The single-walled carbon-nanotube (SWNT) was grown directly onto the top of the conventional Si atomic force microscopy (AFM) cantilever. This SWNT AFM cantilever was introduced into the AFM nano-oxidation process, which oxidized the titanium (Ti) metal film on the atomically flat substrate and formed the ultranarrow oxidized titanium line of 5 nm width. This line was used as the tunnel junction of the single-electron transistor (SET), and the SET fabricated by this process showed room-temperature Coulomb oscillation with periods of 1 V. It was determined by three-dimensional simulation that the tunnel-junction capacitance shows only weak dependence on the tunnel-junction width.
REFERENCES
1.
K. Yano, T. Ishii, T. Hashimoto, T. Kobayashi, F. Murai, and K. Seki, Tech. Dig. Int. Electron Devices Meet. 541 (1993).
2.
K.
Nakazato
, T. J.
Thornton
, J.
White
, and H.
Ahmed
, Electron. Lett.
29
, 384
(1993
).3.
T. A.
Fulton
and G. J.
Dolan
, Phys. Rev. Lett.
59
, 109
(1987
).4.
K.
Matsumoto
, M.
Ishii
, K.
Segawa
, Y.
Oka
, B. J.
Vartanian
, and J. S.
Harris
, Appl. Phys. Lett.
68
, 34
(1996
).5.
6.
K. Matsumoto, Y. Gotoh, T. Maeda, J. A. Dagata, and J. S. Harris, Tech. Dig. Int. Electron Devices Meet. 449 (1998).
7.
K.
Matsumoto
, S.
Takahashi
, M.
Ishii
, M.
Hoshi
, A.
Kurokawa
, S.
Ichimura
, and A.
Ando
, Jpn. J. Appl. Phys., Part 1
34
, 1387
(1995
).8.
J. A.
Dagata
, T.
Inoue
, J.
Itoh
, K.
Matsumoto
, and H.
Yokoyama
, J. Appl. Phys.
84
, 6891
(1998
).9.
J. A.
Dagata
, T.
Inoue
, J.
Itoh
, and H.
Yokoyama
, Appl. Phys. Lett.
73
, 271
(1998
).10.
11.
E. B. Cooper, S. R. Manalis, H. Fang, H. Dai, K. Matsumoto, S. C. Minne, T. Hunt, and C. F. Quate, Appl. Phys. Lett. (to be published).
12.
R. J. Chen, H. Fang, N. R. Franklin, H. T. Soh, E. Chan, J. Kong, E. Cooper, S. Manalis, C. F. Quate, and H. Dai, Science (to be published).
13.
J. H.
Hafner
, C. L.
Chueng
, and C. M.
Lieber
, Nature (London)
398
, 761
(1999
).14.
J. H.
Hafner
, C. L.
Chueng
, and C. M.
Lieber
, J. Am. Chem. Soc.
121
, 9750
(1999
).
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