Skip Nav Destination

Issues

Select Year

Issue

Ion mixing of Al₂O₃ and Al films on SiO₂

A. A. Galuska; J. C. Uht; P. M. Adams; J. M. Coggi

J. Vac. Sci. Technol. A 6, 185–192 (1988) https://doi.org/10.1116/1.574978

Abstract

View articletitled, Ion mixing of Al2O3 and Al films on SiO2

Open the PDF for in another window

Interaction of atomic hydrogen with cleaved InP. I. The adsorption stage

O. M’hamedi; F. Proix; C. A. Sébenne

J. Vac. Sci. Technol. A 6, 193–198 (1988) https://doi.org/10.1116/1.574979

Abstract

View articletitled, Interaction of atomic hydrogen with cleaved InP. I. The adsorption stage

Open the PDF for in another window

Interaction of atomic hydrogen with cleaved InP. II. The decomposition stage

F. Proix; O. M’hamedi; C. A. Sébenne

J. Vac. Sci. Technol. A 6, 199–203 (1988) https://doi.org/10.1116/1.574980

Abstract

View articletitled, Interaction of atomic hydrogen with cleaved InP. II. The decomposition stage

Open the PDF for in another window

Oxygen effect on secondary ion emission of impurities in GaAs

T. Tanaka; Y. Homma; H. Okamoto

J. Vac. Sci. Technol. A 6, 204–209 (1988) https://doi.org/10.1116/1.574981

Abstract

View articletitled, Oxygen effect on secondary ion emission of impurities in GaAs

Open the PDF for in another window

Evidence for oxygen underlayer formation at near‐liquid‐nitrogen temperatures on Zr(0001)

Keith Griffiths

J. Vac. Sci. Technol. A 6, 210–212 (1988) https://doi.org/10.1116/1.574982

Abstract

View articletitled, Evidence for oxygen underlayer formation at near‐liquid‐nitrogen temperatures on Zr(0001)

Open the PDF for in another window

Secondary ion mass spectrometry depth profiling of Mo/SiO₂/Si structural samples

Kiyohisa Fujinaga; Izumi Kawashima

J. Vac. Sci. Technol. A 6, 213–216 (1988) https://doi.org/10.1116/1.574983

Abstract

View articletitled, Secondary ion mass spectrometry depth profiling of Mo/SiO2/Si structural samples

Open the PDF for in another window

Morphological and structural features of Cu seed cones

S. Morishita; Y. Fujimoto; F. Okuyama

J. Vac. Sci. Technol. A 6, 217–222 (1988) https://doi.org/10.1116/1.574984

Abstract

View articletitled, Morphological and structural features of Cu seed cones

Open the PDF for in another window

Current–voltage relations in magnetrons

S. M. Rossnagel; H. R. Kaufman

J. Vac. Sci. Technol. A 6, 223–229 (1988) https://doi.org/10.1116/1.574985

Abstract

View articletitled, Current–voltage relations in magnetrons

Open the PDF for in another window

Characterization and thermal desorption spectroscopy study on a new, low outgassing material surface for improved ultrahigh vacuum uses

D. Fujita; T. Homma

J. Vac. Sci. Technol. A 6, 230–234 (1988) https://doi.org/10.1116/1.574986

Abstract

View articletitled, Characterization and thermal desorption spectroscopy study on a new, low outgassing material surface for improved ultrahigh vacuum uses

Open the PDF for in another window

Proposal for a sensitive leak test telescope

W. R. Blanchard; J. L. Hemmerich; T. Winkel; D. Reiter

J. Vac. Sci. Technol. A 6, 235–237 (1988) https://doi.org/10.1116/1.575433

Abstract

View articletitled, Proposal for a sensitive leak test telescope

Open the PDF for in another window

Rotary pump backstreaming: An analytical appraisal of practical results and the factors affecting them

L. Laurenson; Sara Hickman; R. G. Livesey

J. Vac. Sci. Technol. A 6, 238–242 (1988) https://doi.org/10.1116/1.575434

Abstract

View articletitled, Rotary pump backstreaming: An analytical appraisal of practical results and the factors affecting them

Open the PDF for in another window

Reactively sputtered TeO_x thin films for optical recording systems

M. Di Giulio; G. Micocci; R. Rella; A. Tepore

J. Vac. Sci. Technol. A 6, 243–245 (1988) https://doi.org/10.1116/1.575435

Abstract

View articletitled, Reactively sputtered TeOx thin films for optical recording systems

