Pseudobinary V0.5Mo0.5Nx(111) alloys with the B1-NaCl crystal structure are grown on Al2O3(0001) substrates in an ultra-high-vacuum system by reactive magnetron sputter deposition in mixed Ar/N2 atmospheres at temperatures Ts between 100 and 900 °C. Nitrogen-to-metal, N/(V + Mo), fractions x vary monotonically from 0.9 ± 0.1 with Ts = 100 °C to 0.4 ± 0.1 at Ts = 900 °C. Nitrogen loss at higher growth temperatures leads to a corresponding decrease in the relaxed lattice parameter ao from 4.21 ± 0.01 Å at Ts = 300 °C to 4.125 ± 0.005 Å with Ts = 900 °C. Scanning electron micrographs of cube-corner nanoindents extending into the substrate show that the films are relatively ductile, exhibiting material pile-up (plastic flow) around the indent edges. Nanoindentation hardnesses H and elastic moduli E, obtained using a calibrated Berkovich tip, of V0.5Mo0.5Nx(111) layers increase with increasing Ts (decreasing x) from 15 ± 1 and 198 ± 5 GPa at 100 °C to 23 ± 2 and 381 ± 11 GPa at 900 °C. These values are lower than the corresponding results obtained for the 001-oriented V0.5Mo0.5Nx films. In addition, film wear resistance increases with increasing Ts, while the coefficient of friction, under 1000 μN loads, is 0.09 ± 0.01 for all layers.
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Growth and mechanical properties of 111-oriented V0.5Mo0.5Nx/Al2O3(0001) thin films
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September 2018
Research Article|
August 17 2018
Growth and mechanical properties of 111-oriented V0.5Mo0.5Nx/Al2O3(0001) thin films
Hanna Kindlund;
Hanna Kindlund
a)
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
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Jun Lu;
Jun Lu
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
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Esteban Broitman;
Esteban Broitman
b)
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
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Ivan Petrov;
Ivan Petrov
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
2
Department of Materials Science, Fredrick Seitz Materials Research Laboratory, University of Illinois
, 104 South Goodwin, Urbana, Illinois 61801
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J. E. Greene;
J. E. Greene
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
2
Department of Materials Science, Fredrick Seitz Materials Research Laboratory, University of Illinois
, 104 South Goodwin, Urbana, Illinois 61801
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Jens Birch;
Jens Birch
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
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Lars Hultman
Lars Hultman
1
Thin Film Physics Division, Department of Physics (IFM), Linköping University
, SE-58183 Linköping, Sweden
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a)
Electronic mail: hanki@ifm.liu.se
b)
Present address: SKF Research and Development Centre, 3430 DT Nieuwegein, Utrecht, The Netherlands.
J. Vac. Sci. Technol. A 36, 051512 (2018)
Article history
Received:
June 15 2018
Accepted:
July 26 2018
Citation
Hanna Kindlund, Jun Lu, Esteban Broitman, Ivan Petrov, J. E. Greene, Jens Birch, Lars Hultman; Growth and mechanical properties of 111-oriented V0.5Mo0.5Nx/Al2O3(0001) thin films. J. Vac. Sci. Technol. A 1 September 2018; 36 (5): 051512. https://doi.org/10.1116/1.5045048
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