films were grown on MgO(111) by co-sputtering Fe and Pt. Composition of the films was determined by Rutherford backscattering spectrometry with an accuracy of 1%. Epitaxy and alloy ordering were quantified by x-ray diffraction and the order parameter was determined to be 0.97 for a film with and 0.99 for a film with . Neutron diffraction measurements established the presence of an antiferromagnetic phase at in 500 nm samples grown on MgO(111). Since can be grown as an ordered antiferromagnet and a disordered ferromagnet, these films provide a pathway to grow lattice matched interfaces for exchange bias studies.
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.© 2005 American Vacuum Society.
2005
American Vacuum Society
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