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Issues
May 2006
ISSN 0734-2101
EISSN 1520-8559
In this Issue
Regular Articles
Analysis of unstable species in cyclo- plasma by ion attachment mass spectrometry
J. Vac. Sci. Technol. A 24, 385–389 (2006)
https://doi.org/10.1116/1.2177228
Characterization of facing-target reactive sputtered polycrystalline films
J. Vac. Sci. Technol. A 24, 390–395 (2006)
https://doi.org/10.1116/1.2183226
Effects of Pt addition on the formation of Co–ITO granular magnetoresistance films by a two-step method
J. Vac. Sci. Technol. A 24, 408–412 (2006)
https://doi.org/10.1116/1.2186652
Electron cyclotron resonance plasma assisted pulsed laser deposition for compound host film synthesis and in situ doping
J. Vac. Sci. Technol. A 24, 413–417 (2006)
https://doi.org/10.1116/1.2186653
Deposition of hafnium oxide from Hf -butoxide and nitric oxide
J. Vac. Sci. Technol. A 24, 418–423 (2006)
https://doi.org/10.1116/1.2186660
Plasma etching of benzocyclobutene in and plasmas
J. Vac. Sci. Technol. A 24, 424–430 (2006)
https://doi.org/10.1116/1.2187994
Selective etching of high- films over Si in hydrogen-added fluorocarbon ( and ) plasmas
J. Vac. Sci. Technol. A 24, 437–443 (2006)
https://doi.org/10.1116/1.2187997
Characterization of the NiFe sputter etch process in a rf plasma
J. Vac. Sci. Technol. A 24, 444–449 (2006)
https://doi.org/10.1116/1.2187998
Computational analysis of solid-vapor equilibria for ZnS and SrS phosphor synthesis conditions
J. Vac. Sci. Technol. A 24, 450–458 (2006)
https://doi.org/10.1116/1.2190648
Electrical property improvements of yttrium oxide-based metal-insulator-metal capacitors
C. Durand; C. Vallée; C. Dubourdieu; M. Kahn; M. Derivaz; S. Blonkowski; D. Jalabert; P. Hollinger; Q. Fang; I. W. Boyd
J. Vac. Sci. Technol. A 24, 459–466 (2006)
https://doi.org/10.1116/1.2190649
Thin film reaction of transition metals with germanium
J. Vac. Sci. Technol. A 24, 474–485 (2006)
https://doi.org/10.1116/1.2191861
Attenuation of hydrogen radicals traveling under flowing gas conditions through tubes of different materials
J. Vac. Sci. Technol. A 24, 486–496 (2006)
https://doi.org/10.1116/1.2191862
Surfactant-assisted growth of CdS thin films for photovoltaic applications
J. Vac. Sci. Technol. A 24, 497–504 (2006)
https://doi.org/10.1116/1.2194929
Characteristics and diagnostics of an ultrahigh vacuum compatible laser ablation source for crossed molecular beam experiments
J. Vac. Sci. Technol. A 24, 505–511 (2006)
https://doi.org/10.1116/1.2194935
Effect of multipactor discharge on Alcator C-Mod ion cyclotron range of frequency heating
J. Vac. Sci. Technol. A 24, 512–516 (2006)
https://doi.org/10.1116/1.2194937
Arsenic doping for synthesis of nanocrystalline -type ZnO thin films
J. Vac. Sci. Technol. A 24, 517–520 (2006)
https://doi.org/10.1116/1.2194939
Low-temperature sputtering of crystalline films
J. Vac. Sci. Technol. A 24, 521–528 (2006)
https://doi.org/10.1116/1.2187993
Conductance measurement of a conical tube and calculation of the pressure distribution
J. Vac. Sci. Technol. A 24, 529–536 (2006)
https://doi.org/10.1116/1.2187996
Mechanical properties of Cu–Al–O thin films prepared by plasma-enhanced chemical vapor deposition
J. Vac. Sci. Technol. A 24, 537–541 (2006)
https://doi.org/10.1116/1.2191860
Detecting free radicals during the hot wire chemical vapor deposition of amorphous silicon carbide films using single-source precursors
J. Vac. Sci. Technol. A 24, 542–549 (2006)
https://doi.org/10.1116/1.2194023
Atmospheric pressure plasma analysis by modulated molecular beam mass spectrometry
J. Vac. Sci. Technol. A 24, 550–553 (2006)
https://doi.org/10.1116/1.2194938
Hard multilayer coatings containing TiN and/or ZrN: A review and recent progress in their nanoscale characterization
J. Vac. Sci. Technol. A 24, 554–583 (2006)
https://doi.org/10.1116/1.2194031
PAPERS FROM THE 12TH CANADIAN SEMICONDUCTOR TECHNOLOGY CONFERENCE
