire; V. Elings; B. Dixon Northern; B. Mukergee; C. M. Peterson; W. Stoeckenius; T. R. Albrecht; C. F. Quate

J. Vac. Sci. Technol. A 8, 369–373 (1990) https://doi.org/10.1116/1.576398

Abstract

View articletitled, From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope

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Localized charge force microscopy

B. D. Terris; J. E. Stern; D. Rugar; H. J. Mamin

J. Vac. Sci. Technol. A 8, 374–377 (1990) https://doi.org/10.1116/1.576399

Abstract

View articletitled, Localized charge force microscopy

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Performance of a scanning force microscope using a laser diode

Dror Sarid; Douglas A. Iams; Jeffery T. Ingle; Volker Weissenberger; Josef Ploetz

J. Vac. Sci. Technol. A 8, 378–382 (1990) https://doi.org/10.1116/1.576400

Abstract

View articletitled, Performance of a scanning force microscope using a laser diode

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Force microscope with capacitive displacement detection

T. Göddenhenrich; H. Lemke; U. Hartmann; C. Heiden

J. Vac. Sci. Technol. A 8, 383–387 (1990) https://doi.org/10.1116/1.576401

Abstract

View articletitled, Force microscope with capacitive displacement detection

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Atomic force sensors constructed from carbon and quartz fibers

H. Schmidt; J. Heil; J. Wesner; W. Grill

J. Vac. Sci. Technol. A 8, 388–390 (1990) https://doi.org/10.1116/1.576402

Abstract

View articletitled, Atomic force sensors constructed from carbon and quartz fibers

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Surface imaging in air with a force microscope

T. Ishizaka; S. Morita; Y. Sugawara; T. Okada; S. Mishima; S. Imai; N. Mikoshiba

J. Vac. Sci. Technol. A 8, 391–393 (1990) https://doi.org/10.1116/1.576404

Abstract

View articletitled, Surface imaging in air with a force microscope

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Potentiometry for thin‐film structures using atomic force microscopy

M. Anders; M. Mück; C. Heiden

J. Vac. Sci. Technol. A 8, 394–399 (1990) https://doi.org/10.1116/1.576405

Abstract

View articletitled, Potentiometry for thin‐film structures using atomic force microscopy

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Imaging polished sapphire with atomic force microscopy

R. C. Barrett; C. F. Quate

J. Vac. Sci. Technol. A 8, 400–402 (1990) https://doi.org/10.1116/1.576406

Abstract

View articletitled, Imaging polished sapphire with atomic force microscopy

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Imaging bacteriorhodopsin lattices in purple membranes with atomic force microscopy

D. L. Worcester; H. S. Kim; R. G. Miller; P. J. Bryant

J. Vac. Sci. Technol. A 8, 403–405 (1990) https://doi.org/10.1116/1.576407

Abstract

View articletitled, Imaging bacteriorhodopsin lattices in purple membranes with atomic force microscopy

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High resolution magnetic force microscopy

P. Grütter; A. Wadas; E. Meyer; H. Heinzelmann; H.‐R. Hidber; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 8, 406–410 (1990) https://doi.org/10.1116/1.576408

Abstract

View articletitled, High resolution magnetic force microscopy

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Theory of magnetic force microscopy

U. Hartmann

J. Vac. Sci. Technol. A 8, 411–415 (1990) https://doi.org/10.1116/1.576409

Abstract

View articletitled, Theory of magnetic force microscopy

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Analysis of magnetic bit pattern by magnetic force microscopy

A. Wadas; P. Grütter; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 8, 416–420 (1990) https://doi.org/10.1116/1.576410

Abstract

View articletitled, Analysis of magnetic bit pattern by magnetic force microscopy

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Correlation between scanning tunneling microscopy/spectroscopy images and apex profiles of scanning tips

Osamu Nishikawa; Masahiko Tomitori; Fumikazu Iwawaki; Nobuo Hirano

J. Vac. Sci. Technol. A 8, 421–424 (1990) https://doi.org/10.1116/1.576411

Abstract

View articletitled, Correlation between scanning tunneling microscopy/spectroscopy images and apex profiles of scanning tips

