The electrostatic effect on the seed cone evolution at Ar+‐bombarded Cu(111) surfaces was investigated by means of high‐resolution transmission electron microscopy. A simultaneous supply of Mo seeds to the target biased at positive 100–150 V was found to induce an oriented growth of nanometer thick Mo layers on the cone slopes receiving high seed fluxes. In the seed layers thus grown, Mo atoms were so arranged that Mo〈100〉 was parallel with the ion‐incidence direction, suggesting that depositing Mo atoms were forcibly stacked very close to one another along the ion beam, by a strong electrostatic field generated at the growth front of seed layer. Evidence is also presented that the seed layers were grown via a particle supply process of Kossel type.
Seed cone evolution on positively charged Cu targets: Preliminary study by high‐resolution electron microscopy
Y. Mori, Y. Fujimoto, F. Okuyama; Seed cone evolution on positively charged Cu targets: Preliminary study by high‐resolution electron microscopy. J. Vac. Sci. Technol. A 1 November 1992; 10 (6): 3584–3587. https://doi.org/10.1116/1.577788
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