The available literature concerning metal contacts on Hg1−xCdxTe is reviewed in order to obtain a systematic overview. The theory and models available predict that, for metal in intimate contact with Hg1−xCdxTe , ‘‘ohmic’’ contact will be easily formed on n‐type and rectifying on p‐type Hg1−xCdxTe. This is in agreement with experimental results. There is evidence that metal atoms can move into the Hg1−xCdxTe, doping it and thus changing the electrical properties of the contact. Photoemission spectroscopy shows that Hg1−xCdxTe can be strongly disrupted by the deposition of the metal and correlation is found between heats of formation and heats of solution and the extent of this disruption. However, even for cases such as Ag where these bulk thermodynamic parameters are small, evidence is found for disruption of the lattice and movement of the metal into the Hg1−xCdxTe, producing doping. Formation of diffusion barriers and cooling to low temperature (100 K) have been explored as ways to limit this disruption.
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March 1990
Research Article|
March 01 1990
Metal contacts on Hg1−xCdxTe
W. E. Spicer
W. E. Spicer
Stanford Electronics Laboratories, Stanford University, Stanford, California 94305
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J. Vac. Sci. Technol. A 8, 1174–1177 (1990)
Article history
Received:
October 04 1989
Accepted:
November 03 1989
Citation
W. E. Spicer; Metal contacts on Hg1−xCdxTe. J. Vac. Sci. Technol. A 1 March 1990; 8 (2): 1174–1177. https://doi.org/10.1116/1.576939
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