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Elaboration and evaluation of tip manipulation of scanning tunneling microscopy

Masahiko Tomitori; Nobuo Hirano; Fumikazu Iwawaki; Yuichi Watanabe; Tetsuya Takayanagi; Osamu Nishikawa

J. Vac. Sci. Technol. A 8, 425–428 (1990) https://doi.org/10.1116/1.576412

Abstract

View articletitled, Elaboration and evaluation of tip manipulation of scanning tunneling microscopy

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New scanning tunneling microscopy tip for measuring surface topography

Y. Akama; E. Nishimura; A. Sakai; H. Murakami

J. Vac. Sci. Technol. A 8, 429–433 (1990) https://doi.org/10.1116/1.576413

Abstract

View articletitled, New scanning tunneling microscopy tip for measuring surface topography

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Tunneling tips imaged by scanning tunneling microscopy

R. Möller; A. Esslinger; M. Rauscher

J. Vac. Sci. Technol. A 8, 434–437 (1990) https://doi.org/10.1116/1.576414

Abstract

View articletitled, Tunneling tips imaged by scanning tunneling microscopy

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Oxygen‐induced sharpening process of W(111) tips for scanning tunneling microscope use

H. Wengelnik; H. Neddermeyer

J. Vac. Sci. Technol. A 8, 438–440 (1990) https://doi.org/10.1116/1.576415

Abstract

View articletitled, Oxygen‐induced sharpening process of W(111) tips for scanning tunneling microscope use

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Transmission electron microscopy of scanning tunneling tips

J. Garnaes; F. Kragh; K. A. Mo/rch; A. R. Thölén

J. Vac. Sci. Technol. A 8, 441–444 (1990) https://doi.org/10.1116/1.576417

Abstract

View articletitled, Transmission electron microscopy of scanning tunneling tips

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High Φ values in scanning tunneling microscopy: Field emission and tunnel regimes

J. Gómez‐Herrero; J. M. Gómez‐Rodríguez; Ricardo García; A. M. Baró

J. Vac. Sci. Technol. A 8, 445–449 (1990) https://doi.org/10.1116/1.577015

Abstract

View articletitled, High Φ values in scanning tunneling microscopy: Field emission and tunnel regimes

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Spectroscopic and spatial characterization of superconducting vortex core states with a scanning tunneling microscope

H. F. Hess; R. B. Robinson; R. C. Dynes; J. M. Valles, Jr.; J. V. Waszczak

J. Vac. Sci. Technol. A 8, 450–454 (1990) https://doi.org/10.1116/1.577016

Abstract

View articletitled, Spectroscopic and spatial characterization of superconducting vortex core states with a scanning tunneling microscope

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Tunneling spectroscopy of conductive ceramics

Takanori Oshio; Junzo Tanaka; Akira Ono; Toshihiko Nagamura; Yasuhiko Kamizono; Yoshiyuki Sakai; Shaw Ehara

J. Vac. Sci. Technol. A 8, 455–458 (1990) https://doi.org/10.1116/1.577017

Abstract

View articletitled, Tunneling spectroscopy of conductive ceramics

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Scanning tunneling potentiometry studies of Y₁Ba₂Cu₃O_7−x and gold thin films

A. D. Kent; I. Maggio‐Aprile; Ph. Niedermann; Ch. Renner; O/. Fischer

J. Vac. Sci. Technol. A 8, 459–463 (1990) https://doi.org/10.1116/1.577018

Abstract

View articletitled, Scanning tunneling potentiometry studies of Y1Ba2Cu3O7−x and gold thin films

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Low temperature scanning tunneling topography of YBa₂Cu₃O_x superconducting films

M. C. Gallagher; J. G. Adler

J. Vac. Sci. Technol. A 8, 464–467 (1990) https://doi.org/10.1116/1.577019

Abstract

View articletitled, Low temperature scanning tunneling topography of YBa2Cu3Ox superconducting films

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Characteristics of newly developed scanning tunneling microscopy/spectroscopy at low temperatures

