Summary Abstract: Metal–amorphous Si interfaces: Structural and electrical properties

Tsai, C. C.; Thompson, M. J.; Nemanich, R. J.; Jackson, W. B.; Stafford, B. L.

doi:10.1116/1.572000

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Dissertation| April 01 1983

Summary Abstract: Metal–amorphous Si interfaces: Structural and electrical properties

C. C. Tsai;

C. C. Tsai

Xerox Palo Alto Research Center, Palo Alto, California 94304

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M. J. Thompson;

M. J. Thompson

Xerox Palo Alto Research Center, Palo Alto, California 94304

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R. J. Nemanich;

R. J. Nemanich

Xerox Palo Alto Research Center, Palo Alto, California 94304

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W. B. Jackson;

W. B. Jackson

Xerox Palo Alto Research Center, Palo Alto, California 94304

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B. L. Stafford

Xerox Palo Alto Research Center, Palo Alto, California 94304

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J. Vac. Sci. Technol. A 1, 785–786 (1983)

https://doi.org/10.1116/1.572000

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Summary Abstract: Metal–amorphous Si interfaces: Structural and electrical properties

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