Initial studies of plutonium oxycarbide surface films on metal have been reported to slow the rate of metal corrosion in dry conditions. Exploiting this property presents a unique opportunity in the safe storage of this radioactive and toxic material; however, more fundamental work is required. The plutonium, carbon, and oxygen ratio of these surface films is investigated here using x-ray photoelectron spectroscopy (XPS) and is shown to be nonstoichiometric. The origin of the carbon in the formation of surface plutonium oxycarbide films is probed using a combination of XPS, x-ray diffraction, and secondary ion mass spectrometry and is shown to occur from the metal interstitial impurity. The kinetics of plutonium oxycarbide film growth for a specific bulk carbon concentration have been determined.
Skip Nav Destination
Article navigation
March 2025
Research Article|
January 23 2025
Kinetics and mechanism of surface plutonium oxycarbide formation
Special Collection:
Papers from the AVS 70th International Symposium
Paul Roussel
Paul Roussel
a)
(Conceptualization, Formal analysis, Investigation, Methodology, Writing – original draft)
AWE plc
, Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom
Search for other works by this author on:
a)
Electronic mail: [email protected]
J. Vac. Sci. Technol. A 43, 023202 (2025)
Article history
Received:
November 25 2024
Accepted:
January 07 2025
Citation
Paul Roussel; Kinetics and mechanism of surface plutonium oxycarbide formation. J. Vac. Sci. Technol. A 1 March 2025; 43 (2): 023202. https://doi.org/10.1116/6.0004235
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
88
Views
Citing articles via
Low-resistivity molybdenum obtained by atomic layer deposition
Kees van der Zouw, Bernhard Y. van der Wel, et al.
Low-temperature etching of silicon oxide and silicon nitride with hydrogen fluoride
Thorsten Lill, Mingmei Wang, et al.
Related Content
Photoemission study of plutonium oxycarbide
J. Vac. Sci. Technol. A (January 2024)
Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides
J. Vac. Sci. Technol. A (March 2018)
Synthesis and characterization of inorganic silicon oxycarbide glass thin films by reactive rf-magnetron sputtering
J. Vac. Sci. Technol. A (January 2007)
Silicon oxycarbide formation on SiC surfaces and at the SiC/ SiO 2 interface
J. Vac. Sci. Technol. A (May 1997)
Photoluminescence in erbium doped amorphous silicon oxycarbide thin films
Appl. Phys. Lett. (August 2005)