Open the PDF for in another window

Large inexpensive quartz viewports for high‐vacuum systems

Wayne G. Fisher

J. Vac. Sci. Technol. A 6, 246–247 (1988) https://doi.org/10.1116/1.575436

View articletitled, Large inexpensive quartz viewports for high‐vacuum systems

Open the PDF for in another window

Erratum: Combining transmission probabilities of different diameter tubes [J. Vac. Sci. Technol. A 5, 2493 (1987)]

D. J. Santeler; M. D. Boeckmann

J. Vac. Sci. Technol. A 6, 248 (1988) https://doi.org/10.1116/1.575437

View articletitled, Erratum: Combining transmission probabilities of different diameter tubes [J. Vac. Sci. Technol. A 5, 2493 (1987)]

Open the PDF for in another window

Studies of superconductors using a low‐temperature, high‐field scanning tunneling microscope

J. R. Kirtley; R. M. Feenstra; A. P. Fein; S. I. Raider; W. J. Gallagher; R. Sandstrom; T. Dinger; M. W. Shafer; R. Koch; R. Laibowitz; B. Bumble

J. Vac. Sci. Technol. A 6, 259–262 (1988) https://doi.org/10.1116/1.575438

Abstract

View articletitled, Studies of superconductors using a low‐temperature, high‐field scanning tunneling microscope

Open the PDF for in another window

Detection of vortex motion in a type‐II superconductor by tunneling

R. Dittrich; C. Heiden

J. Vac. Sci. Technol. A 6, 263–265 (1988) https://doi.org/10.1116/1.575439

Abstract

View articletitled, Detection of vortex motion in a type‐II superconductor by tunneling

Open the PDF for in another window

Atomic force microscopy using optical interferometry

R. Erlandsson; G. M. McClelland; C. M. Mate; S. Chiang

J. Vac. Sci. Technol. A 6, 266–270 (1988) https://doi.org/10.1116/1.575440

Abstract

View articletitled, Atomic force microscopy using optical interferometry

Open the PDF for in another window

Atomic resolution with the atomic force microscope on conductors and nonconductors

Thomas R. Albrecht; Calvin F. Quate

J. Vac. Sci. Technol. A 6, 271–274 (1988) https://doi.org/10.1116/1.575441

Abstract

View articletitled, Atomic resolution with the atomic force microscope on conductors and nonconductors

Open the PDF for in another window

Atomic force microscopy: General aspects and application to insulators

H. Heinzelmann; E. Meyer; P. Grütter; H.‐R. Hidber; L. Rosenthaler; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 6, 275–278 (1988) https://doi.org/10.1116/1.575424

Abstract

View articletitled, Atomic force microscopy: General aspects and application to insulators

Open the PDF for in another window

Application of atomic force microscopy to magnetic materials

P. Grütter; E. Meyer; H. Heinzelmann; L. Rosenthaler; H.‐R. Hidber; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 6, 279–282 (1988) https://doi.org/10.1116/1.575425

Abstract

View articletitled, Application of atomic force microscopy to magnetic materials

Open the PDF for in another window

Scanning tunneling microscopy and atomic force microscopy of the liquid–solid interface

J. Schneir; O. Marti; G. Remmers; D. Gläser; R. Sonnenfeld; B. Drake; P. K. Hansma; V. Elings

J. Vac. Sci. Technol. A 6, 283–286 (1988) https://doi.org/10.1116/1.575426

Abstract

View articletitled, Scanning tunneling microscopy and atomic force microscopy of the liquid–solid interface

Open the PDF for in another window

Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on silicon

O. Marti; B. Drake; S. Gould; P. K. Hansma

J. Vac. Sci. Technol. A 6, 287–290 (1988) https://doi.org/10.1116/1.575427

Abstract

View articletitled, Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on silicon

Open the PDF for in another window

Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribology

R. Kaneko; K. Nonaka; K. Yasuda

J. Vac. Sci. Technol. A 6, 291–292 (1988) https://doi.org/10.1116/1.575428

View articletitled, Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribology

Open the PDF for in another window

Experimental study of forces between a tunnel tip and the graphite surface

H. Yamada; T. Fujii; K. Nakayama

J. Vac. Sci. Technol. A 6, 293–295 (1988) https://doi.org/10.1116/1.575429

Abstract

View articletitled, Experimental study of forces between a tunnel tip and the graphite surface

Open the PDF for in another window

Tunneling through localized barriers with application to scanning tunneling microscopy: New scattering theoretic approach and results

