X-ray photoelectron spectroscopy (XPS) has become a standard tool for the study of catalytic materials over the last two decades, and with the increasing popularity of turnkey XPS systems, the analysis of these types of materials is open to an even wider audience. However, increased accessibility leads to an increase in the number of new or inexperienced practitioners, leading to erroneous data collection and interpretation. Over many years of working on a wide range of catalytic materials, the authors have developed procedures for the planning and execution of XPS analysis and subsequent data analysis, and this guide has been produced to help users of all levels of expertise to question their approach toward analysis and get the most out of the technique and avoiding some common pitfalls.
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Research Article|
March 18 2020
Practical guide for x-ray photoelectron spectroscopy: Applications to the study of catalysts
Special Collection:
Special Topic Collection: Reproducibility Challenges and Solutions
Philip R. Davies
;
Philip R. Davies
1
Cardiff Catalysis Institute, School of Chemistry, Cardiff University
, Park Place, Cardiff CF10 3AT, United Kingdom
2
HarwellXPS—EPSRC National Facility for X-Ray Photoelectron Spectroscopy, Research Complex at Harwell (RCaH)
, Didcot OX11 0FE, United Kingdom
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David J. Morgan
David J. Morgan
a)
1
Cardiff Catalysis Institute, School of Chemistry, Cardiff University
, Park Place, Cardiff CF10 3AT, United Kingdom
2
HarwellXPS—EPSRC National Facility for X-Ray Photoelectron Spectroscopy, Research Complex at Harwell (RCaH)
, Didcot OX11 0FE, United Kingdom
Search for other works by this author on:
a)
Electronic mail: [email protected]
Note: This paper is part of the Special Topic Collection on Reproducibility Challenges and Solutions.
J. Vac. Sci. Technol. A 38, 033204 (2020)
Article history
Received:
November 30 2019
Accepted:
March 02 2020
Citation
Philip R. Davies, David J. Morgan; Practical guide for x-ray photoelectron spectroscopy: Applications to the study of catalysts. J. Vac. Sci. Technol. A 1 May 2020; 38 (3): 033204. https://doi.org/10.1116/1.5140747
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