T. Endo; H. Yamada; T. Sumomogi; K. Kuwahara; T. Fujita; S. Morita

J. Vac. Sci. Technol. A 8, 468–471 (1990) https://doi.org/10.1116/1.577020

Abstract

View articletitled, Characteristics of newly developed scanning tunneling microscopy/spectroscopy at low temperatures

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Scanning tunneling microscopy of chemical vapor deposition grown BiSrCaCuO films

Tomoji Nakamura; Takahiro Kimura; Takafumi Kimura; Masaru Ihara; Itsuo Umebu

J. Vac. Sci. Technol. A 8, 472–474 (1990) https://doi.org/10.1116/1.577021

Abstract

View articletitled, Scanning tunneling microscopy of chemical vapor deposition grown BiSrCaCuO films

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Surface electronic properties on BiO plane of Bi₂Sr₂CaCu₂O₈ single crystal measured by scanning tunneling microscopy

M. Tanaka; S. Yamazaki; M. Fujinami; T. Takahashi; H. Katayama‐Yoshida; W. Mizutani; K. Kajimura; M. Ono

J. Vac. Sci. Technol. A 8, 475–478 (1990) https://doi.org/10.1116/1.577022

Abstract

View articletitled, Surface electronic properties on BiO plane of Bi2Sr2CaCu2O8 single crystal measured by scanning tunneling microscopy

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Tunneling spectroscopy on an organic superconductor (BEDT‐TTF)₂Cu(NCS)₂

H. Bando; S. Kashiwaya; H. Tokumoto; H. Anzai; N. Kinoshita; K. Kajimura

J. Vac. Sci. Technol. A 8, 479–483 (1990) https://doi.org/10.1116/1.577023

Abstract

View articletitled, Tunneling spectroscopy on an organic superconductor (BEDT‐TTF)2Cu(NCS)2

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Scanning tunneling microscopy of silver containing salt of bis(ethylenedithio)tetrathiafulvalene

C. Bai; C. Dai; C. Zhu; Z. Chen; G. Huang; X. Wu; D. Zhu; John D. Baldeschwieler

J. Vac. Sci. Technol. A 8, 484–487 (1990) https://doi.org/10.1116/1.577024

Abstract

View articletitled, Scanning tunneling microscopy of silver containing salt of bis(ethylenedithio)tetrathiafulvalene

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Observation of an organic superconductor [bis(ethylenedithio)tetrathiafulvalene]₂[Cu(NCS)₂] by scanning tunneling microscopy

M. Yoshimura; K. Fujita; N. Ara; M. Kageshima; R. Shioda; A. Kawazu; H. Shigekawa; S. Hyodo

J. Vac. Sci. Technol. A 8, 488–489 (1990) https://doi.org/10.1116/1.577025

Abstract

View articletitled, Observation of an organic superconductor [bis(ethylenedithio)tetrathiafulvalene]2[Cu(NCS)2] by scanning tunneling microscopy

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Scanning tunneling microscopy of the linear chain compounds NbSe₃, TaS₃, and TaSe₃

C. G. Slough; B. Giambattista; W. W. McNairy; R. V. Coleman

J. Vac. Sci. Technol. A 8, 490–494 (1990) https://doi.org/10.1116/1.577026

Abstract

View articletitled, Scanning tunneling microscopy of the linear chain compounds NbSe3, TaS3, and TaSe3

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Different response of atomic force microscopy and scanning tunneling microscopy to charge density waves

E. Meyer; R. Wiesendanger; D. Anselmetti; H. R. Hidber; H.‐J. Güntherodt; F. Lévy; H. Berger

J. Vac. Sci. Technol. A 8, 495–499 (1990) https://doi.org/10.1116/1.576372

Abstract

View articletitled, Different response of atomic force microscopy and scanning tunneling microscopy to charge density waves

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Scanning tunneling microscopy observation of MoS₂ surface and gold clusters deposited on MoS₂ surface

T. Ichinokawa; T. Ichinose; M. Tohyama; H. Itoh

J. Vac. Sci. Technol. A 8, 500–503 (1990) https://doi.org/10.1116/1.576374

Abstract

View articletitled, Scanning tunneling microscopy observation of MoS2 surface and gold clusters deposited on MoS2 surface

