The presence of a reconstruction of a higher order than the nominal (2×1) superstructure has been observed for the (100) surface of Ge/Si alloys at room temperature. High‐resolution electron energy loss spectroscopy (HREELS) has been used to study electronic excitation on these surfaces. Transitions were observed both between the valence band and the unoccupied surface state and between the occupied surface state and the conduction band at a variety of points in the two‐dimensional Brillouin zone. Heating produced segregation of the Ge to the surface leaving a Si rich subregion. Therefore, the bulk transitions strongly resemble those from pure Si. Rather surprisingly, transitions between bulk and surface states also resemble those from pure Si and may be taken as a good indication that the Ge atoms have the same electronic and geometric structure as do the Si atoms on the pure substrate. Supportive evidence for a metallic surface state at the Γ point associated with the loss of long‐range order is also presented.
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January 1986
Research Article|
January 01 1986
Electronic excitations on GexSi1−x(100)(2×1)
H. H. Farrell;
H. H. Farrell
Bell Communications Research, Murray Hill, New Jersey 07974
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J. Q. Broughton;
J. Q. Broughton
Department of Materials Science, State University of New York, Stony Brook, New York 11794
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J. A. Schaefer;
J. A. Schaefer
Center for Research in Surface Science, Department of Physics, Montana State University, Bozeman, Montana 59717
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J. C. Bean
J. C. Bean
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
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J. Vac. Sci. Technol. A 4, 123–126 (1986)
Article history
Received:
May 28 1985
Accepted:
September 01 1985
Citation
H. H. Farrell, J. Q. Broughton, J. A. Schaefer, J. C. Bean; Electronic excitations on GexSi1−x(100)(2×1). J. Vac. Sci. Technol. A 1 January 1986; 4 (1): 123–126. https://doi.org/10.1116/1.573483
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