The organic light-emitting diode (OLED) drive current provided by a simple 2 thin film transistor (TFT) hydrogenated amorphous silicon active matrix OLED (AMOLED) voltage programmed pixel circuit drops over time due to threshold voltage increase in the drive TFT. shift compensating current programmed 4-TFT circuits have been developed to overcome this problem and to keep the drive current constant, thereby prolonging the life of the display. In this article, we present a thorough analysis of the static and dynamic operation of such circuits and derive theoretical limits for the extent of compensation. Measurement results of circuit characteristics and stability are presented which demonstrate that it is feasible to use for AMOLED back planes. The advantages and drawbacks of current programmed circuits are also outlined from the perspective of active matrix back-plane design.
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May 2004
11th Canadian Semiconductor Technology Conference
18-22 August 2003
Ottawa, Canada
Research Article|
May 18 2004
Analysis and characterization of self-compensating current programmed active matrix organic light-emitting diode pixel circuits
Kapil Sakariya;
Kapil Sakariya
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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Sanjiv Sambandan;
Sanjiv Sambandan
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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Peyman Servati;
Peyman Servati
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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Arokia Nathan
Arokia Nathan
Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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J. Vac. Sci. Technol. A 22, 1001–1004 (2004)
Article history
Received:
September 12 2003
Accepted:
February 23 2004
Citation
Kapil Sakariya, Sanjiv Sambandan, Peyman Servati, Arokia Nathan; Analysis and characterization of self-compensating current programmed active matrix organic light-emitting diode pixel circuits. J. Vac. Sci. Technol. A 1 May 2004; 22 (3): 1001–1004. https://doi.org/10.1116/1.1705583
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