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Scanning tunneling microscopy observation of sliding charge‐density wave in blue bronze

Kazushige Nomura; Kôichi Ichimura

J. Vac. Sci. Technol. A 8, 504–507 (1990) https://doi.org/10.1116/1.576375

Abstract

View articletitled, Scanning tunneling microscopy observation of sliding charge‐density wave in blue bronze

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Observing the varying scanning tunneling microscopy image of graphite

J. E. Yao; Y. K. Jiao

J. Vac. Sci. Technol. A 8, 508–510 (1990) https://doi.org/10.1116/1.576376

Abstract

View articletitled, Observing the varying scanning tunneling microscopy image of graphite

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Real‐time in situ studies of metal electrodeposition with scanning tunneling microscopy

R. S. Robinson

J. Vac. Sci. Technol. A 8, 511–514 (1990) https://doi.org/10.1116/1.576377

Abstract

View articletitled, Real‐time in situ studies of metal electrodeposition with scanning tunneling microscopy

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In situ scanning tunneling microscopy of platinum (111) surface with the observation of monatomic steps

K. Itaya; S. Sugawara; K. Sashikata; N. Furuya

J. Vac. Sci. Technol. A 8, 515–519 (1990) https://doi.org/10.1116/1.576378

Abstract

View articletitled, In situ scanning tunneling microscopy of platinum (111) surface with the observation of monatomic steps

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In situ, real‐time monitoring of electrode surfaces by scanning tunneling microscopy. III. Surface structure of Pt and Pd electrodes

Kohei Uosaki; Hideaki Kita

J. Vac. Sci. Technol. A 8, 520–524 (1990) https://doi.org/10.1116/1.576379

Abstract

View articletitled, In situ, real‐time monitoring of electrode surfaces by scanning tunneling microscopy. III. Surface structure of Pt and Pd electrodes

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In situ scanning tunneling microscopy observation of surface roughness of electrochemically modified Ag under potentiostatic control in conjunction with surface‐enhanced Raman scattering

K. Sakamaki; K. Itoh; A. Fujishima; Y. Gohshi

J. Vac. Sci. Technol. A 8, 525–529 (1990) https://doi.org/10.1116/1.576380

Abstract

View articletitled, In situ scanning tunneling microscopy observation of surface roughness of electrochemically modified Ag under potentiostatic control in conjunction with surface‐enhanced Raman scattering

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Chloride ion‐induced large scale reconstruction on an electrochemically roughened Ag electrode

I. Otsuka; T. Iwasaki

J. Vac. Sci. Technol. A 8, 530–533 (1990) https://doi.org/10.1116/1.576381

Abstract

View articletitled, Chloride ion‐induced large scale reconstruction on an electrochemically roughened Ag electrode

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Surface electronic structure of semiconductor ( p‐ and n‐Si) electrodes in electrolyte solution

E. Tomita; N. Matsuda; K. Itaya

J. Vac. Sci. Technol. A 8, 534–538 (1990) https://doi.org/10.1116/1.576382

Abstract

View articletitled, Surface electronic structure of semiconductor ( p‐ and n‐Si) electrodes in electrolyte solution

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Scanning tunneling microscopy studies of semiconductor electrochemistry

T. Thundat; L. A. Nagahara; S. M. Lindsay

J. Vac. Sci. Technol. A 8, 539–543 (1990) https://doi.org/10.1116/1.576383

Abstract

View articletitled, Scanning tunneling microscopy studies of semiconductor electrochemistry

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A scanning tunneling microscopy study of the surface microstructure of alpha‐ and beta‐lead dioxide

Brett A. Sexton; Guy F. Cotterill; Stephen Fletcher; Michael D. Horne

J. Vac. Sci. Technol. A 8, 544–548 (1990) https://doi.org/10.1116/1.576384

Abstract

View articletitled, A scanning tunneling microscopy study of the surface microstructure of alpha‐ and beta‐lead dioxide

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Scanning tunneling spectroscopy on cleaved silicon pn junctions

S. Kordić; E. J. van Loenen; D. Dijkkamp; A. J. Hoeven; H. K. Moraal

J. Vac. Sci. Technol. A 8, 549–552 (1990) https://doi.org/10.1116/1.576385

Abstract

View articletitled, Scanning tunneling spectroscopy on cleaved silicon pn junctions

