Molecular layer deposition (MLD) is a thin film technique to make a pure organic coating or hybrid organic–inorganic film, sequentially dosing organic–organic or organic–inorganic precursors, respectively. In this study, hybrid organic–inorganic alucone films were fabricated via MLD using 4-mercaptophenol and trimethylaluminum as organic and metal precursors, respectively, over the deposition temperature range of 100–200 °C. The fabricated film was very stable without degradation when exposed to the atmosphere, and the characteristic change was confirmed through annealing under vacuum at 300–750 °C. After annealing, the thickness of the alucone films decreased and the bonding of the carbon ring changed, as revealed by the spectroscopic ellipsometer, Fourier-transform infrared, Raman, x-ray diffraction, and x-ray photoelectron spectroscopy results. The annealed alucone films showed thermal polymerization, and their carbon ring structures transformed into graphitic carbon flakes. The alucone film annealed at 750 °C showed an electrical resistivity of 0.55 Ω cm. Annealed MLD alucone films, which are hybrid materials, are potential candidates for applications in electronic, capacitor, and thermoelectric devices.
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March 2020
Research Article|
January 28 2020
Air-stable alucone thin films deposited by molecular layer deposition using a 4-mercaptophenol organic reactant Available to Purchase
Special Collection:
Special Topic Collection on Atomic Layer Deposition (ALD)
GeonHo Baek;
GeonHo Baek
a)
1
Division of Nanoscale Semiconductor Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
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Seunghwan Lee;
Seunghwan Lee
a)
2
Division of Materials Science and Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
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Jung-Hoon Lee
;
Jung-Hoon Lee
2
Division of Materials Science and Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
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Jin-Seong Park
Jin-Seong Park
b)
1
Division of Nanoscale Semiconductor Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
2
Division of Materials Science and Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
Search for other works by this author on:
GeonHo Baek
1,a)
Seunghwan Lee
2,a)
Jung-Hoon Lee
2
Jin-Seong Park
1,2,b)
1
Division of Nanoscale Semiconductor Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
2
Division of Materials Science and Engineering, Hanyang University
, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea
a)
Contributions: These authors contributed equally to this paper.
b)
Electronic mail: [email protected]
Note: This paper is part of the 2020 Special Topic Collection on Atomic Layer Deposition (ALD).
J. Vac. Sci. Technol. A 38, 022411 (2020)
Article history
Received:
October 29 2019
Accepted:
January 06 2020
Citation
GeonHo Baek, Seunghwan Lee, Jung-Hoon Lee, Jin-Seong Park; Air-stable alucone thin films deposited by molecular layer deposition using a 4-mercaptophenol organic reactant. J. Vac. Sci. Technol. A 1 March 2020; 38 (2): 022411. https://doi.org/10.1116/1.5134055
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