Electronic applications of carbon nanotubes (CNTs) require the deposition of dielectric films on the tubes while conserving their excellent electronic properties. In our density functional theory study, the authors use the trimethylaluminum (TMA) atomic layer deposition (ALD) as a model process for a CNT-functionalization. Since this functionalization relies on the presence of OH-groups, the CNTs are exposed to a water or oxygen pretreatment. The authors show that only CNTs with a single-vacancy defect are able to react with H2O or O2. Further, the defect is preferably saturated by oxygen. This leaves the CNT without the necessary hydroxyl groups for the first TMA addition. Therefore, the authors propose an alternative initial step after which a classical TMA ALD process can be performed on the CNT.
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January 2017
Research Article|
November 18 2016
Ab initio study of the trimethylaluminum atomic layer deposition process on carbon nanotubes—An alternative initial step
Anja Förster;
Anja Förster
a)
Technische Universität Chemnitz
, 09126 Chemnitz, Germany and Fraunhofer Institute for Electronic Nano Systems (ENAS), 09126 Chemnitz, Germany
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Christian Wagner;
Christian Wagner
Center for Microtechnologies (ZfM)
, TU Chemnitz, 09126 Chemnitz, Germany
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Jörg Schuster;
Jörg Schuster
b)
Fraunhofer Institute for Electronic Nano Systems (ENAS)
, 09126 Chemnitz, Germany
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Joachim Friedrich
Joachim Friedrich
Technische Universität Chemnitz
, 09126 Chemnitz, Germany
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a)
Present address: Center for Advancing Electronics Dresden (cfaed), TU Dresden, 01062 Dresden, Germany.
b)
Electronic mail: joerg.schuster@enas.fraunhofer.de
J. Vac. Sci. Technol. A 35, 01B113 (2017)
Article history
Received:
September 01 2016
Accepted:
November 01 2016
Citation
Anja Förster, Christian Wagner, Jörg Schuster, Joachim Friedrich; Ab initio study of the trimethylaluminum atomic layer deposition process on carbon nanotubes—An alternative initial step. J. Vac. Sci. Technol. A 1 January 2017; 35 (1): 01B113. https://doi.org/10.1116/1.4968196
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