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Atomic layer deposition on polymer fibers and fabrics for multifunctional and electronic textiles
Issues
January 2016
ISSN 0734-2101
EISSN 1520-8559
Review Articles
Atomic layer deposition on polymer fibers and fabrics for multifunctional and electronic textiles
J. Vac. Sci. Technol. A 34, 010801 (2016)
https://doi.org/10.1116/1.4938104
Atomic Layer Deposition (ALD)
Thermal chemistry of copper acetamidinate atomic layer deposition precursors on silicon oxide surfaces studied by XPS
J. Vac. Sci. Technol. A 34, 01A101 (2016)
https://doi.org/10.1116/1.4927843
Comparison of B2O3 and BN deposited by atomic layer deposition for forming ultrashallow dopant regions by solid state diffusion
J. Vac. Sci. Technol. A 34, 01A102 (2016)
https://doi.org/10.1116/1.4928705
Atomic layer deposition of molybdenum oxide from (NtBu)2(NMe2)2Mo and O2 plasma
J. Vac. Sci. Technol. A 34, 01A103 (2016)
https://doi.org/10.1116/1.4930161
Dynamic order reduction of thin-film deposition kinetics models: A reaction factorization approach
J. Vac. Sci. Technol. A 34, 01A104 (2016)
https://doi.org/10.1116/1.4930591
Diffusion and interface evolution during the atomic layer deposition of TiO2 on GaAs(100) and InAs(100) surfaces
J. Vac. Sci. Technol. A 34, 01A105 (2016)
https://doi.org/10.1116/1.4931568
Vanadium dioxide film protected with an atomic-layer-deposited Al2O3 thin film
J. Vac. Sci. Technol. A 34, 01A106 (2016)
https://doi.org/10.1116/1.4931723
Effect of substrate composition on atomic layer deposition using self-assembled monolayers as blocking layers
J. Vac. Sci. Technol. A 34, 01A107 (2016)
https://doi.org/10.1116/1.4931722
Mechanistic modeling study on process optimization and precursor utilization with atmospheric spatial atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A108 (2016)
https://doi.org/10.1116/1.4932564
Low-temperature atomic layer deposition of copper(II) oxide thin films
Tomi Iivonen; Jani Hämäläinen; Benoît Marchand; Kenichiro Mizohata; Miika Mattinen; Georgi Popov; Jiyeon Kim; Roland A. Fischer; Markku Leskelä
J. Vac. Sci. Technol. A 34, 01A109 (2016)
https://doi.org/10.1116/1.4933089
Atomic layer deposition of ultrathin Cu2O and subsequent reduction to Cu studied by in situ x-ray photoelectron spectroscopy
Dileep Dhakal; Khaybar Assim; Heinrich Lang; Philipp Bruener; Thomas Grehl; Colin Georgi; Thomas Waechtler; Ramona Ecke; Stefan E. Schulz; Thomas Gessner
J. Vac. Sci. Technol. A 34, 01A111 (2016)
https://doi.org/10.1116/1.4933088
Morphology, composition and electrical properties of SnO2:Cl thin films grown by atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A112 (2016)
https://doi.org/10.1116/1.4933328
Blistering during the atomic layer deposition of iridium
Pascal Genevée; Ernest Ahiavi; Norik Janunts; Thomas Pertsch; Maria Oliva; Ernst-Bernhard Kley; Adriana Szeghalmi
J. Vac. Sci. Technol. A 34, 01A113 (2016)
https://doi.org/10.1116/1.4934753
Gas permeation barriers deposited by atmospheric pressure plasma enhanced atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A114 (2016)
https://doi.org/10.1116/1.4935337
Atomic layer deposited cobalt oxide: An efficient catalyst for NaBH4 hydrolysis
J. Vac. Sci. Technol. A 34, 01A115 (2016)
https://doi.org/10.1116/1.4935353
Novel copper compounds for vapor deposition: Characterization and thermolysis
J. Vac. Sci. Technol. A 34, 01A116 (2016)
https://doi.org/10.1116/1.4935447
Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO2 films
J. Vac. Sci. Technol. A 34, 01A117 (2016)
https://doi.org/10.1116/1.4935338
Room temperature plasma enhanced atomic layer deposition for TiO2 and WO3 films
J. Vac. Sci. Technol. A 34, 01A118 (2016)
https://doi.org/10.1116/1.4935356