A. A. Lucas; H. Morawitz; G. R. Henry; J.‐P. Vigneron; Ph. Lambin; P. H. Cutler; T. E. Feuchtwang

J. Vac. Sci. Technol. A 6, 296–299 (1988) https://doi.org/10.1116/1.575430

Abstract

View articletitled, Tunneling through localized barriers with application to scanning tunneling microscopy: New scattering theoretic approach and results

Open the PDF for in another window

The signature of point defects in layered materials

H. A. Mizes; W. A. Harrison

J. Vac. Sci. Technol. A 6, 300–304 (1988) https://doi.org/10.1116/1.575431

Abstract

View articletitled, The signature of point defects in layered materials

Open the PDF for in another window

Characteristic electron‐barrier interaction times

C. R. Leavens; G. C. Aers

J. Vac. Sci. Technol. A 6, 305–310 (1988) https://doi.org/10.1116/1.575442

Abstract

View articletitled, Characteristic electron‐barrier interaction times

Open the PDF for in another window

Summary Abstract: Tunneling current between two nonplanar surfaces

W. Sacks; S. Gauthier; S. Rousset; J. Klein

J. Vac. Sci. Technol. A 6, 311–312 (1988) https://doi.org/10.1116/1.575432

View articletitled, Summary Abstract: Tunneling current between two nonplanar surfaces

Open the PDF for in another window

Theoretical scanning tunneling microscopy and atomic force microscopy study of graphite including tip–surface interaction

Inder P. Batra; S. Ciraci

J. Vac. Sci. Technol. A 6, 313–318 (1988) https://doi.org/10.1116/1.575443

Abstract

View articletitled, Theoretical scanning tunneling microscopy and atomic force microscopy study of graphite including tip–surface interaction

Open the PDF for in another window

Theory of scanning tunneling spectroscopy

C. Julian Chen

J. Vac. Sci. Technol. A 6, 319–322 (1988) https://doi.org/10.1116/1.575444

Abstract

View articletitled, Theory of scanning tunneling spectroscopy

Open the PDF for in another window

Theory of tunneling in metal–superconductor devices: Supercurrents in the superconductor gap at zero temperature

N. García; F. Flores; F. Guinea

J. Vac. Sci. Technol. A 6, 323–326 (1988) https://doi.org/10.1116/1.575445

Abstract

View articletitled, Theory of tunneling in metal–superconductor devices: Supercurrents in the superconductor gap at zero temperature

Open the PDF for in another window

Model calculation for the tunnel current from a tungsten tip to a Ni(100) surface with a chemisorbed oxygen atom

G. Doyen; D. Drakova; E. Kopatzki; R. J. Behm

J. Vac. Sci. Technol. A 6, 327–330 (1988) https://doi.org/10.1116/1.575446

Abstract

View articletitled, Model calculation for the tunnel current from a tungsten tip to a Ni(100) surface with a chemisorbed oxygen atom

Open the PDF for in another window

Theory of the local tunneling spectrum of a vibrating adsorbate

A. Baratoff; B. N. J. Persson

J. Vac. Sci. Technol. A 6, 331–335 (1988) https://doi.org/10.1116/1.575407

Abstract

View articletitled, Theory of the local tunneling spectrum of a vibrating adsorbate

Open the PDF for in another window

Summary Abstract: Scanning tunneling microscopy investigation of 2H‐MoS₂: A layered semiconducting transition‐metal dichalcogenide

M. Weimer; J. Kramar; C. Bai; J. D. Baldeschwieler; W. J. Kaiser

J. Vac. Sci. Technol. A 6, 336–337 (1988) https://doi.org/10.1116/1.575408

View articletitled, Summary Abstract: Scanning tunneling microscopy investigation of 2H‐MoS2: A layered semiconducting transition‐metal dichalcogenide

Open the PDF for in another window

Detection of atomic surface structure on NbSe₂ and NbSe₃ at 77 and 4.2 K using scanning tunneling microscopy

R. V. Coleman; B. Giambattista; A. Johnson; W. W. McNairy; G. Slough; P. K. Hansma; B. Drake

J. Vac. Sci. Technol. A 6, 338–343 (1988) https://doi.org/10.1116/1.575409

Abstract

View articletitled, Detection of atomic surface structure on NbSe2 and NbSe3 at 77 and 4.2 K using scanning tunneling microscopy

