We report on the growth and characterization of fully lattice‐matched multilayer ZnHgCdTe epilayers grown by Te‐rich liquid phase epitaxy on lattice‐matched CdTeSe substrates. Layers are characterized using Bond diffractometer x ray for lattice constant, IR transmission for composition, and energy dispersive x‐ray and secondary ion mass spectroscopy for elemental depth profiling. Lattice parameters are reported for CdTeSe as a function of the CdSe mol % and for ZnHgCdTe as a function of the wt. % of Zn added to x=0.31 HgCdTe growth material. The segregation coefficient of Zn is also reported.

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