Ultraviolet optical properties of aluminum fluoride thin films deposited by atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A120 (2016)
https://doi.org/10.1116/1.4935450
Fast spatial atomic layer deposition of Al2O3 at low temperature (<100 °C) as a gas permeation barrier for flexible organic light-emitting diode displays
Hagyoung Choi; Seokyoon Shin; Hyeongtag Jeon; Yeongtae Choi; Junghun Kim; Sanghun Kim; Seog Chul Chung; Kiyoung Oh
J. Vac. Sci. Technol. A 34, 01A121 (2016)
https://doi.org/10.1116/1.4934752
Low-temperature sequential pulsed chemical vapor deposition of ternary BxGa1-xN and BxIn1-xN thin film alloys
J. Vac. Sci. Technol. A 34, 01A123 (2016)
https://doi.org/10.1116/1.4936072
Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon
Lauri Kilpi; Oili M. E. Ylivaara; Antti Vaajoki; Jari Malm; Sakari Sintonen; Marko Tuominen; Riikka L. Puurunen; Helena Ronkainen
J. Vac. Sci. Technol. A 34, 01A124 (2016)
https://doi.org/10.1116/1.4935959
Substrate temperature influence on the properties of GaN thin films grown by hollow-cathode plasma-assisted atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A125 (2016)
https://doi.org/10.1116/1.4936230
Ag films grown by remote plasma enhanced atomic layer deposition on different substrates
Akinwumi A. Amusan; Bodo Kalkofen; Hassan Gargouri; Klaus Wandel; Cay Pinnow; Marco Lisker; Edmund P. Burte
J. Vac. Sci. Technol. A 34, 01A126 (2016)
https://doi.org/10.1116/1.4936221
Plasma-enhanced atomic layer deposition of titanium oxynitrides films: A comparative spectroscopic and electrical study
Małgorzata Sowińska; Karsten Henkel; Dieter Schmeißer; Irina Kärkkänen; Jessica Schneidewind; Franziska Naumann; Bernd Gruska; Hassan Gargouri
J. Vac. Sci. Technol. A 34, 01A127 (2016)
https://doi.org/10.1116/1.4936227
Atomic layer deposition of alternative glass microchannel plates
Aileen O'Mahony; Christopher A. Craven; Michael J. Minot; Mark A. Popecki; Joseph M. Renaud; Daniel C. Bennis; Justin L. Bond; Michael E. Stochaj; Michael R. Foley; Bernhard W. Adams; Anil U. Mane; Jeffrey W. Elam; Camden Ertley; Oswald H. W. Siegmund
J. Vac. Sci. Technol. A 34, 01A128 (2016)
https://doi.org/10.1116/1.4936231
Comparison of tungsten films grown by CVD and hot-wire assisted atomic layer deposition in a cold-wall reactor
Mengdi Yang; Antonius A. I. Aarnink; Alexey Y. Kovalgin; Dirk. J. Gravesteijn; Rob A. M. Wolters; Jurriaan Schmitz
J. Vac. Sci. Technol. A 34, 01A129 (2016)
https://doi.org/10.1116/1.4936387
Luminescence properties of lanthanide and ytterbium lanthanide titanate thin films grown by atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A130 (2016)
https://doi.org/10.1116/1.4936389
Novel chemoresistive CH4 sensor with 10 ppm sensitivity based on multiwalled carbon nanotubes functionalized with SnO2 nanocrystals
J. Vac. Sci. Technol. A 34, 01A131 (2016)
https://doi.org/10.1116/1.4936384
Atomic layer deposition of boron-containing films using B2F4
Anil U. Mane; Jeffrey W. Elam; Alexander Goldberg; Thomas E. Seidel; Mathew D. Halls; Michael I. Current; Joseph Despres; Oleg Byl; Ying Tang; Joseph Sweeney
J. Vac. Sci. Technol. A 34, 01A132 (2016)
https://doi.org/10.1116/1.4935651
Electrical characterization of atomic layer deposited Al2O3/InN interfaces
J. Vac. Sci. Technol. A 34, 01A133 (2016)
https://doi.org/10.1116/1.4936928
Enhancing of catalytic properties of vanadia via surface doping with phosphorus using atomic layer deposition
Verena E. Strempel; Daniel Löffler; Jutta Kröhnert; Katarzyna Skorupska; Benjamin Johnson; Raoul Naumann d'Alnoncourt; Matthias Driess; Frank Rosowski
J. Vac. Sci. Technol. A 34, 01A135 (2016)
https://doi.org/10.1116/1.4936390