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Observation of double heterostructures for laser diodes using scanning tunneling microscopy and current imaging tunneling spectroscopy in air

M. Tanimoto; Y. Nakano

J. Vac. Sci. Technol. A 8, 553–556 (1990) https://doi.org/10.1116/1.576386

Abstract

View articletitled, Observation of double heterostructures for laser diodes using scanning tunneling microscopy and current imaging tunneling spectroscopy in air

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Power spectra of surface roughness of light emitting tunnel junctions measured by scanning tunneling microscopy

K. Takeuchi; Y. Uehara; S. Ushioda; N. Mikoshiba; S. Morita

J. Vac. Sci. Technol. A 8, 557–560 (1990) https://doi.org/10.1116/1.576387

Abstract

View articletitled, Power spectra of surface roughness of light emitting tunnel junctions measured by scanning tunneling microscopy

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Scanning tip microscope for study of electrical inhomogeneity on submicron scale

Yutaka Mera; Hironori Yanagisawa; Masahiko Uota; Koji Maeda

J. Vac. Sci. Technol. A 8, 561–566 (1990) https://doi.org/10.1116/1.576388

Abstract

View articletitled, Scanning tip microscope for study of electrical inhomogeneity on submicron scale

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Observation of multiquantum well structure in air using a scanning tunneling microscope

Ichiro Tanaka; Takashi Kato; Shunsuke Ohkouchi; Fukunobu Osaka

J. Vac. Sci. Technol. A 8, 567–570 (1990) https://doi.org/10.1116/1.576389

Abstract

View articletitled, Observation of multiquantum well structure in air using a scanning tunneling microscope

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Etching of silicon (111) with the scanning tunneling microscope

E. E. Ehrichs; A. L. de Lozanne

J. Vac. Sci. Technol. A 8, 571–573 (1990) https://doi.org/10.1116/1.576390

Abstract

View articletitled, Etching of silicon (111) with the scanning tunneling microscope

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Nanometer scale structuring of silicon by direct indentation

E. J. van Loenen; D. Dijkkamp; A. J. Hoeven; J. M. Lenssinck; J. Dieleman

J. Vac. Sci. Technol. A 8, 574–576 (1990) https://doi.org/10.1116/1.576391

Abstract

View articletitled, Nanometer scale structuring of silicon by direct indentation

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Local modification of organic dye materials by dielectric breakdown

R. Kaneko; E. Hamada

J. Vac. Sci. Technol. A 8, 577–580 (1990) https://doi.org/10.1116/1.576392

Abstract

View articletitled, Local modification of organic dye materials by dielectric breakdown

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Fabrication of nucleation sites for nanometer size selective deposition by scanning tunneling microscope

Kazuo Terashima; Minoru Kondoh; Toyonobu Yoshida

J. Vac. Sci. Technol. A 8, 581–584 (1990) https://doi.org/10.1116/1.576393

Abstract

View articletitled, Fabrication of nucleation sites for nanometer size selective deposition by scanning tunneling microscope

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Nanometer‐scale roughness study and indentation test with a scanning tunneling microscope

Toru Yokohata; Koji Kato; Kenji Ohmura

J. Vac. Sci. Technol. A 8, 585–589 (1990) https://doi.org/10.1116/1.576394

Abstract

View articletitled, Nanometer‐scale roughness study and indentation test with a scanning tunneling microscope

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Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage

R. Möller; A. Esslinger; B. Koslowski

J. Vac. Sci. Technol. A 8, 590–593 (1990) https://doi.org/10.1116/1.576348

Abstract

View articletitled, Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage

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Study of field‐emitting microstructures using a scanning tunneling microscope

Ph. Niedermann; Ch. Renner; A. D. Kent; O/. Fischer

J. Vac. Sci. Technol. A 8, 594–597 (1990) https://doi.org/10.1116/1.576349

Abstract

View articletitled, Study of field‐emitting microstructures using a scanning tunneling microscope

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Possible evidence of single electron tunneling with the scanning tunneling microscope at room temperature