Epitaxy and Thin Films
Growth and characterization of GaAsSb metamorphic samples on an InP substrate
J. Vac. Sci. Technol. A 24, 587–590 (2006)
https://doi.org/10.1116/1.2194024
Investigation of the optical properties of InGaAs(N):(Sb) quantum wells grown by metal organic vapor phase epitaxy
J. Vac. Sci. Technol. A 24, 591–594 (2006)
https://doi.org/10.1116/1.2194025
Energetic ion bombarded multilayers
J. Vac. Sci. Technol. A 24, 595–599 (2006)
https://doi.org/10.1116/1.2194026
Compositional effect on the dielectric properties of high- titanium silicate thin films deposited by means of a cosputtering process
J. Vac. Sci. Technol. A 24, 600–605 (2006)
https://doi.org/10.1116/1.2180267
Growth of thin films by pulsed laser deposition for photonic applications
S. Neretina; R. A. Hughes; N. V. Sochinskii; M. Weber; K. G. Lynn; J. Wojcik; G. N. Pearson; J. S. Preston; P. Mascher
J. Vac. Sci. Technol. A 24, 606–611 (2006)
https://doi.org/10.1116/1.2183297
Thermochromic vanadium dioxide smart coatings grown on Kapton substrates by reactive pulsed laser deposition
J. Vac. Sci. Technol. A 24, 612–617 (2006)
https://doi.org/10.1116/1.2186661
High-performance -channel plasma-enhanced chemical vapor deposition nanocrystalline silicon thin-film transistors
J. Vac. Sci. Technol. A 24, 618–623 (2006)
https://doi.org/10.1116/1.2194027
Wide Band Gap Materials and Devices
Self-heating and the temperature dependence of the dc characteristics of GaN heterostructure field effect transistors
J. Vac. Sci. Technol. A 24, 624–628 (2006)
https://doi.org/10.1116/1.2172921
Characterization and modeling of heterostructure field effect transistors for low noise amplifiers
J. Vac. Sci. Technol. A 24, 629–633 (2006)
https://doi.org/10.1116/1.2186659
Improvement of electrical and optical properties of Ohmic metals under ultraviolet light irradiation annealing processes
J. Vac. Sci. Technol. A 24, 634–636 (2006)
https://doi.org/10.1116/1.2183192
Nitride-based ultraviolet metal-semiconductor-metal photodetectors with low-temperature GaN cap layers and contact electrodes
J. Vac. Sci. Technol. A 24, 637–640 (2006)
https://doi.org/10.1116/1.2162560
Visible-blind ultraviolet imagers consisting of AlGaN photodiode arrays
J. Vac. Sci. Technol. A 24, 641–644 (2006)
https://doi.org/10.1116/1.2192523
Organic Materials and Devices
Molecular model bulk-heterojunction solar cells
J. Vac. Sci. Technol. A 24, 645–648 (2006)
https://doi.org/10.1116/1.2183160
Charge localization in polymeric metal-oxide-semiconductor capacitors
J. Vac. Sci. Technol. A 24, 649–653 (2006)
https://doi.org/10.1116/1.2172929
Hole mobility and electroluminescence properties of a dithiophene indenofluorene
J. Vac. Sci. Technol. A 24, 654–656 (2006)
https://doi.org/10.1116/1.2180265
Photolithographically defined polythiophene organic thin-film transistors
J. Vac. Sci. Technol. A 24, 657–662 (2006)
https://doi.org/10.1116/1.2165653
Characterization of Devices and Materials
Probing the composition of Ge dots and island superlattices
J. Vac. Sci. Technol. A 24, 663–667 (2006)
https://doi.org/10.1116/1.2186658
Organic monolayers detected by single reflection attenuated total reflection infrared spectroscopy
J. Vac. Sci. Technol. A 24, 668–672 (2006)
https://doi.org/10.1116/1.2180270
Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation
J. Vac. Sci. Technol. A 24, 673–677 (2006)
https://doi.org/10.1116/1.2180268
Characteristics of remote plasma atomic layer-deposited films on and plasma-pretreated Si substrates
J. Vac. Sci. Technol. A 24, 678–681 (2006)
https://doi.org/10.1116/1.2194029
Annealing temperature effect on the performance of nonvolatile Si-oxide-nitride-oxide-silicon-type flash memory
J. Vac. Sci. Technol. A 24, 682–685 (2006)
https://doi.org/10.1116/1.2174021
Time resolved electroluminescence measurements on GaAs and GaN devices
J. Vac. Sci. Technol. A 24, 686–689 (2006)
https://doi.org/10.1116/1.2172931
Performance and potential of germanium on insulator field-effect transistors
