FexPt100x films were grown on MgO(111) by co-sputtering Fe and Pt. Composition of the films was determined by Rutherford backscattering spectrometry with an accuracy of 1%. Epitaxy and alloy ordering were quantified by x-ray diffraction and the order parameter was determined to be 0.97 for a film with x=30 and 0.99 for a film with x=25. Neutron diffraction measurements established the presence of an antiferromagnetic phase at T=100K in 500 nm FePt3 samples grown on MgO(111). Since FePt3 can be grown as an ordered antiferromagnet and a disordered ferromagnet, these films provide a pathway to grow lattice matched interfaces for exchange bias studies.

1.
S.
Maat
,
O.
Hellwig
,
G.
Zeltzer
 et al,
Phys. Rev. B
63
,
134426
(
2001
).
2.
G. E.
Bacon
and
J.
Crangle
,
Proc. R. Soc. London, Ser. A
272
,
387
(
1963
).
3.
Y.
Tsunoda
,
D.
Tsuchiya
, and
Y.
Higashiyama
,
J. Phys. Soc. Jpn.
72
,
713
(
2003
).
4.
V. V.
Krishnamurthy
,
I.
Zoto
,
G. J.
Mankey
 et al,
Phys. Rev. B
70
,
024424
(
2004
).
5.
B. D.
Cullity
,
Elements of X-ray Diffraction
(
Addison-Wesley
, Reading,
1978
).
6.
R. L.
Compton
,
M. J.
Pechan
,
S.
Maat
 et al,
Phys. Rev. B
66
,
054411
(
2002
).
7.
Stefan
Maat
, Master’s thesis,
The University of Alabama
,
2000
.
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