Characterization of fully lattice‐matched multilayer ZnHgCdTe structures grown by Te‐rich liquid phase epitaxy

We report on the growth and characterization of fully lattice‐matched multilayer ZnHgCdTe epilayers grown by Te‐rich liquid phase epitaxy on lattice‐matched CdTeSe substrates. Layers are characterized using Bond diffractometer x ray for lattice constant, IR transmission for composition, and energy dispersive x‐ray and secondary ion mass spectroscopy for elemental depth profiling. Lattice parameters are reported for CdTeSe as a function of the CdSe mol % and for ZnHgCdTe as a function of the wt. % of Zn added to x=0.31 HgCdTe growth material. The segregation coefficient of Zn is also reported.