In this paper, the emerging role of ionic species in plasma assisted chemical deposition processes is discussed in detail for commemorating the Career of John Coburn, who studied the role of ionic species in plasma etching processes forty years ago. It is shown that, in both plasma enhanced chemical vapor deposition and plasma enhanced atomic layer deposition processes, plasma ions can play a major role in tuning a wide range of physical properties of thin films. In both processes, the possibility of extracting plasma ions with a tunable incident kinetic energy driven on the substrate surface is shown to provide a valuable additional degree of freedom in plasma processing. While a too large incident kinetic energy of plasma ions may have damaging effects linked to surface sputtering and atomic peening, a relatively low energy ion bombardment ensures a substantial improvement of thin film purity and the effective tuning of their microstructural properties. This phenomenon is attributed to the synergetic effect boosting momentum transfer and chemical reactivity among radicals and ionic plasma species, which, in turn, modulates plasma-surface interactions. Taking advantage of these tunable physical properties opens up the way to a large array of pathways for selective deposition processes in both 2D and 3D nanoscale microstructures.
Skip Nav Destination
Article navigation
Research Article|
April 17 2020
Plasma deposition—Impact of ions in plasma enhanced chemical vapor deposition, plasma enhanced atomic layer deposition, and applications to area selective deposition
Special Collection:
Special Topic Collection Commemorating the Career of John Coburn
Christophe Vallée
;
Christophe Vallée
a)
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
2
University of Tsukuba
, Tsukuba 305-8573, Japan
Search for other works by this author on:
Marceline Bonvalot;
Marceline Bonvalot
a)
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Samia Belahcen;
Samia Belahcen
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Taguhi Yeghoyan
;
Taguhi Yeghoyan
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Moustapha Jaffal;
Moustapha Jaffal
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Rémi Vallat;
Rémi Vallat
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Ahmad Chaker;
Ahmad Chaker
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
3
School of Chemistry and Photon Science Institute, The University of Manchester
, Oxford Road, Manchester M13 9PL, United Kingdom
Search for other works by this author on:
Gautier Lefèvre;
Gautier Lefèvre
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Sylvain David;
Sylvain David
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Ahmad Bsiesy;
Ahmad Bsiesy
1
Univ. Grenoble Alpes, LTM
, F-38000 Grenoble, France
Search for other works by this author on:
Nicolas Possémé
;
Nicolas Possémé
4
CEA, LETI
, Minatec Campus, F-38054 Grenoble, France
Search for other works by this author on:
Rémy Gassilloud
;
Rémy Gassilloud
4
CEA, LETI
, Minatec Campus, F-38054 Grenoble, France
Search for other works by this author on:
Agnès Granier
Agnès Granier
5
Institut des Matériaux Jean Rouxel (IMN)
, UMR CNRS 6502, Nantes, France
Search for other works by this author on:
Note: This paper is part of the Special Topic Collection Commemorating the Career of John Coburn.
J. Vac. Sci. Technol. A 38, 033007 (2020)
Article history
Received:
December 02 2019
Accepted:
April 01 2020
Citation
Christophe Vallée, Marceline Bonvalot, Samia Belahcen, Taguhi Yeghoyan, Moustapha Jaffal, Rémi Vallat, Ahmad Chaker, Gautier Lefèvre, Sylvain David, Ahmad Bsiesy, Nicolas Possémé, Rémy Gassilloud, Agnès Granier; Plasma deposition—Impact of ions in plasma enhanced chemical vapor deposition, plasma enhanced atomic layer deposition, and applications to area selective deposition. J. Vac. Sci. Technol. A 1 May 2020; 38 (3): 033007. https://doi.org/10.1116/1.5140841
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Surface passivation approaches for silicon, germanium, and III–V semiconductors
Roel J. Theeuwes, Wilhelmus M. M. Kessels, et al.
Low-temperature etching of silicon oxide and silicon nitride with hydrogen fluoride
Thorsten Lill, Mingmei Wang, et al.
Low-resistivity molybdenum obtained by atomic layer deposition
Kees van der Zouw, Bernhard Y. van der Wel, et al.
Related Content
Low-energy high-flux ion bombardment-induced interfacial mixing during Al2O3 plasma-enhanced atomic layer deposition
J. Vac. Sci. Technol. A (August 2020)
Control of ion-flux and ion-energy in direct inductively coupled plasma reactor for interfacial-mixing plasma-enhanced atomic layer deposition
J. Vac. Sci. Technol. A (April 2020)
Atomic layer etching of metals with anisotropy, specificity, and selectivity
J. Vac. Sci. Technol. A (June 2020)
Review Article: Unraveling synergistic effects in plasma-surface processes by means of beam experiments
J. Vac. Sci. Technol. A (May 2017)
Plasma etching of wide bandgap and ultrawide bandgap semiconductors
J. Vac. Sci. Technol. A (January 2020)