J. Valdeś; E. Choleva

J. Vac. Sci. Technol. A 8, 598–602 (1990) https://doi.org/10.1116/1.576350

Abstract

View articletitled, Possible evidence of single electron tunneling with the scanning tunneling microscope at room temperature

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Scanning tunneling microscopy of rough surfaces

D. R. Denley

J. Vac. Sci. Technol. A 8, 603–607 (1990) https://doi.org/10.1116/1.576351

Abstract

View articletitled, Scanning tunneling microscopy of rough surfaces

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Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopy

Masaharu Komiyama; Jun’ichi Kobayashi; Seizo Morita

J. Vac. Sci. Technol. A 8, 608–609 (1990) https://doi.org/10.1116/1.576352

Abstract

View articletitled, Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopy

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Scanning tunneling microscopy investigation of a spontaneous monolayer dispersion system: HgCl₂ on highly oriented pyrolitic graphite surface

Y. Xie; Q. Xu; Y. Tang; C. Bai; C. Dai

J. Vac. Sci. Technol. A 8, 610–613 (1990) https://doi.org/10.1116/1.576353

Abstract

View articletitled, Scanning tunneling microscopy investigation of a spontaneous monolayer dispersion system: HgCl2 on highly oriented pyrolitic graphite surface

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Surface density of states of TiO₂(110) single crystal and adsorbed molecular observation by scanning tunneling microscopy and tunneling spectroscopy

K. Sakamaki; K. Itoh; A. Fujishima; Y. Gohshi

J. Vac. Sci. Technol. A 8, 614–617 (1990) https://doi.org/10.1116/1.576354

Abstract

View articletitled, Surface density of states of TiO2(110) single crystal and adsorbed molecular observation by scanning tunneling microscopy and tunneling spectroscopy

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Material contrast using the scanning tunneling microscope in ambient conditions

H. Strecker; C. Stahl; H. Starke

J. Vac. Sci. Technol. A 8, 618–620 (1990) https://doi.org/10.1116/1.576355

Abstract

View articletitled, Material contrast using the scanning tunneling microscope in ambient conditions

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Evaluation of elastic emission machined surfaces by scanning tunneling microscopy

Yuzo Mori; Kazuto Yamauchi; Katsuyoshi Endo; Takashi Ide; Hiromichi Toyota; Keitaro Nishizawa; Minoru Hasegawa

J. Vac. Sci. Technol. A 8, 621–624 (1990) https://doi.org/10.1116/1.576357

Abstract

View articletitled, Evaluation of elastic emission machined surfaces by scanning tunneling microscopy

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A scanning tunneling microscopy/current imaging tunneling spectroscopy investigation of an organic molecule: 4‐cyano‐4′‐n‐heptylbiphenyl

A. Okumura; K. Miyamura; Y. Gohshi

J. Vac. Sci. Technol. A 8, 625–627 (1990) https://doi.org/10.1116/1.576358

Abstract

View articletitled, A scanning tunneling microscopy/current imaging tunneling spectroscopy investigation of an organic molecule: 4‐cyano‐4′‐n‐heptylbiphenyl

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Observation of Vickers imprints by scanning tunneling microscopy

Y. Miyazaki; Y. Koga; H. Hayashi

J. Vac. Sci. Technol. A 8, 628–630 (1990) https://doi.org/10.1116/1.576359

Abstract

View articletitled, Observation of Vickers imprints by scanning tunneling microscopy

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Surface roughness of rubbed polyimide film for liquid crystals by scanning tunneling microscopy

M. Suzuki; T. Maruno; F. Yamamoto; K. Nagai

J. Vac. Sci. Technol. A 8, 631–634 (1990) https://doi.org/10.1116/1.576360

Abstract

View articletitled, Surface roughness of rubbed polyimide film for liquid crystals by scanning tunneling microscopy

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Imaging of biomolecules with the scanning tunneling microscope: Problems and prospects

M. Salmeron; T. Beebe; J. Odriozola; T. Wilson; D. F. Ogletree; W. Siekhaus

J. Vac. Sci. Technol. A 8, 635–641 (1990) https://doi.org/10.1116/1.576361

Abstract

View articletitled, Imaging of biomolecules with the scanning tunneling microscope: Problems and prospects

