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Issues
May 2006
ISSN 0734-2101
EISSN 1520-8559
In this Issue
Regular Articles
Analysis of unstable species in cyclo- plasma by ion attachment mass spectrometry
J. Vac. Sci. Technol. A 24, 385–389 (2006)
https://doi.org/10.1116/1.2177228
Characterization of facing-target reactive sputtered polycrystalline films
J. Vac. Sci. Technol. A 24, 390–395 (2006)
https://doi.org/10.1116/1.2183226
Effects of Pt addition on the formation of Co–ITO granular magnetoresistance films by a two-step method
J. Vac. Sci. Technol. A 24, 408–412 (2006)
https://doi.org/10.1116/1.2186652
Electron cyclotron resonance plasma assisted pulsed laser deposition for compound host film synthesis and in situ doping
J. Vac. Sci. Technol. A 24, 413–417 (2006)
https://doi.org/10.1116/1.2186653
Deposition of hafnium oxide from Hf -butoxide and nitric oxide
J. Vac. Sci. Technol. A 24, 418–423 (2006)
https://doi.org/10.1116/1.2186660
Plasma etching of benzocyclobutene in and plasmas
J. Vac. Sci. Technol. A 24, 424–430 (2006)
https://doi.org/10.1116/1.2187994
Selective etching of high- films over Si in hydrogen-added fluorocarbon ( and ) plasmas
J. Vac. Sci. Technol. A 24, 437–443 (2006)
https://doi.org/10.1116/1.2187997
Characterization of the NiFe sputter etch process in a rf plasma
J. Vac. Sci. Technol. A 24, 444–449 (2006)
https://doi.org/10.1116/1.2187998
Computational analysis of solid-vapor equilibria for ZnS and SrS phosphor synthesis conditions
J. Vac. Sci. Technol. A 24, 450–458 (2006)
https://doi.org/10.1116/1.2190648
Electrical property improvements of yttrium oxide-based metal-insulator-metal capacitors
C. Durand; C. Vallée; C. Dubourdieu; M. Kahn; M. Derivaz; S. Blonkowski; D. Jalabert; P. Hollinger; Q. Fang; I. W. Boyd
J. Vac. Sci. Technol. A 24, 459–466 (2006)
https://doi.org/10.1116/1.2190649
Thin film reaction of transition metals with germanium
J. Vac. Sci. Technol. A 24, 474–485 (2006)
https://doi.org/10.1116/1.2191861
Attenuation of hydrogen radicals traveling under flowing gas conditions through tubes of different materials
J. Vac. Sci. Technol. A 24, 486–496 (2006)
https://doi.org/10.1116/1.2191862
Surfactant-assisted growth of CdS thin films for photovoltaic applications
J. Vac. Sci. Technol. A 24, 497–504 (2006)
https://doi.org/10.1116/1.2194929
Characteristics and diagnostics of an ultrahigh vacuum compatible laser ablation source for crossed molecular beam experiments
J. Vac. Sci. Technol. A 24, 505–511 (2006)
https://doi.org/10.1116/1.2194935
Effect of multipactor discharge on Alcator C-Mod ion cyclotron range of frequency heating
J. Vac. Sci. Technol. A 24, 512–516 (2006)
https://doi.org/10.1116/1.2194937
Arsenic doping for synthesis of nanocrystalline -type ZnO thin films
J. Vac. Sci. Technol. A 24, 517–520 (2006)
https://doi.org/10.1116/1.2194939
Low-temperature sputtering of crystalline films
J. Vac. Sci. Technol. A 24, 521–528 (2006)
https://doi.org/10.1116/1.2187993
Conductance measurement of a conical tube and calculation of the pressure distribution
J. Vac. Sci. Technol. A 24, 529–536 (2006)
https://doi.org/10.1116/1.2187996
Mechanical properties of Cu–Al–O thin films prepared by plasma-enhanced chemical vapor deposition
J. Vac. Sci. Technol. A 24, 537–541 (2006)
https://doi.org/10.1116/1.2191860
Detecting free radicals during the hot wire chemical vapor deposition of amorphous silicon carbide films using single-source precursors
J. Vac. Sci. Technol. A 24, 542–549 (2006)
https://doi.org/10.1116/1.2194023
Atmospheric pressure plasma analysis by modulated molecular beam mass spectrometry
J. Vac. Sci. Technol. A 24, 550–553 (2006)
https://doi.org/10.1116/1.2194938
Hard multilayer coatings containing TiN and/or ZrN: A review and recent progress in their nanoscale characterization
J. Vac. Sci. Technol. A 24, 554–583 (2006)