Open the PDF for in another window

Scanning tunneling spectroscopy study on graphite and 2H–NbSe₂

H. Bando; N. Morita; H. Tokumoto; W. Mizutani; K. Watanabe; A. Homma; S. Wakiyama; M. Shigeno; K. Endo; K. Kajimura

J. Vac. Sci. Technol. A 6, 344–348 (1988) https://doi.org/10.1116/1.575410

Abstract

View articletitled, Scanning tunneling spectroscopy study on graphite and 2H–NbSe2

Open the PDF for in another window

Imaging graphite in air by scanning tunneling microscopy: Role of the tip

R. J. Colton; S. M. Baker; R. J. Driscoll; M. G. Youngquist; J. D. Baldeschwieler; W. J. Kaiser

J. Vac. Sci. Technol. A 6, 349–353 (1988) https://doi.org/10.1116/1.575411

Abstract

View articletitled, Imaging graphite in air by scanning tunneling microscopy: Role of the tip

Open the PDF for in another window

Scanning tunneling microscopy of Kish graphite and highly oriented pyrolytic graphite in air

S. Morita; S. Tsukada; N. Mikoshiba

J. Vac. Sci. Technol. A 6, 354–357 (1988) https://doi.org/10.1116/1.575412

Abstract

View articletitled, Scanning tunneling microscopy of Kish graphite and highly oriented pyrolytic graphite in air

Open the PDF for in another window

Summary Abstract: Dipalmitoylphosphatidylcholine–Langmuir–Blodgett films on various substrates [Si(111), Au, Sn] studied by scanning tunneling microscopy

L. Eng; H.‐R. Hidber; L. Rosenthaler; U. Staufer; R. Wiesendanger; H.‐J. Güntherodt; L. Tamm

J. Vac. Sci. Technol. A 6, 358–359 (1988) https://doi.org/10.1116/1.575413

View articletitled, Summary Abstract: Dipalmitoylphosphatidylcholine–Langmuir–Blodgett films on various substrates [Si(111), Au, Sn] studied by scanning tunneling microscopy

Open the PDF for in another window

A study of graphite and intercalated graphite by scanning tunneling microscopy

S. Gauthier; S. Rousset; J. Klein; W. Sacks; M. Belin

J. Vac. Sci. Technol. A 6, 360–362 (1988) https://doi.org/10.1116/1.575414

Abstract

View articletitled, A study of graphite and intercalated graphite by scanning tunneling microscopy

Open the PDF for in another window

Scanning tunneling microscopy of graphite adsorbed metal species and sliding charge‐density wave systems

J. W. Lyding; J. S. Hubacek; G. Gammie; S. Skala; R. Brockenbrough; J. R. Shapley; M. P. Keyes

J. Vac. Sci. Technol. A 6, 363–367 (1988) https://doi.org/10.1116/1.575415

Abstract

View articletitled, Scanning tunneling microscopy of graphite adsorbed metal species and sliding charge‐density wave systems

Open the PDF for in another window

Scanning tunneling microscopy of Langmuir–Blodgett films on graphite

C. A. Lang; J. K. H. Hörber; T. W. Hänsch; W. M. Heckl; H. Möhwald

J. Vac. Sci. Technol. A 6, 368–370 (1988) https://doi.org/10.1116/1.575416

Abstract

View articletitled, Scanning tunneling microscopy of Langmuir–Blodgett films on graphite

Open the PDF for in another window

Summary Abstract: Scanning tunneling microscopy imaging of molybdenum disulfide

Gary W. Stupian; M. S. Leung

J. Vac. Sci. Technol. A 6, 371 (1988) https://doi.org/10.1116/1.575417

View articletitled, Summary Abstract: Scanning tunneling microscopy imaging of molybdenum disulfide

Open the PDF for in another window

Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite

T. Tiedje; J. Varon; H. Deckman; J. Stokes

J. Vac. Sci. Technol. A 6, 372–375 (1988) https://doi.org/10.1116/1.575418

Abstract

View articletitled, Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite

Open the PDF for in another window

A high‐performance scanning tunneling microscope

M. P. Cox; P. R. Griffin

J. Vac. Sci. Technol. A 6, 376–378 (1988) https://doi.org/10.1116/1.575419

Abstract

View articletitled, A high‐performance scanning tunneling microscope

Open the PDF for in another window

Summary Abstract: A scanning tunneling microscope combined with a scanning field emission microscope

R. Emch; Ph. Niedermann; P. Descouts; O/. Fischer

J. Vac. Sci. Technol. A 6, 379 (1988) https://doi.org/10.1116/1.575420

View articletitled, Summary Abstract: A scanning tunneling microscope combined with a scanning field emission microscope

