Temperature‐dependent photoemission study of the HgTe–CdTe valence‐band discontinuity Available to Purchase

We have studied the temperature dependence of the CdTe–HgTe valence‐band discontinuity with x‐ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). The samples have been cooled at 110 K for the XPS experiments and at 50 K for UPS. At room temperature, we measure a valence‐band discontinuity of 0.35±0.05 eV, in agreement with previous photoemission results. The valence‐band discontinuity is found to change by only a few millivolts between room temperature and 50 K, with an estimated uncertainty of ∼60 meV.