https://doi.org/10.1116/1.2194031
PAPERS FROM THE 12TH CANADIAN SEMICONDUCTOR TECHNOLOGY CONFERENCE
Epitaxy and Thin Films
Growth and characterization of GaAsSb metamorphic samples on an InP substrate
J. Vac. Sci. Technol. A 24, 587–590 (2006)
https://doi.org/10.1116/1.2194024
Investigation of the optical properties of InGaAs(N):(Sb) quantum wells grown by metal organic vapor phase epitaxy
J. Vac. Sci. Technol. A 24, 591–594 (2006)
https://doi.org/10.1116/1.2194025
Energetic ion bombarded multilayers
J. Vac. Sci. Technol. A 24, 595–599 (2006)
https://doi.org/10.1116/1.2194026
Compositional effect on the dielectric properties of high- titanium silicate thin films deposited by means of a cosputtering process
J. Vac. Sci. Technol. A 24, 600–605 (2006)
https://doi.org/10.1116/1.2180267
Growth of thin films by pulsed laser deposition for photonic applications
S. Neretina; R. A. Hughes; N. V. Sochinskii; M. Weber; K. G. Lynn; J. Wojcik; G. N. Pearson; J. S. Preston; P. Mascher
J. Vac. Sci. Technol. A 24, 606–611 (2006)
https://doi.org/10.1116/1.2183297
Thermochromic vanadium dioxide smart coatings grown on Kapton substrates by reactive pulsed laser deposition
J. Vac. Sci. Technol. A 24, 612–617 (2006)
https://doi.org/10.1116/1.2186661
High-performance -channel plasma-enhanced chemical vapor deposition nanocrystalline silicon thin-film transistors
J. Vac. Sci. Technol. A 24, 618–623 (2006)
https://doi.org/10.1116/1.2194027
Wide Band Gap Materials and Devices
Self-heating and the temperature dependence of the dc characteristics of GaN heterostructure field effect transistors
J. Vac. Sci. Technol. A 24, 624–628 (2006)
https://doi.org/10.1116/1.2172921
Characterization and modeling of heterostructure field effect transistors for low noise amplifiers
J. Vac. Sci. Technol. A 24, 629–633 (2006)
https://doi.org/10.1116/1.2186659
Improvement of electrical and optical properties of Ohmic metals under ultraviolet light irradiation annealing processes
J. Vac. Sci. Technol. A 24, 634–636 (2006)
https://doi.org/10.1116/1.2183192
Nitride-based ultraviolet metal-semiconductor-metal photodetectors with low-temperature GaN cap layers and contact electrodes
J. Vac. Sci. Technol. A 24, 637–640 (2006)
https://doi.org/10.1116/1.2162560
Visible-blind ultraviolet imagers consisting of AlGaN photodiode arrays
J. Vac. Sci. Technol. A 24, 641–644 (2006)
https://doi.org/10.1116/1.2192523
Organic Materials and Devices
Molecular model bulk-heterojunction solar cells
J. Vac. Sci. Technol. A 24, 645–648 (2006)
https://doi.org/10.1116/1.2183160
Charge localization in polymeric metal-oxide-semiconductor capacitors
J. Vac. Sci. Technol. A 24, 649–653 (2006)
https://doi.org/10.1116/1.2172929
Hole mobility and electroluminescence properties of a dithiophene indenofluorene
J. Vac. Sci. Technol. A 24, 654–656 (2006)
https://doi.org/10.1116/1.2180265
Photolithographically defined polythiophene organic thin-film transistors
J. Vac. Sci. Technol. A 24, 657–662 (2006)
https://doi.org/10.1116/1.2165653
Characterization of Devices and Materials
Probing the composition of Ge dots and island superlattices
J. Vac. Sci. Technol. A 24, 663–667 (2006)
https://doi.org/10.1116/1.2186658
Organic monolayers detected by single reflection attenuated total reflection infrared spectroscopy
J. Vac. Sci. Technol. A 24, 668–672 (2006)
https://doi.org/10.1116/1.2180270
Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation
J. Vac. Sci. Technol. A 24, 673–677 (2006)
https://doi.org/10.1116/1.2180268
Characteristics of remote plasma atomic layer-deposited films on and plasma-pretreated Si substrates
J. Vac. Sci. Technol. A 24, 678–681 (2006)
https://doi.org/10.1116/1.2194029
Annealing temperature effect on the performance of nonvolatile Si-oxide-nitride-oxide-silicon-type flash memory
J. Vac. Sci. Technol. A 24, 682–685 (2006)