Open the PDF for in another window

A new symmetric scanning tunneling microscope design

P. Davidsson; T. Claeson; S. Pehrson

J. Vac. Sci. Technol. A 6, 380–382 (1988) https://doi.org/10.1116/1.575421

Abstract

View articletitled, A new symmetric scanning tunneling microscope design

Open the PDF for in another window

Design of a scanning tunneling microscope for biological applications

R. Guckenberger; C. Kösslinger; W. Baumeister

J. Vac. Sci. Technol. A 6, 383–385 (1988) https://doi.org/10.1116/1.575422

Abstract

View articletitled, Design of a scanning tunneling microscope for biological applications

Open the PDF for in another window

An ultrahigh vacuum scanning tunneling microscope with interchangeable samples and tips

S. Chiang; R. J. Wilson; Ch. Gerber; V. M. Hallmark

J. Vac. Sci. Technol. A 6, 386–389 (1988) https://doi.org/10.1116/1.575423

Abstract

View articletitled, An ultrahigh vacuum scanning tunneling microscope with interchangeable samples and tips

Open the PDF for in another window

High‐speed scanning tunneling microscopes

S. Gregory; C. T. Rogers

J. Vac. Sci. Technol. A 6, 390–392 (1988) https://doi.org/10.1116/1.575401

Abstract

View articletitled, High‐speed scanning tunneling microscopes

Open the PDF for in another window

Data processing for scanning tunneling microscopy

L. Rosenthaler; H.‐R. Hidber; A. Tonin; L. Eng; U. Staufer; R. Wiesendanger; H.‐J. Güntherodt

J. Vac. Sci. Technol. A 6, 393–397 (1988) https://doi.org/10.1116/1.575402

Abstract

View articletitled, Data processing for scanning tunneling microscopy

Open the PDF for in another window

Image processing techniques for obtaining registration information with scanning tunneling microscopy

R. J. Wilson; S. Chiang

J. Vac. Sci. Technol. A 6, 398–400 (1988) https://doi.org/10.1116/1.575403

Abstract

View articletitled, Image processing techniques for obtaining registration information with scanning tunneling microscopy

Open the PDF for in another window

Imaging of laser generated surface ripples on silicon

J. Heil; J. Wesner; K. Hillmann; W. Grill; K. Altschoeller; M. Niksch

J. Vac. Sci. Technol. A 6, 401–403 (1988) https://doi.org/10.1116/1.575404

Abstract

View articletitled, Imaging of laser generated surface ripples on silicon

Open the PDF for in another window

Scanning tunneling microscopy topography of electron‐beam evaporated niobium thin films in Nb–NbO_x–Pb tunnel junctions on quartz substrates

D. G. Walmsley; R. J. Turner; H. P. Hagan; N. Garcia; A. Baro; L. Vazquez; R. Paganini

J. Vac. Sci. Technol. A 6, 404–407 (1988) https://doi.org/10.1116/1.575405

Abstract

View articletitled, Scanning tunneling microscopy topography of electron‐beam evaporated niobium thin films in Nb–NbOx–Pb tunnel junctions on quartz substrates

Open the PDF for in another window

Investigation of silicon in air with a fast scanning tunneling microscope

K. H. Besocke; M. Teske; J. Frohn

J. Vac. Sci. Technol. A 6, 408–411 (1988) https://doi.org/10.1116/1.575406

Abstract

View articletitled, Investigation of silicon in air with a fast scanning tunneling microscope

Open the PDF for in another window

Tunneling microscopy on various carbon materials

V. Elings; F. Wudl

J. Vac. Sci. Technol. A 6, 412–414 (1988) https://doi.org/10.1116/1.575384

Abstract

View articletitled, Tunneling microscopy on various carbon materials

Open the PDF for in another window

Scanning tunneling microscopy and optical spectrum studies of light‐emitting tunnel junctions

D. Pappas; P. D. Sparks; H. Hopster; J. E. Rutledge

J. Vac. Sci. Technol. A 6, 415–418 (1988) https://doi.org/10.1116/1.575385

Abstract

View articletitled, Scanning tunneling microscopy and optical spectrum studies of light‐emitting tunnel junctions

Open the PDF for in another window

Scanning tunneling microscopy of silver, gold, and aluminum monomers and small clusters on graphite

Eric Ganz; Klaus Sattler; John Clarke

J. Vac. Sci. Technol. A 6, 419–423 (1988) https://doi.org/10.1116/1.575386

Abstract

View articletitled, Scanning tunneling microscopy of silver, gold, and aluminum monomers and small clusters on graphite

