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Influence of temperature on atomic layer epitaxial growth of indium nitride assessed with in situ grazing incidence small-angle x-ray scattering
Brilliance improvement of laser-produced extreme ultraviolet and soft x-ray plasmas based on pulsed gas jets
Plasma etching of high aspect ratio features in SiO2 using Ar/C4F8/O2 mixtures: A computational investigation
Effect of water vapor on plasma processing at atmospheric pressure: Polymer etching and surface modification by an Ar/H2O plasma jet
Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
Strategy for simultaneously increasing both hardness and toughness in ZrB2-rich Zr1−xTaxBy thin films
In situ investigation of as grown Cu(In,Ga)Se2 thin films by means of photoemission spectroscopy
Issues
LETTERS
Tetraallyltin precursor for plasma enhanced atomic layer deposition of tin oxide: Growth study and material characterization
J. Vac. Sci. Technol. A 37, 030601 (2019)
https://doi.org/10.1116/1.5091944
Sticking probabilities of H2O and Al(CH3)3 during atomic layer deposition of Al2O3 extracted from their impact on film conformality
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
Karsten Arts; Vincent Vandalon; Riikka L. Puurunen; Mikko Utriainen; Feng Gao; Wilhelmus M. M. (Erwin) Kessels; Harm C. M. Knoops
J. Vac. Sci. Technol. A 37, 030908 (2019)
https://doi.org/10.1116/1.5093620
Letters
Articles
Atomic Layer Deposition (ALD)
Influence of temperature on atomic layer epitaxial growth of indium nitride assessed with in situ grazing incidence small-angle x-ray scattering
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
Jeffrey M. Woodward; Samantha G. Rosenberg; Alexander C. Kozen; Neeraj Nepal; Scooter D. Johnson; Christa Wagenbach; Andrew H. Rowley; Zachary R. Robinson; Howie Joress; Karl F. Ludwig, Jr.; Charles R. Eddy, Jr.
J. Vac. Sci. Technol. A 37, 030901 (2019)
https://doi.org/10.1116/1.5081919
Evaluation of grating realized via pulse current electroplating combined with atomic layer deposition as an x-ray grating interferometer
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
Tae-Eun Song; Seho Lee; Hee Han; Soonyoung Jung; Soo-Hyun Kim; Min Jun Kim; Seung Wook Lee; Chi Won Ahn
J. Vac. Sci. Technol. A 37, 030903 (2019)
https://doi.org/10.1116/1.5080954
Growth characteristics of ZnO thin films produced via catalytic reaction-assisted chemical vapor deposition
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
J. Vac. Sci. Technol. A 37, 030904 (2019)
https://doi.org/10.1116/1.5079526
Formation of defects and impurities in MoSx and their effect on electronic properties
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
J. Vac. Sci. Technol. A 37, 030905 (2019)
https://doi.org/10.1116/1.5090237
Atomic layer deposition of amorphous tin-gallium oxide films
J. Vac. Sci. Technol. A 37, 030906 (2019)
https://doi.org/10.1116/1.5092877
Penetration depth variation in atomic layer deposition on multiwalled carbon nanotube forests
J. Vac. Sci. Technol. A 37, 030907 (2019)
https://doi.org/10.1116/1.5085051
Quartz crystal microbalance study of precursor diffusion during molecular layer deposition using cyclic azasilane, maleic anhydride, and water
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
J. Vac. Sci. Technol. A 37, 030909 (2019)
https://doi.org/10.1116/1.5093509
Interfaces
Thermally activated nucleation and growth of cobalt and nickel oxide nanoparticles on porous silica
In Special Collection:
Special Topic Collection on Complex Oxides
Vijayakumar Murugesan; Michel Gray; Mond Guo; Heather Job; Libor Kovarik; Arun Devaraj; Suntharampillai Thevuthasan; Karthikeyan K. Ramasamy
J. Vac. Sci. Technol. A 37, 031101 (2019)
https://doi.org/10.1116/1.5080448
Dislocation structures, interfacing, and magnetism in the − on ⊥− bilayer
J. P. Corbett; J. Guerrero-Sanchez; J. C. Gallagher; A.-O. Mandru; A. L. Richard; D. C. Ingram; F. Yang; N. Takeuchi; A. R. Smith
J. Vac. Sci. Technol. A 37, 031102 (2019)
https://doi.org/10.1116/1.5081960
Photovoltaics and Energy
Plasma Science and Technology
Characterization of a pulsed low pressure argon discharge in a cylindrical magnetron reactor by plasma diagnostic and 3D plasma modeling
J. Vac. Sci. Technol. A 37, 031301 (2019)
https://doi.org/10.1116/1.5064690
Study of Ge-rich GeSbTe etching process with different halogen plasmas
Yann Canvel; Sébastien Lagrasta; Christelle Boixaderas; Sébastien Barnola; Yann Mazel; Eugénie Martinez
J. Vac. Sci. Technol. A 37, 031302 (2019)
https://doi.org/10.1116/1.5089037
Brilliance improvement of laser-produced extreme ultraviolet and soft x-ray plasmas based on pulsed gas jets
J. Vac. Sci. Technol. A 37, 031303 (2019)
https://doi.org/10.1116/1.5089201