https://doi.org/10.1116/1.2174021
Time resolved electroluminescence measurements on GaAs and GaN devices
J. Vac. Sci. Technol. A 24, 686–689 (2006)
https://doi.org/10.1116/1.2172931
Performance and potential of germanium on insulator field-effect transistors
J. Vac. Sci. Technol. A 24, 690–693 (2006)
https://doi.org/10.1116/1.2167978
Nanostructures and Nanotechnology
Microstructure investigations of indium tin oxide films cosputtered with zinc oxide at room temperature
J. Vac. Sci. Technol. A 24, 694–699 (2006)
https://doi.org/10.1116/1.2194030
Rapid thermal annealing of quantum dots with a low-temperature-grown InGaP cap layer
J. Vac. Sci. Technol. A 24, 700–703 (2006)
https://doi.org/10.1116/1.2165655
Observation of resonant tunneling through a self-assembled quantum dot layer
J. Vac. Sci. Technol. A 24, 704–707 (2006)
https://doi.org/10.1116/1.2167085
Switching-speed calculations for Schottky-barrier carbon nanotube field-effect transistors
J. Vac. Sci. Technol. A 24, 708–712 (2006)
https://doi.org/10.1116/1.2194932
Photoluminescence in the silicon-oxygen system
J. Vac. Sci. Technol. A 24, 713–717 (2006)
https://doi.org/10.1116/1.2162563
Microfabrication, Micromachining, and MEMS
Fabrication of out-of-plane micromirrors in silicon-on-insulator planar waveguides
J. Vac. Sci. Technol. A 24, 718–722 (2006)
https://doi.org/10.1116/1.2186656
Formation of nanoscale columnar structures in silicon by a maskless reactive ion etching process
J. Vac. Sci. Technol. A 24, 723–727 (2006)
https://doi.org/10.1116/1.2167974
Inductively coupled plasma etching of in and discharges
J. Vac. Sci. Technol. A 24, 728–731 (2006)
https://doi.org/10.1116/1.2180266
Direct evidence of “spring softening” nonlinearity in micromachined mechanical resonator using optical beam deflection technique
J. Vac. Sci. Technol. A 24, 732–736 (2006)
https://doi.org/10.1116/1.2194934
Microelectrode arrays for two-dimensional polar movement of microparticles in water
J. Vac. Sci. Technol. A 24, 737–741 (2006)
https://doi.org/10.1116/1.2180271
Fabricating multilevel SU-8 structures in a single photolithographic step using colored masking patterns
J. Vac. Sci. Technol. A 24, 742–746 (2006)
https://doi.org/10.1116/1.2172927
Sensors and Microelectronic Devices
In situ monitoring of protein adsorption on functionalized porous Si surfaces
J. Vac. Sci. Technol. A 24, 747–751 (2006)
https://doi.org/10.1116/1.2192525
Ultrawideband radar imaging system for biomedical applications
J. Vac. Sci. Technol. A 24, 752–757 (2006)
https://doi.org/10.1116/1.2194028
Practical approach to gradient direction sensor method in very large scale integration thermomechanical stress analysis
J. Vac. Sci. Technol. A 24, 758–762 (2006)
https://doi.org/10.1116/1.2186655
Very low-voltage operation capability of complementary metal-oxide-semiconductor ring oscillators and logic gates
J. Vac. Sci. Technol. A 24, 763–769 (2006)
https://doi.org/10.1116/1.2167973
Low noise signal-to-noise ratio enhancing readout circuit for current-mediated active pixel sensors
J. Vac. Sci. Technol. A 24, 770–773 (2006)
https://doi.org/10.1116/1.2162562
Photonic Devices and Materials
Terahertz emission properties of arsenic and oxygen ion-implanted GaAs based photoconductive pulsed sources
J. Vac. Sci. Technol. A 24, 774–777 (2006)
https://doi.org/10.1116/1.2183284
Terahertz quantum cascade lasers: Fabrication, characterization, and doping effect
J. Vac. Sci. Technol. A 24, 778–782 (2006)
https://doi.org/10.1116/1.2174020
Silicon-on-insulator waveguide photodetector with self-ion-implantation-engineered-enhanced infrared response
J. Vac. Sci. Technol. A 24, 783–786 (2006)
https://doi.org/10.1116/1.2167975
Gain spectra of GaInNAs laser diodes
J. Vac. Sci. Technol. A 24, 787–790 (2006)
https://doi.org/10.1116/1.2186662
Modified single missing air-hole defects in quantum dot membrane photonic crystal microcavities