Open the PDF for in another window

Scanning tunneling microscopy of semiconductor clusters

Dror Sarid; Tammy Henson; L. Stephen Bell; Claude J. Sandroff

J. Vac. Sci. Technol. A 6, 424–427 (1988) https://doi.org/10.1116/1.575387

Abstract

View articletitled, Scanning tunneling microscopy of semiconductor clusters

Open the PDF for in another window

Scanning tunneling microscopy of x‐ray optics

M. Green; M. Richter; J. Kortright; T. Barbee; R. Carr; I. Lindau

J. Vac. Sci. Technol. A 6, 428–431 (1988) https://doi.org/10.1116/1.575388

Abstract

View articletitled, Scanning tunneling microscopy of x‐ray optics

Open the PDF for in another window

Scanning tunneling microscopy of machined surfaces

M. Gehrtz; H. Strecker; H. Grimm

J. Vac. Sci. Technol. A 6, 432–435 (1988) https://doi.org/10.1116/1.575389

Abstract

View articletitled, Scanning tunneling microscopy of machined surfaces

Open the PDF for in another window

Scanning tunneling microscopy imaging of microbridges under scanning electron microscopy control

M. Anders; M. Thaer; M. Mück; C. Heiden

J. Vac. Sci. Technol. A 6, 436–439 (1988) https://doi.org/10.1116/1.575390

Abstract

View articletitled, Scanning tunneling microscopy imaging of microbridges under scanning electron microscopy control

Open the PDF for in another window

Observation of microfabricated patterns by scanning tunneling microscopy

S. Okayama; M. Komuro; W. Mizutani; H. Tokumoto; M. Okano; K. Shimizu; Y. Kobayashi; F. Matsumoto; S. Wakiyama; M. Shigeno; F. Sakai; S. Fujiwara; O. Kitamura; M. Ono; K. Kajimura

J. Vac. Sci. Technol. A 6, 440–444 (1988) https://doi.org/10.1116/1.575391

Abstract

View articletitled, Observation of microfabricated patterns by scanning tunneling microscopy

Open the PDF for in another window

Scanning tunneling microscope tip structures

Ruth Nicolaides; Yong Liang; William E. Packard; Zhou‐Wu Fu; Howard A. Blackstead; K. K. Chin; John D. Dow; Jacek K. Furdyna; Wei Min Hu; Robert C. Jaklevic; William J. Kaiser; Alan R. Pelton; Mary V. Zeller; Joseph Bellina, Jr.

J. Vac. Sci. Technol. A 6, 445–447 (1988) https://doi.org/10.1116/1.575392

Abstract

View articletitled, Scanning tunneling microscope tip structures

Open the PDF for in another window

Application of the scanning tunneling microscope to insulating surfaces

R. C. Jaklevic; L. Elie; Weidian Shen; J. T. Chen

J. Vac. Sci. Technol. A 6, 448–453 (1988) https://doi.org/10.1116/1.575393

Abstract

View articletitled, Application of the scanning tunneling microscope to insulating surfaces

Open the PDF for in another window

Scanning tunneling microscopy study of conductive ceramics

Osamu Nishikawa; Masahiko Tomitori

J. Vac. Sci. Technol. A 6, 454–456 (1988) https://doi.org/10.1116/1.575394

Abstract

View articletitled, Scanning tunneling microscopy study of conductive ceramics

Open the PDF for in another window

Scanning tunneling microscopy of β‐SiC and YBa₂Cu₃O₇_−x ceramic surfaces

N. J. Zheng; U. Knipping; I. S. T. Tsong; W. T. Petuskey; J. C. Barry

J. Vac. Sci. Technol. A 6, 457–460 (1988) https://doi.org/10.1116/1.575395

Abstract

View articletitled, Scanning tunneling microscopy of β‐SiC and YBa2Cu3O7−x ceramic surfaces

Open the PDF for in another window

Use of a scanning tunneling microscope to rectify optical frequencies and measure an operational tunneling time

A. A. Lucas; P. H. Cutler; T. E. Feuchtwang; T. T. Tsong; T. E. Sullivan; Y. Yuk; H. Nguyen; P. J. Silverman

J. Vac. Sci. Technol. A 6, 461–465 (1988) https://doi.org/10.1116/1.575396

Abstract

View articletitled, Use of a scanning tunneling microscope to rectify optical frequencies and measure an operational tunneling time