J. Vac. Sci. Technol. A 24, 690–693 (2006)
https://doi.org/10.1116/1.2167978
Nanostructures and Nanotechnology
Microstructure investigations of indium tin oxide films cosputtered with zinc oxide at room temperature
J. Vac. Sci. Technol. A 24, 694–699 (2006)
https://doi.org/10.1116/1.2194030
Rapid thermal annealing of quantum dots with a low-temperature-grown InGaP cap layer
J. Vac. Sci. Technol. A 24, 700–703 (2006)
https://doi.org/10.1116/1.2165655
Observation of resonant tunneling through a self-assembled quantum dot layer
J. Vac. Sci. Technol. A 24, 704–707 (2006)
https://doi.org/10.1116/1.2167085
Switching-speed calculations for Schottky-barrier carbon nanotube field-effect transistors
J. Vac. Sci. Technol. A 24, 708–712 (2006)
https://doi.org/10.1116/1.2194932
Photoluminescence in the silicon-oxygen system
J. Vac. Sci. Technol. A 24, 713–717 (2006)
https://doi.org/10.1116/1.2162563
Microfabrication, Micromachining, and MEMS
Fabrication of out-of-plane micromirrors in silicon-on-insulator planar waveguides
J. Vac. Sci. Technol. A 24, 718–722 (2006)
https://doi.org/10.1116/1.2186656
Formation of nanoscale columnar structures in silicon by a maskless reactive ion etching process
J. Vac. Sci. Technol. A 24, 723–727 (2006)
https://doi.org/10.1116/1.2167974
Inductively coupled plasma etching of in and discharges
J. Vac. Sci. Technol. A 24, 728–731 (2006)
https://doi.org/10.1116/1.2180266
Direct evidence of “spring softening” nonlinearity in micromachined mechanical resonator using optical beam deflection technique
J. Vac. Sci. Technol. A 24, 732–736 (2006)
https://doi.org/10.1116/1.2194934
Microelectrode arrays for two-dimensional polar movement of microparticles in water
J. Vac. Sci. Technol. A 24, 737–741 (2006)
https://doi.org/10.1116/1.2180271
Fabricating multilevel SU-8 structures in a single photolithographic step using colored masking patterns
J. Vac. Sci. Technol. A 24, 742–746 (2006)
https://doi.org/10.1116/1.2172927
Sensors and Microelectronic Devices
In situ monitoring of protein adsorption on functionalized porous Si surfaces
J. Vac. Sci. Technol. A 24, 747–751 (2006)
https://doi.org/10.1116/1.2192525
Ultrawideband radar imaging system for biomedical applications
J. Vac. Sci. Technol. A 24, 752–757 (2006)
https://doi.org/10.1116/1.2194028
Practical approach to gradient direction sensor method in very large scale integration thermomechanical stress analysis
J. Vac. Sci. Technol. A 24, 758–762 (2006)
https://doi.org/10.1116/1.2186655
Very low-voltage operation capability of complementary metal-oxide-semiconductor ring oscillators and logic gates
J. Vac. Sci. Technol. A 24, 763–769 (2006)
https://doi.org/10.1116/1.2167973
Low noise signal-to-noise ratio enhancing readout circuit for current-mediated active pixel sensors
J. Vac. Sci. Technol. A 24, 770–773 (2006)
https://doi.org/10.1116/1.2162562
Photonic Devices and Materials
Terahertz emission properties of arsenic and oxygen ion-implanted GaAs based photoconductive pulsed sources
J. Vac. Sci. Technol. A 24, 774–777 (2006)
https://doi.org/10.1116/1.2183284
Terahertz quantum cascade lasers: Fabrication, characterization, and doping effect
J. Vac. Sci. Technol. A 24, 778–782 (2006)
https://doi.org/10.1116/1.2174020
Silicon-on-insulator waveguide photodetector with self-ion-implantation-engineered-enhanced infrared response
J. Vac. Sci. Technol. A 24, 783–786 (2006)
https://doi.org/10.1116/1.2167975
Gain spectra of GaInNAs laser diodes
J. Vac. Sci. Technol. A 24, 787–790 (2006)
https://doi.org/10.1116/1.2186662
Modified single missing air-hole defects in quantum dot membrane photonic crystal microcavities
J. Vac. Sci. Technol. A 24, 791–796 (2006)
https://doi.org/10.1116/1.2165654
Measurements of stress induced on quantum well heterostructures
J. Vac. Sci. Technol. A 24, 797–801 (2006)
https://doi.org/10.1116/1.2172925
Microelectromechanical system based variable optical attenuator by vertically bending waveguides
