Atomic force and low current scanning tunneling microscopy characterization of duplex and quadruplex DNA (“G-wire”) morphology adsorbed on to mica reveals very different topography. This observation contradicts similar dimensions for the two molecules as determined by spectroscopic techniques. In the work presented here, the diameter of duplex DNA, as measured by height above the mica background, was 25% of that observed by x-ray crystallographic methods. However, the G-wire diameter was similar to that determined by nuclear magnetic resonance and crystallographic methods. These observations appear to be independent of the residual buffer or scanning probe microscopy (SPM) technique used. The SPM observed widths of these molecules are similar and supports a model in which duplex DNA is pinned flat to the mica substrate. These morphological differences may be related to the variations in intermolecular forces with the mica substrate and intramolecular forces holding the polymers together.
Skip Nav Destination
Article navigation
May 1998
Papers from the 44th national symposium of the AVS
20-24 Oct 1997
San Jose, California (USA)
Research Article|
May 01 1998
The morphology of duplex and quadruplex DNA on mica
Tera Muir;
Tera Muir
Department of Biology, California State University, Fresno, California 93740
Search for other works by this author on:
Emily Morales;
Emily Morales
Department of Biology, California State University, Fresno, California 93740
Search for other works by this author on:
Jeffrey Root;
Jeffrey Root
Department of Biology, California State University, Fresno, California 93740
Search for other works by this author on:
Indira Kumar;
Indira Kumar
Department of Biology, California State University, Fresno, California 93740
Search for other works by this author on:
Brian Garcia;
Brian Garcia
Department of Music, California State University, Fresno, California 93740
Search for other works by this author on:
Christian Vellandi;
Christian Vellandi
Department of Chemistry, California State University, Fresno, California 93740
Search for other works by this author on:
Dena Jenigian;
Dena Jenigian
Department of Biology, Mt. Holyoke College, Holyoke, Massachusetts
Search for other works by this author on:
Thomas Marsh;
Thomas Marsh
373 Old Highway 8, Apartment 103, New Brighton, Minnesota 55112
Search for other works by this author on:
Eric Henderson;
Eric Henderson
Department of Zoology and Genetics, Iowa State University, Ames, Iowa 50011
Search for other works by this author on:
James Vesenka
James Vesenka
Department of Physics, California State University, Fresno, California 93740
Search for other works by this author on:
J. Vac. Sci. Technol. A 16, 1172–1177 (1998)
Article history
Received:
September 29 1997
Accepted:
March 09 1998
Citation
Tera Muir, Emily Morales, Jeffrey Root, Indira Kumar, Brian Garcia, Christian Vellandi, Dena Jenigian, Thomas Marsh, Eric Henderson, James Vesenka; The morphology of duplex and quadruplex DNA on mica. J. Vac. Sci. Technol. A 1 May 1998; 16 (3): 1172–1177. https://doi.org/10.1116/1.581254
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Surface passivation approaches for silicon, germanium, and III–V semiconductors
Roel J. Theeuwes, Wilhelmus M. M. Kessels, et al.
Growth and optical properties of NiO thin films deposited by pulsed dc reactive magnetron sputtering
Faezeh A. F. Lahiji, Samiran Bairagi, et al.
Novel high-efficiency plasma nitriding process utilizing a high power impulse magnetron sputtering discharge
A. P. Ehiasarian, P. Eh. Hovsepian
Related Content
Study on the stability of the Quadruplex DNA Structure formed by the human telomeric repeat sequence d [ AG 3 ( TTAGGG ) 3 ]
AIP Conference Proceedings (November 2008)
Hydration Layer Scanning Tunneling Microscopy of “G‐wire” DNA
AIP Conference Proceedings (September 2004)
Comparative scanning probe microscopy study of the surface morphology of Au films grown from the vapor onto glass, fused silica, and muscovite mica
J. Vac. Sci. Technol. A (July 1993)
Molecular beam epitaxy growth of thin films of SnS2 and SnSe2 on cleaved mica and the basal planes of single‐crystal layered semiconductors: Reflection high‐energy electron diffraction, low‐energy electron diffraction, photoemission, and scanning tunneling microscopy/atomic force microscopy characterization
J. Vac. Sci. Technol. A (May 1995)
Probing the duplex stainless steel phases via magnetic force microscopy
J. Appl. Phys. (March 2008)