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Molecular structure of organic compounds observed by high resolution scanning tunneling microscopy

S. Selci; A. Cricenti; A. C. Felici; R. Generosi; E. Gori; W. Djaczenko; G. Chiarotti

J. Vac. Sci. Technol. A 8, 642–644 (1990) https://doi.org/10.1116/1.576362

Abstract

View articletitled, Molecular structure of organic compounds observed by high resolution scanning tunneling microscopy

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Direct observation of bioelectrochemical processes by scanning tunneling microscopy

T. Thundat; L. A. Nagahara; P. Oden; S. M. Lindsay

J. Vac. Sci. Technol. A 8, 645–647 (1990) https://doi.org/10.1116/1.576363

Abstract

View articletitled, Direct observation of bioelectrochemical processes by scanning tunneling microscopy

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Polypeptide structures imaged by the scanning tunneling microscope

T. J. McMaster; H. Carr; M. J. Miles; P. Cairns; V. J. Morris

J. Vac. Sci. Technol. A 8, 648–651 (1990) https://doi.org/10.1116/1.576364

Abstract

View articletitled, Polypeptide structures imaged by the scanning tunneling microscope

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Direct observations of enzymes and their complexes by scanning tunneling microscopy

Virgil B. Elings; Ronald D. Edstrom; Marilyn H. Meinke; Xiuru Yang; Rui Yang; D. Fennell Evans

J. Vac. Sci. Technol. A 8, 652–654 (1990) https://doi.org/10.1116/1.576365

Abstract

View articletitled, Direct observations of enzymes and their complexes by scanning tunneling microscopy

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Scanning tunneling microscopy for studying the biomaterial–biological tissue interface

R. Emch; X. Clivaz; C. Taylor‐Denes; P. Vaudaux; P. Descouts

J. Vac. Sci. Technol. A 8, 655–658 (1990) https://doi.org/10.1116/1.576366

Abstract

View articletitled, Scanning tunneling microscopy for studying the biomaterial–biological tissue interface

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The topography of isolated molecules of copper–phthalocyanine adsorbed on GaAs(110)

R. Möller; R. Coenen; A. Esslinger; B. Koslowski

J. Vac. Sci. Technol. A 8, 659–660 (1990) https://doi.org/10.1116/1.576367

Abstract

View articletitled, The topography of isolated molecules of copper–phthalocyanine adsorbed on GaAs(110)

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Scanning tunneling microscopy imaging of uncoated biological material

M. H. Jericho; B. L. Blackford; D. C. Dahn; C. Frame; D. Maclean

J. Vac. Sci. Technol. A 8, 661–666 (1990) https://doi.org/10.1116/1.576368

Abstract

View articletitled, Scanning tunneling microscopy imaging of uncoated biological material

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Mechanisms for the deposition of nanometer‐sized structures from organic fluids using the scanning tunneling microscope

R. H. Bernhardt; G. C. McGonigal; R. Schneider; D. J. Thomson

J. Vac. Sci. Technol. A 8, 667–671 (1990) https://doi.org/10.1116/1.576369

Abstract

View articletitled, Mechanisms for the deposition of nanometer‐sized structures from organic fluids using the scanning tunneling microscope

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Adsorption of liquid crystals imaged using scanning tunneling microscopy

T. J. McMaster; H. Carr; M. J. Miles; P. Cairns; V. J. Morris

J. Vac. Sci. Technol. A 8, 672–674 (1990) https://doi.org/10.1116/1.576370

Abstract

View articletitled, Adsorption of liquid crystals imaged using scanning tunneling microscopy

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Scanning tunneling spectroscopy study of adsorbed molecules

W. Mizutani; M. Shigeno; Y. Sakakibara; K. Kajimura; M. Ono; S. Tanishima; K. Ohno; N. Toshima

J. Vac. Sci. Technol. A 8, 675–678 (1990) https://doi.org/10.1116/1.576371

Abstract

View articletitled, Scanning tunneling spectroscopy study of adsorbed molecules

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Reactive graphite etch and the structure of an adsorbed organic monolayer—a scanning tunneling microscopy study

