Summary Abstract: High resolution synchrotron photoemission study of silicon–metal interfaces

Purtell, R.; Levi, A.; Rubloff, G.; Ho, P. S.

doi:10.1116/1.573284

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Dissertation| May 01 1985

Summary Abstract: High resolution synchrotron photoemission study of silicon–metal interfaces

R. Purtell;

R. Purtell

IBM T. J. Watson Research Center, Yorktown Heights, New York 10598

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A. Levi;

A. Levi

IBM T. J. Watson Research Center, Yorktown Heights, New York 10598

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G. Rubloff;

G. Rubloff

IBM T. J. Watson Research Center, Yorktown Heights, New York 10598

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P. S. Ho

IBM T. J. Watson Research Center, Yorktown Heights, New York 10598

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J. Vac. Sci. Technol. A 3, 690–691 (1985)

https://doi.org/10.1116/1.573284

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Summary Abstract: High resolution synchrotron photoemission study of silicon–metal interfaces

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