A chemically assisted ion beam etching system has been developed which performs high quality, highly anisotropic etching of AlGaAs/GaAs at relatively low ion energies (200 eV). The use of three grid ion optics in a Kaufman ion source allows etching at low energies with reasonable rates without loss of profile verticality. All ultrahigh vacuum etching chamber construction with a high throughput turbomolecular pump and high vacuum loadlock provide routine high quality etching of AlGaAs without the use of etch chamber cryo panels or cryo pumps. Low ion energy and a clean vacuum environment permit the use of a single level, non hard baked photoresist mask. Benefits include high pattern resolution and fidelity, low mask erosion rate, good dimensional control, and easy, complete mask stripping as well as reduced substrate damage.
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May 1997
The 43rd national symposium of the American Vacuum Society
14-18 Oct 1996
Philadelphia, Pennsylvania (USA)
Research Article|
May 01 1997
Ultrahigh vacuum chemically assisted ion beam etching system with a three grid ion source
John V. Hryniewicz;
John V. Hryniewicz
University of Maryland Baltimore County, Baltimore, Maryland 21228
Laboratory for Physical Sciences, College Park, Maryland 20740
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Y. J. Chen;
Y. J. Chen
University of Maryland Baltimore County, Baltimore, Maryland 21228
Laboratory for Physical Sciences, College Park, Maryland 20740
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Shih Hsiang Hsu;
Shih Hsiang Hsu
University of Maryland Baltimore County, Baltimore, Maryland 21228
Laboratory for Physical Sciences, College Park, Maryland 20740
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Chau-Han D. Lee;
Chau-Han D. Lee
University of Maryland Baltimore County, Baltimore, Maryland 21228
Laboratory for Physical Sciences, College Park, Maryland 20740
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Gyorgy A. Porkolab
Gyorgy A. Porkolab
University of Maryland Baltimore County, Baltimore, Maryland 21228
Laboratory for Physical Sciences, College Park, Maryland 20740
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J. Vac. Sci. Technol. A 15, 616–621 (1997)
Article history
Received:
September 30 1996
Accepted:
January 14 1997
Citation
John V. Hryniewicz, Y. J. Chen, Shih Hsiang Hsu, Chau-Han D. Lee, Gyorgy A. Porkolab; Ultrahigh vacuum chemically assisted ion beam etching system with a three grid ion source. J. Vac. Sci. Technol. A 1 May 1997; 15 (3): 616–621. https://doi.org/10.1116/1.580693
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