Jürgen P. Rabe; Stefan Buchholz; Anna M. Ritcey

J. Vac. Sci. Technol. A 8, 679–683 (1990) https://doi.org/10.1116/1.576980

Abstract

View articletitled, Reactive graphite etch and the structure of an adsorbed organic monolayer—a scanning tunneling microscopy study

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Scanning tunneling microscopy of the phosphatidylcholine bilayers

Changhong Luo; Chuanfeng Zhu; Like Ruan; Guizhen Huang; Changchun Dai; Zhengbo Cheng; Chunli Bai; Yaxian Su; Sanduo Xu; Kechun Lin; John D. Baldeschwieler

J. Vac. Sci. Technol. A 8, 684–686 (1990) https://doi.org/10.1116/1.576981

Abstract

View articletitled, Scanning tunneling microscopy of the phosphatidylcholine bilayers

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Scanning tunneling microscopy of cytoskeletal proteins: Microtubules and intermediate filaments

Stuart Hameroff; Yovana Simic‐Krstic; Lawrence Vernetti; Y. C. Lee; Dror Sarid; Jerome Wiedmann; Virgil Elings; Kevin Kjoller; Robert McCuskey

J. Vac. Sci. Technol. A 8, 687–691 (1990) https://doi.org/10.1116/1.576982

Abstract

View articletitled, Scanning tunneling microscopy of cytoskeletal proteins: Microtubules and intermediate filaments

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Application of scanning tunneling microscopy for imaging of CNBr‐peptides of type I collagen

H. Snellman; L. J. Pelliniemi; R. Penttinen; R. Laiho

J. Vac. Sci. Technol. A 8, 692–694 (1990) https://doi.org/10.1116/1.576984

Abstract

View articletitled, Application of scanning tunneling microscopy for imaging of CNBr‐peptides of type I collagen

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The surface structure of artificial and natural membranes as studied by scanning tunneling microscopy

Su Ya‐Xian; Jiao Yue‐Kan; Xu San‐Duo; Yao Jun‐En; Lin Ke‐Chun

J. Vac. Sci. Technol. A 8, 695–697 (1990) https://doi.org/10.1116/1.576985

Abstract

View articletitled, The surface structure of artificial and natural membranes as studied by scanning tunneling microscopy

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Scanning tunneling microscopy of biomolecules

M. J. Miles; T. McMaster; H. J. Carr; A. S. Tatham; P. R. Shewry; J. M. Field; P. S. Belton; D. Jeenes; B. Hanley; M. Whittam; P. Cairns; V. J. Morris; N. Lambert

J. Vac. Sci. Technol. A 8, 698–702 (1990) https://doi.org/10.1116/1.576986

Abstract

View articletitled, Scanning tunneling microscopy of biomolecules

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Deoxyribonucleic acid structures visualized by scanning tunneling microscopy

C. Bendixen; F. Besenbacher; E. Lægsgaard; I. Stensgaard; B. Thomsen; O. Westergaard

J. Vac. Sci. Technol. A 8, 703–705 (1990) https://doi.org/10.1116/1.576987

Abstract

View articletitled, Deoxyribonucleic acid structures visualized by scanning tunneling microscopy

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Scanning tunneling microscopy images of metal‐coated bacteriophages and uncoated, double‐stranded DNA

Rebecca W. Keller; David D. Dunlap; Carlos Bustamante; David J. Keller; Ricardo G. Garcia; Carla Gray; Marcos F. Maestre

J. Vac. Sci. Technol. A 8, 706–712 (1990) https://doi.org/10.1116/1.576988

Abstract

View articletitled, Scanning tunneling microscopy images of metal‐coated bacteriophages and uncoated, double‐stranded DNA

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Scanning tunneling microscopic immunoassay: A preliminary experiment

Junji Masai; Takaaki Sorin; Shunzo Kondo

J. Vac. Sci. Technol. A 8, 713–717 (1990) https://doi.org/10.1116/1.576989

Abstract

View articletitled, Scanning tunneling microscopic immunoassay: A preliminary experiment

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