Among the many parts constituting a scanning tunneling microscope, the metallic tip is the component that directly interacts with the specimen and plays a critical role in visualizing the physical quantity of interest. While tip materials such as W and Pt–Ir are commonly used for topographic imaging and their preparation is well-documented, the preparation of plasmonic materials such as Ag for tip-enhanced Raman spectroscopy is relatively less standardized. Here, we present several in situ Ag tip preparation and validation techniques for the microscopist to use depending on their intended application, including atomic resolution imaging, scanning tunneling spectroscopy (STM), and tip-enhanced Raman spectro-microscopy in ultrahigh vacuum. Besides optical applications, these methods are not limited to Ag but also applicable to other STM tip materials.
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In situ plasmonic tip preparation and validation techniques for scanning tunneling microscopy
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September 2023
Research Article|
July 31 2023
In situ plasmonic tip preparation and validation techniques for scanning tunneling microscopy
Benjamen N. Taber
;
Benjamen N. Taber
a)
(Conceptualization, Writing – original draft)
1
Qorvo, Inc.
, 63140 Britta St, Bend, Oregon 97701
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Matthew L. Neill
;
Matthew L. Neill
(Visualization)
2
Department of Physics, University of Nevada
, Reno, Nevada 89557
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Trevor N. Thom
;
Trevor N. Thom
(Visualization)
2
Department of Physics, University of Nevada
, Reno, Nevada 89557
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Octavia D. Clapp
;
Octavia D. Clapp
(Visualization)
2
Department of Physics, University of Nevada
, Reno, Nevada 89557
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Vartkess Ara Apkarian
;
Vartkess Ara Apkarian
(Funding acquisition)
3
Department of Chemistry, University of California
, Irvine, California 92697
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Joonhee Lee
Joonhee Lee
a)
(Funding acquisition, Writing – review & editing)
2
Department of Physics, University of Nevada
, Reno, Nevada 89557
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J. Vac. Sci. Technol. A 41, 053205 (2023)
Article history
Received:
May 03 2023
Accepted:
July 11 2023
Citation
Benjamen N. Taber, Matthew L. Neill, Trevor N. Thom, Octavia D. Clapp, Vartkess Ara Apkarian, Joonhee Lee; In situ plasmonic tip preparation and validation techniques for scanning tunneling microscopy. J. Vac. Sci. Technol. A 1 September 2023; 41 (5): 053205. https://doi.org/10.1116/6.0002807
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