Plasma etching of high aspect ratio features in SiO2 using Ar/C4F8/O2 mixtures: A computational investigation
J. Vac. Sci. Technol. A 37, 031304 (2019)
https://doi.org/10.1116/1.5090606
Effect of water vapor on plasma processing at atmospheric pressure: Polymer etching and surface modification by an Ar/H2O plasma jet
J. Vac. Sci. Technol. A 37, 031305 (2019)
https://doi.org/10.1116/1.5092272
Surfaces
Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements

Donald R. Baer; Kateryna Artyushkova; Christopher Richard Brundle; James E. Castle; Mark H. Engelhard; Karen J. Gaskell; John T. Grant; Richard T. Haasch; Matthew R. Linford; Cedric J. Powell; Alexander G. Shard; Peter M. A. Sherwood; Vincent S. Smentkowski
J. Vac. Sci. Technol. A 37, 031401 (2019)
https://doi.org/10.1116/1.5065501
Thin Films
Electrical and optical properties of wide-gap n-type Sn2Ta2O7 films
In Special Collection:
Special Topic Collection on Complex Oxides
J. Vac. Sci. Technol. A 37, 031501 (2019)
https://doi.org/10.1116/1.5081991
Nanocrystalline tin oxide coatings on etched optical fiber Bragg grating for hydrogen sulfide detection
J. Vac. Sci. Technol. A 37, 031502 (2019)
https://doi.org/10.1116/1.5083107
Phase transformation and light emission in Er-doped Si-rich HfO2 films prepared by magnetron sputtering
J. Vac. Sci. Technol. A 37, 031503 (2019)
https://doi.org/10.1116/1.5085143
Electron-electron interactions in nano-patterned La0.3Sr0.7MnO3 thin films
In Special Collection:
Special Topic Collection on Complex Oxides
J. Vac. Sci. Technol. A 37, 031504 (2019)
https://doi.org/10.1116/1.5085669
Effect of oxygen flow rate on the low temperature deposition of titanium monoxide thin films via electron beam evaporation
J. Vac. Sci. Technol. A 37, 031505 (2019)
https://doi.org/10.1116/1.5082166
Strategy for simultaneously increasing both hardness and toughness in ZrB2-rich Zr1−xTaxBy thin films
Babak Bakhit; David L. J. Engberg; Jun Lu; Johanna Rosen; Hans Högberg; Lars Hultman; Ivan Petrov; J. E. Greene; Grzegorz Greczynski
J. Vac. Sci. Technol. A 37, 031506 (2019)
https://doi.org/10.1116/1.5093170
Formation of highly conformal spinel lithium titanate thin films based on a novel three-step atomic layer deposition process
In Special Collection:
Special Topic Collection on Complex Oxides
J. Vac. Sci. Technol. A 37, 031508 (2019)
https://doi.org/10.1116/1.5082275
In situ investigation of as grown Cu(In,Ga)Se2 thin films by means of photoemission spectroscopy
Wolfram Calvet; Bünyamin Ümsür; Alexander Steigert; Karsten Prietzel; Dieter Greiner; Christian A. Kaufmann; Thomas Unold; Martha Lux-Steiner; Iver Lauermann
J. Vac. Sci. Technol. A 37, 031510 (2019)
https://doi.org/10.1116/1.5089412
Kinetic model for color-center formation in TiO2 film using femtosecond laser irradiation
In Special Collection:
Special Topic Collection on Complex Oxides
J. Vac. Sci. Technol. A 37, 031512 (2019)
https://doi.org/10.1116/1.5085822
Reactive sputter deposition of WO3 films by using two deposition methods
In Special Collection:
Conference Collection: PACSURF 2018
Yoji Yasuda; Yoichi Hoshi; Shin-ichi Kobayashi; Takayuki Uchida; Yutaka Sawada; Meihan Wang; Hao Lei
J. Vac. Sci. Technol. A 37, 031514 (2019)
https://doi.org/10.1116/1.5092863
Optical properties of MoO3/Ag/MoO3 multilayer structures determined using spectroscopic ellipsometry
J. Vac. Sci. Technol. A 37, 031515 (2019)
https://doi.org/10.1116/1.5095958
Resistivity and surface scattering of (0001) single crystal ruthenium thin films
Sameer S. Ezzat; Prabhu Doss Mani; Asim Khaniya; William Kaden; Daniel Gall; Katayun Barmak; Kevin R. Coffey
J. Vac. Sci. Technol. A 37, 031516 (2019)
https://doi.org/10.1116/1.5093494
Vacuum Science and Technology
Cryopumping of hydrogen on stainless steel in the temperature range between 7 and 18 K
J. Vac. Sci. Technol. A 37, 031601 (2019)
https://doi.org/10.1116/1.5086164
Calibration of ultra-fine helium leak rates for leak testing of microelectromechanical systems
J. Vac. Sci. Technol. A 37, 031602 (2019)
https://doi.org/10.1116/1.5090454
Measured relationship between thermodynamic pressure and refractivity for six candidate gases in laser barometry
J. Vac. Sci. Technol. A 37, 031603 (2019)
https://doi.org/10.1116/1.5092185
Review Articles
Status and prospects of plasma-assisted atomic layer deposition
In Special Collection:
2019 Special Collection on Atomic Layer Deposition (ALD)
J. Vac. Sci. Technol. A 37, 030902 (2019)
https://doi.org/10.1116/1.5088582
ERRATA
What more can be done with XPS? Highly informative but underused approaches to XPS data collection and analysis
Donald R. Baer, Merve Taner Camci, et al.
Low-resistivity molybdenum obtained by atomic layer deposition
Kees van der Zouw, Bernhard Y. van der Wel, et al.