The growth of thin Ni films on the W(110) surface was studied to look for any adsorbate‐induced structural modifications of the W substrate which might play a role in the modified magnetic and catalytic properties of the Ni film, and because these two materials are excellent candidates for forming metallic superlattices with atomically abrupt interfaces. We performed experiments using high‐energy ion backscattering and channeling together with x‐ray photoemission spectroscopy and low energy electron diffraction. The initial growth of the Ni film on W(110) at room temperature appears to be in a double‐layer mode, which differs significantly from the growth modes reported previously. The double layer grows in a coincidence structure on the W substrate. The film assumes the bulk Ni structure beginning at a coverage of ∼5 ML based on the observation of Ni–Ni shadowing beginning at 7.7 ML for a normally incident ion beam. We observed that the W(110) substrate structure is not altered by the adsorption of Ni atoms, which supports a model for the interface having an atomically abrupt transition at room temperature.
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May 1991
The 37th Annual Symposium of the American Vacuum Society
8−12 Oct 1990
Toronto, Canada
Research Article|
May 01 1991
Growth of thin Ni films on the W(110) surface Available to Purchase
Xu Mingde;
Xu Mingde
Physics Department, Montana State University, Bozeman, Montana 59717
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R. J. Smith
R. J. Smith
Physics Department, Montana State University, Bozeman, Montana 59717
Search for other works by this author on:
Xu Mingde
Physics Department, Montana State University, Bozeman, Montana 59717
R. J. Smith
Physics Department, Montana State University, Bozeman, Montana 59717
J. Vac. Sci. Technol. A 9, 1828–1832 (1991)
Article history
Received:
September 18 1990
Accepted:
October 08 1990
Citation
Xu Mingde, R. J. Smith; Growth of thin Ni films on the W(110) surface. J. Vac. Sci. Technol. A 1 May 1991; 9 (3): 1828–1832. https://doi.org/10.1116/1.577470
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