Structural and geometrical properties of cones developed on Cu surfaces bombarded with obliquely incident Ar+ ions while simultaneously supplying ‘‘seeds’’ by sputtering were determined in atomic detail, by means of high‐resolution electron microscopy. The seed materials employed were Mo, W, Ta, Ti, and Pt, and sputtered seed atoms were found to coat the upper cone slopes which received high seed fluxes, independently of seed species. The seed films thus formed were monocrystalline for Mo, W, and Pt, and amorphous or semiamorphous for Ta and Ti. Geometrically, the cones induced by Mo, W, Ta, and Ti were conelike, but those formed on the Pt‐seeded surfaces were tentlike rather than conelike. For the conelike geometries, the tip of seed layer was grown so as to shield the substrate part of the cone from the ion beam. Perhaps, seed atoms must be more resistant to sputtering than target atoms, for seed cones to be conelike.
Skip Nav Destination
Article navigation
July 1992
38th National Symposium of the American Vacuum Society
11−15 Nov 1991
Seattle, Washington (USA)
Research Article|
July 01 1992
Structural and geometrical features of copper seed cones observed by high‐resolution electron microscopy
Y. Mori;
Y. Mori
Applied Physics Laboratory, Department of Systems Engineering, Nagoya Institute of Technology, Gokiso‐cho, Showa‐ku, Nagoya 466, Japan
Search for other works by this author on:
Y. Fujimoto;
Y. Fujimoto
Applied Physics Laboratory, Department of Systems Engineering, Nagoya Institute of Technology, Gokiso‐cho, Showa‐ku, Nagoya 466, Japan
Search for other works by this author on:
F. Okuyama
F. Okuyama
Applied Physics Laboratory, Department of Systems Engineering, Nagoya Institute of Technology, Gokiso‐cho, Showa‐ku, Nagoya 466, Japan
Search for other works by this author on:
J. Vac. Sci. Technol. A 10, 2810–2815 (1992)
Article history
Received:
September 10 1991
Accepted:
February 17 1992
Citation
Y. Mori, Y. Fujimoto, F. Okuyama; Structural and geometrical features of copper seed cones observed by high‐resolution electron microscopy. J. Vac. Sci. Technol. A 1 July 1992; 10 (4): 2810–2815. https://doi.org/10.1116/1.577915
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Small Si clusters on surfaces of carbon nanotubes
J. Appl. Phys. (December 2006)
Microcrystalline structure in glow‐discharge‐produced silicon films
Appl. Phys. Lett. (February 1981)
Auger electron and x‐ray photoelectron spectroscopy of sputter deposited aluminum nitride
Journal of Applied Physics (April 1984)
The dependence of aluminum nitride film crystallography on sputtering plasma composition
Journal of Vacuum Science & Technology A (April 1983)
Dissimilar laser spot welding of aluminum alloy to steel in keyhole mode
J. Laser Appl. (December 2021)