Open the PDF for in another window

Laser‐frequency mixing using the scanning tunneling microscope

L. Arnold; W. Krieger; H. Walther

J. Vac. Sci. Technol. A 6, 466–469 (1988) https://doi.org/10.1116/1.575397

Abstract

View articletitled, Laser‐frequency mixing using the scanning tunneling microscope

Open the PDF for in another window

Proposal for a novel gravitational‐wave sensor

M. Niksch; G. Binnig

J. Vac. Sci. Technol. A 6, 470–471 (1988) https://doi.org/10.1116/1.575398

Abstract

View articletitled, Proposal for a novel gravitational‐wave sensor

Open the PDF for in another window

Tunneling microscopy of silicon and germanium: Si(111)7×7, SnGe(111)7×7, GeSi(111)5×5, Si(111)9×9, Ge(111)2×8, Ge(100)2×1, Si(110)5×1

R. S. Becker; B. S. Swartzentruber; J. S. Vickers

J. Vac. Sci. Technol. A 6, 472–477 (1988) https://doi.org/10.1116/1.575399

Abstract

View articletitled, Tunneling microscopy of silicon and germanium: Si(111)7×7, SnGe(111)7×7, GeSi(111)5×5, Si(111)9×9, Ge(111)2×8, Ge(100)2×1, Si(110)5×1

Open the PDF for in another window

Reconstruction on rows and steps of Si(112) and Si(223)

Th. Berghaus; A. Brodde; H. Neddermeyer; St. Tosch

J. Vac. Sci. Technol. A 6, 478–482 (1988) https://doi.org/10.1116/1.575400

Abstract

View articletitled, Reconstruction on rows and steps of Si(112) and Si(223)

Open the PDF for in another window

On the interpretation of current images in scanning tunneling spectroscopy of Si(111)7×7

Th. Berghaus; A. Brodde; H. Neddermeyer; St. Tosch

J. Vac. Sci. Technol. A 6, 483–487 (1988) https://doi.org/10.1116/1.575364

Abstract

View articletitled, On the interpretation of current images in scanning tunneling spectroscopy of Si(111)7×7

Open the PDF for in another window

The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low‐energy electron diffraction

M. D. Pashley; K. W. Haberern; W. Friday

J. Vac. Sci. Technol. A 6, 488–492 (1988) https://doi.org/10.1116/1.575365

Abstract

View articletitled, The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low‐energy electron diffraction

Open the PDF for in another window

Tunneling microscopy of steps on vicinal Ge(001) and Si(001) surfaces

J. E. Griffith; J. A. Kubby; P. E. Wierenga; R. S. Becker; J. S. Vickers

J. Vac. Sci. Technol. A 6, 493–496 (1988) https://doi.org/10.1116/1.575366

Abstract

View articletitled, Tunneling microscopy of steps on vicinal Ge(001) and Si(001) surfaces

Open the PDF for in another window

Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy

J. Tersoff; R. M. Feenstra; Joseph A. Stroscio; A. P. Fein

J. Vac. Sci. Technol. A 6, 497–498 (1988) https://doi.org/10.1116/1.575367

View articletitled, Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy

Open the PDF for in another window

Voltage‐dependent scanning tunneling microscopy imaging of semiconductor surfaces

Joseph A. Stroscio; R. M. Feenstra; D. M. Newns; A. P. Fein

J. Vac. Sci. Technol. A 6, 499–507 (1988) https://doi.org/10.1116/1.575368

Abstract

View articletitled, Voltage‐dependent scanning tunneling microscopy imaging of semiconductor surfaces

Open the PDF for in another window

A scanning tunneling microscopy study of the reaction of Si(001)‐(2×1) with NH₃

R. J. Hamers; Ph. Avouris; F. Bozso

J. Vac. Sci. Technol. A 6, 508–511 (1988) https://doi.org/10.1116/1.575369

Abstract

View articletitled, A scanning tunneling microscopy study of the reaction of Si(001)‐(2×1) with NH3

Open the PDF for in another window

Atomic structure and bonding of Si(111)‐(√3×√3)Al

R. J. Hamers; J. E. Demuth

J. Vac. Sci. Technol. A 6, 512–516 (1988) https://doi.org/10.1116/1.575370

Abstract

View articletitled, Atomic structure and bonding of Si(111)‐(√3×√3)Al

Open the PDF for in another window

Summary Abstract: Scanning tunneling microscopy studies on Au/Si(111) interfaces

Ph. Dumas; A. Humbert; G. Mathieu; P. Mathiez; C. Mouttet; R. Rolland; F. Salvan; F. Thibaudau

