films were grown on MgO(111) by co-sputtering Fe and Pt. Composition of the films was determined by Rutherford backscattering spectrometry with an accuracy of 1%. Epitaxy and alloy ordering were quantified by x-ray diffraction and the order parameter was determined to be 0.97 for a film with and 0.99 for a film with . Neutron diffraction measurements established the presence of an antiferromagnetic phase at in 500 nm samples grown on MgO(111). Since can be grown as an ordered antiferromagnet and a disordered ferromagnet, these films provide a pathway to grow lattice matched interfaces for exchange bias studies.
Growth and characterization of epitaxial films on MgO(111)
P. Mani, V. V. Krishnamurthy, S. Maat, A. J. Kellock, J. L. Robertson, G. J. Mankey; Growth and characterization of epitaxial films on MgO(111). J. Vac. Sci. Technol. A 1 July 2005; 23 (4): 785–789. https://doi.org/10.1116/1.1885020
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