Determination of molecular temperatures within low-temperature plasmas is critical to understanding the reactions that drive the chemistry of these systems and the mechanisms involved in plasma-surface interactions. Optical emission spectroscopy was employed to investigate gas-phase processes in H2 and CH4 inductively coupled plasma systems. Specifically, rotational temperatures (TR) have been determined for H2 and CH under a variety of plasma parameter conditions. In 100% H2 plasmas, TR(H2) values are ∼500–550 K, whereas generally higher TR(H2) values (∼500–700 K) are reported for 100% CH4 plasmas. Disparities in the rotational temperature values and trends of H2 between H2 and CH4 plasmas highlight the differences in H2 excitation pathways occurring in each of these two plasma systems as TR can be affected by the mechanism for molecule formation and excitation within plasma systems. As such, mixed gas CH4/H2 plasma systems were also explored to gain further insight into these mechanistic details. These results emphasize the connections between fundamental plasma properties and plasma parameters, a key component to understanding and optimizing plasma conditions for the future development of a host of plasma technologies.
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April 21 2020
Gas-phase diagnostic studies of H2 and CH4 inductively coupled plasmas
Special Collection:
Special Topic Collection Commemorating the Career of John Coburn
Tara L. Van Surksum
;
Tara L. Van Surksum
Department of Chemistry, Colorado State University
, Fort Collins, Colorado 80523-1872
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Ellen R. Fisher
Ellen R. Fisher
a)
Department of Chemistry, Colorado State University
, Fort Collins, Colorado 80523-1872
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a)
Electronic mail: ellen.fisher@colostate.edu
Note: This paper is part of the Special Topic Collection Commemorating the Career of John Coburn.
J. Vac. Sci. Technol. A 38, 033010 (2020)
Article history
Received:
February 07 2020
Accepted:
April 08 2020
Citation
Tara L. Van Surksum, Ellen R. Fisher; Gas-phase diagnostic studies of H2 and CH4 inductively coupled plasmas. J. Vac. Sci. Technol. A 1 May 2020; 38 (3): 033010. https://doi.org/10.1116/6.0000090
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