J. Vac. Sci. Technol. A 6, 517–518 (1988) https://doi.org/10.1116/1.575371

View articletitled, Summary Abstract: Scanning tunneling microscopy studies on Au/Si(111) interfaces

Open the PDF for in another window

Scanning tunneling microscopy characterization of the geometric and electronic structure of hydrogen‐terminated silicon surfaces

W. J. Kaiser; L. D. Bell; M. H. Hecht; F. J. Grunthaner

J. Vac. Sci. Technol. A 6, 519–523 (1988) https://doi.org/10.1116/1.575372

Abstract

View articletitled, Scanning tunneling microscopy characterization of the geometric and electronic structure of hydrogen‐terminated silicon surfaces

Open the PDF for in another window

Study of metal surfaces by scanning tunneling microscopy with field ion microscopy

Y. Kuk; P. J. Silverman; H. Q. Nguyen

J. Vac. Sci. Technol. A 6, 524–528 (1988) https://doi.org/10.1116/1.575373

Abstract

View articletitled, Study of metal surfaces by scanning tunneling microscopy with field ion microscopy

Open the PDF for in another window

Icosahedral alloys studied by scanning tunneling microscopy

R. Wiesendanger; L. Rosenthaler; H.‐R. Hidber; L. Eng; U. Staufer; H.‐J. Güntherodt; M. Düggelin; R. Guggenheim

J. Vac. Sci. Technol. A 6, 529–530 (1988) https://doi.org/10.1116/1.575374

Abstract

View articletitled, Icosahedral alloys studied by scanning tunneling microscopy

Open the PDF for in another window

Scanning tunneling microscopy study of the Re(0001) surface passivated by one‐half a monolayer of sulfur in an atmospheric environment

B. Marchon; D. F. Ogletree; M. Salmeron; W. Siekhaus

J. Vac. Sci. Technol. A 6, 531–533 (1988) https://doi.org/10.1116/1.575375

Abstract

View articletitled, Scanning tunneling microscopy study of the Re(0001) surface passivated by one‐half a monolayer of sulfur in an atmospheric environment

Open the PDF for in another window

Current–voltage characteristics of metal/vacuum/metal tunneling

P. J. Bryant; H. S. Kim; R. Yang; Y. C. Zheng; R. Miller

J. Vac. Sci. Technol. A 6, 534–536 (1988) https://doi.org/10.1116/1.575376

Abstract

View articletitled, Current–voltage characteristics of metal/vacuum/metal tunneling

Open the PDF for in another window

Surface modification in the nanometer range by the scanning tunneling microscope

U. Staufer; R. Wiesendanger; L. Eng; L. Rosenthaler; H.‐R. Hidber; H.‐J. Güntherodt; N. Garcia

J. Vac. Sci. Technol. A 6, 537–539 (1988) https://doi.org/10.1116/1.575377

Abstract

View articletitled, Surface modification in the nanometer range by the scanning tunneling microscope

Open the PDF for in another window

Direct writing with the scanning tunneling microscope

E. E. Ehrichs; R. M. Silver; A. L. de Lozanne

J. Vac. Sci. Technol. A 6, 540–543 (1988) https://doi.org/10.1116/1.575378

Abstract

View articletitled, Direct writing with the scanning tunneling microscope

Open the PDF for in another window

Imaging deoxyribose nucleic acid molecules on a metal surface under water by scanning tunneling microscopy

S. M. Lindsay; B. Barris

J. Vac. Sci. Technol. A 6, 544–547 (1988) https://doi.org/10.1116/1.575379

Abstract

View articletitled, Imaging deoxyribose nucleic acid molecules on a metal surface under water by scanning tunneling microscopy

Open the PDF for in another window

Scanning tunneling microscopy imaging of biological structures

D. C. Dahn; M. O. Watanabe; B. L. Blackford; M. H. Jericho; T. J. Beveridge

J. Vac. Sci. Technol. A 6, 548–552 (1988) https://doi.org/10.1116/1.575380

Abstract

View articletitled, Scanning tunneling microscopy imaging of biological structures

Open the PDF for in another window

Summary Abstract: Preparation of polymer molecules for examination by scanning tunneling microscopy

Darrell H. Reneker; Barbara F. Howell

J. Vac. Sci. Technol. A 6, 553–554 (1988) https://doi.org/10.1116/1.575381

View articletitled, Summary Abstract: Preparation of polymer molecules for examination by scanning tunneling microscopy

Open the PDF for in another window

Issues

RSS

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

This Feature Is Available To Subscribers Only