The diffusion coefficient of copper in amorphous germanium is estimated to be larger than 3×10−11cm2 s−1 and the solubility to be ∼7×1018cm−3 at 200 °C as determined from secondary mass spectrometry. The observed solubility limit is more than eight orders of magnitude greater than that in crystalline germanium and the enthalpy of a solution of copper in amorphous germanium is estimated to be as low as 0.05 eV in the range of 20–200 °C. Copper is observed to diffuse more readily in amorphous germanium than in amorphous silicon, with an activation enthalpy as low as 0.5 eV in the range of 20–200 °C. Interstitial diffusion is assumed to prevail and the trapping enthalpy of defects retarding the motion is found to be significantly lower in amorphous germanium (0.25±0.15 eV) compared to that in amorphous silicon (∼0.8 eV).

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