Low-temperature SiON films deposited by plasma-enhanced atomic layer deposition method using activated silicon precursor
Sungin Suh; Seung Wook Ryu; Seongjae Cho; Jun-Rae Kim; Seongkyung Kim; Cheol Seong Hwang; Hyeong Joon Kim
J. Vac. Sci. Technol. A 34, 01A136 (2016)
https://doi.org/10.1116/1.4937734
Atomic layer deposition by reaction of molecular oxygen with tetrakisdimethylamido-metal precursors
J. Vac. Sci. Technol. A 34, 01A138 (2016)
https://doi.org/10.1116/1.4937991
Plasma enhanced atomic layer deposition of silicon nitride using neopentasilane
J. Vac. Sci. Technol. A 34, 01A140 (2016)
https://doi.org/10.1116/1.4937993
Ultraviolet photodetector based on MgxZn1-xO films using plasma-enhanced atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A141 (2016)
https://doi.org/10.1116/1.4938074
Atomic layer deposition of NiS and its application as cathode material in dye sensitized solar cell
J. Vac. Sci. Technol. A 34, 01A142 (2016)
https://doi.org/10.1116/1.4938078
Standing and sitting adlayers in atomic layer deposition of ZnO
J. Vac. Sci. Technol. A 34, 01A143 (2016)
https://doi.org/10.1116/1.4938080
Thickness-dependent growth orientation of F-doped ZnO films formed by atomic layer deposition
J. Vac. Sci. Technol. A 34, 01A144 (2016)
https://doi.org/10.1116/1.4938180
Spatial atomic layer deposition on flexible porous substrates: ZnO on anodic aluminum oxide films and Al2O3 on Li ion battery electrodes
J. Vac. Sci. Technol. A 34, 01A146 (2016)
https://doi.org/10.1116/1.4937728
Low-temperature atomic layer deposition of TiO2 thin layers for the processing of memristive devices
Samuele Porro; Alladin Jasmin; Katarzyna Bejtka; Daniele Conti; Denis Perrone; Salvatore Guastella; Candido F. Pirri; Alessandro Chiolerio; Carlo Ricciardi
J. Vac. Sci. Technol. A 34, 01A147 (2016)
https://doi.org/10.1116/1.4938465
Probabilistic distributions of pinhole defects in atomic layer deposited films on polymeric substrates
J. Vac. Sci. Technol. A 34, 01A149 (2016)
https://doi.org/10.1116/1.4938496
Simulation of nucleation and growth of atomic layer deposition phosphorus for doping of advanced FinFETs
J. Vac. Sci. Technol. A 34, 01A150 (2016)
https://doi.org/10.1116/1.4938585
Properties of nanostructured undoped ZrO2 thin film electrolytes by plasma enhanced atomic layer deposition for thin film solid oxide fuel cells
Gu Young Cho; Seungtak Noh; Yoon Ho Lee; Sanghoon Ji; Soon Wook Hong; Bongjun Koo; Jihwan An; Young-Beom Kim; Suk Won Cha
J. Vac. Sci. Technol. A 34, 01A151 (2016)
https://doi.org/10.1116/1.4938105
Low temperature platinum atomic layer deposition on nylon-6 for highly conductive and catalytic fiber mats
J. Vac. Sci. Technol. A 34, 01A152 (2016)
https://doi.org/10.1116/1.4935448
Atomic Layer Etching (ALE)
Application of cyclic fluorocarbon/argon discharges to device patterning
Dominik Metzler; Kishore Uppireddi; Robert L. Bruce; Hiroyuki Miyazoe; Yu Zhu; William Price; Ed S. Sikorski; Chen Li; Sebastian U. Engelmann; Eric A. Joseph; Gottlieb S. Oehrlein
J. Vac. Sci. Technol. A 34, 01B102 (2016)
https://doi.org/10.1116/1.4935460
Initial evaluation and comparison of plasma damage to atomic layer carbon materials using conventional and low Te plasma sources
Ashish V. Jagtiani; Hiroyuki Miyazoe; Josephine Chang; Damon B. Farmer; Michael Engel; Deborah Neumayer; Shu-Jen Han; Sebastian U. Engelmann; David R. Boris; Sandra C. Hernández; Evgeniya H. Lock; Scott G. Walton; Eric A. Joseph
J. Vac. Sci. Technol. A 34, 01B103 (2016)
https://doi.org/10.1116/1.4936622
What more can be done with XPS? Highly informative but underused approaches to XPS data collection and analysis
Donald R. Baer, Merve Taner Camci, et al.
Low-resistivity molybdenum obtained by atomic layer deposition
Kees van der Zouw, Bernhard Y. van der Wel, et al.