J. Vac. Sci. Technol. A 24, 802–806 (2006)
https://doi.org/10.1116/1.2190651
Electrical isolation of electrodes with submicron separation in a digital optical switch
J. Vac. Sci. Technol. A 24, 807–811 (2006)
https://doi.org/10.1116/1.2167976
Fabrication of lithographically defined optical coupling facets for silicon-on-insulator waveguides by inductively coupled plasma etching
K. P. Yap; B. Lamontagne; A. Delâge; S. Janz; A. Bogdanov; M. Picard; E. Post; P. Chow-Chong; M. Malloy; D. Roth; P. Marshall; K. Y. Liu; B. Syrett
J. Vac. Sci. Technol. A 24, 812–816 (2006)
https://doi.org/10.1116/1.2186657
H-induced effects in luminescent silicon nanostructures obtained from plasma enhanced chemical vapor deposition grown thin films annealed in
J. Vac. Sci. Technol. A 24, 817–820 (2006)
https://doi.org/10.1116/1.2177227
Near-unity ideality factor diodes using nanocrystalline Si/multicrystalline Si heterojunctions for photovoltaic application
J. Vac. Sci. Technol. A 24, 821–826 (2006)
https://doi.org/10.1116/1.2155532
Components for Wireless Communication
Characterization of microwave photonic band-gap structures with bandpass filter applications
J. Vac. Sci. Technol. A 24, 827–830 (2006)
https://doi.org/10.1116/1.2148412
Temperature effects in complementary metal-oxide semiconductor microwave distributed amplifiers
J. Vac. Sci. Technol. A 24, 831–834 (2006)
https://doi.org/10.1116/1.2192524
Parasitics-aware layout design of a low-power fully integrated complementary metal-oxide semiconductor power amplifier
J. Vac. Sci. Technol. A 24, 835–840 (2006)
https://doi.org/10.1116/1.2180269
On-chip inductors incorporating porous-Si and intrinsic-amorphous-Si films for rf integrated circuits
J. Vac. Sci. Technol. A 24, 841–845 (2006)
https://doi.org/10.1116/1.2162561
Display and Imaging Technology
High dynamic range pixel architecture for advanced diagnostic medical x-ray imaging applications
J. Vac. Sci. Technol. A 24, 846–849 (2006)
https://doi.org/10.1116/1.2183298
High dynamic range active pixel sensor arrays for digital x-ray imaging using
J. Vac. Sci. Technol. A 24, 850–853 (2006)
https://doi.org/10.1116/1.2192526
Single photon counter for digital x-ray mammography tomosynthesis
J. Vac. Sci. Technol. A 24, 854–859 (2006)
https://doi.org/10.1116/1.2172923
Evaluation of complementary metal-oxide semiconductor based photodetectors for low-level light detection
J. Vac. Sci. Technol. A 24, 860–865 (2006)
https://doi.org/10.1116/1.2190652
Low leakage thin film transistors deposited on glass substrates using hot-wire chemical vapor deposition
J. Vac. Sci. Technol. A 24, 866–868 (2006)
https://doi.org/10.1116/1.2183296
Nanoscale channel and small area amorphous silicon vertical thin film transistor
J. Vac. Sci. Technol. A 24, 869–874 (2006)
https://doi.org/10.1116/1.2194933
Stable circuits based on short-term stress stability of amorphous silicon thin film transistors
J. Vac. Sci. Technol. A 24, 875–878 (2006)
https://doi.org/10.1116/1.2186654
Signal and noise modeling and analysis of complementary metal-oxide semiconductor active pixel sensors
J. Vac. Sci. Technol. A 24, 879–882 (2006)
https://doi.org/10.1116/1.2167977
Temperature characterization of thin-film transistor for analog circuit design using analog hardware description language modeling
J. Vac. Sci. Technol. A 24, 883–887 (2006)
https://doi.org/10.1116/1.2167084
Numerical study on the scaling of thin film transistors
J. Vac. Sci. Technol. A 24, 888–891 (2006)
https://doi.org/10.1116/1.2194930
Surface passivation approaches for silicon, germanium, and III–V semiconductors
Roel J. Theeuwes, Wilhelmus M. M. Kessels, et al.
Growth and optical properties of NiO thin films deposited by pulsed dc reactive magnetron sputtering
Faezeh A. F. Lahiji, Samiran Bairagi, et al.
Novel high-efficiency plasma nitriding process utilizing a high power impulse magnetron sputtering discharge
A. P. Ehiasarian, P. Eh. Hovsepian