J. Vac. Sci. Technol. A 24, 791–796 (2006)
https://doi.org/10.1116/1.2165654
Measurements of stress induced on quantum well heterostructures
J. Vac. Sci. Technol. A 24, 797–801 (2006)
https://doi.org/10.1116/1.2172925
Microelectromechanical system based variable optical attenuator by vertically bending waveguides
J. Vac. Sci. Technol. A 24, 802–806 (2006)
https://doi.org/10.1116/1.2190651
Electrical isolation of electrodes with submicron separation in a digital optical switch
J. Vac. Sci. Technol. A 24, 807–811 (2006)
https://doi.org/10.1116/1.2167976
Fabrication of lithographically defined optical coupling facets for silicon-on-insulator waveguides by inductively coupled plasma etching
K. P. Yap; B. Lamontagne; A. Delâge; S. Janz; A. Bogdanov; M. Picard; E. Post; P. Chow-Chong; M. Malloy; D. Roth; P. Marshall; K. Y. Liu; B. Syrett
J. Vac. Sci. Technol. A 24, 812–816 (2006)
https://doi.org/10.1116/1.2186657
H-induced effects in luminescent silicon nanostructures obtained from plasma enhanced chemical vapor deposition grown thin films annealed in
J. Vac. Sci. Technol. A 24, 817–820 (2006)
https://doi.org/10.1116/1.2177227
Near-unity ideality factor diodes using nanocrystalline Si/multicrystalline Si heterojunctions for photovoltaic application
J. Vac. Sci. Technol. A 24, 821–826 (2006)
https://doi.org/10.1116/1.2155532
Components for Wireless Communication
Characterization of microwave photonic band-gap structures with bandpass filter applications
J. Vac. Sci. Technol. A 24, 827–830 (2006)
https://doi.org/10.1116/1.2148412
Temperature effects in complementary metal-oxide semiconductor microwave distributed amplifiers
J. Vac. Sci. Technol. A 24, 831–834 (2006)
https://doi.org/10.1116/1.2192524
Parasitics-aware layout design of a low-power fully integrated complementary metal-oxide semiconductor power amplifier
J. Vac. Sci. Technol. A 24, 835–840 (2006)
https://doi.org/10.1116/1.2180269
On-chip inductors incorporating porous-Si and intrinsic-amorphous-Si films for rf integrated circuits
J. Vac. Sci. Technol. A 24, 841–845 (2006)
https://doi.org/10.1116/1.2162561
Display and Imaging Technology
High dynamic range pixel architecture for advanced diagnostic medical x-ray imaging applications
J. Vac. Sci. Technol. A 24, 846–849 (2006)
https://doi.org/10.1116/1.2183298
High dynamic range active pixel sensor arrays for digital x-ray imaging using
J. Vac. Sci. Technol. A 24, 850–853 (2006)
https://doi.org/10.1116/1.2192526
Single photon counter for digital x-ray mammography tomosynthesis
J. Vac. Sci. Technol. A 24, 854–859 (2006)
https://doi.org/10.1116/1.2172923
Evaluation of complementary metal-oxide semiconductor based photodetectors for low-level light detection
J. Vac. Sci. Technol. A 24, 860–865 (2006)
https://doi.org/10.1116/1.2190652
Low leakage thin film transistors deposited on glass substrates using hot-wire chemical vapor deposition
J. Vac. Sci. Technol. A 24, 866–868 (2006)
https://doi.org/10.1116/1.2183296
Nanoscale channel and small area amorphous silicon vertical thin film transistor
J. Vac. Sci. Technol. A 24, 869–874 (2006)
https://doi.org/10.1116/1.2194933
Stable circuits based on short-term stress stability of amorphous silicon thin film transistors
J. Vac. Sci. Technol. A 24, 875–878 (2006)
https://doi.org/10.1116/1.2186654
Signal and noise modeling and analysis of complementary metal-oxide semiconductor active pixel sensors
J. Vac. Sci. Technol. A 24, 879–882 (2006)
https://doi.org/10.1116/1.2167977
Temperature characterization of thin-film transistor for analog circuit design using analog hardware description language modeling
J. Vac. Sci. Technol. A 24, 883–887 (2006)
https://doi.org/10.1116/1.2167084
Numerical study on the scaling of thin film transistors
J. Vac. Sci. Technol. A 24, 888–891 (2006)
https://doi.org/10.1116/1.2194930