Quantum metrology holds the promise of an early practical application of quantum technologies, in which measurements of physical quantities can be made with much greater precision than what is achievable with classical technologies. In this Review, the authors collect some of the key theoretical results in quantum parameter estimation by presenting the theory for the quantum estimation of a single parameter, multiple parameters, and optical estimation using Gaussian states. The authors give an overview of results in areas of current research interest, such as Bayesian quantum estimation, noisy quantum metrology, and distributed quantum sensing. The authors address the question of how minimum measurement errors can be achieved using entanglement as well as more general quantum states. This review is presented from a geometric perspective. This has the advantage that it unifies a wide variety of estimation procedures and strategies, thus providing a more intuitive big picture of quantum parameter estimation.
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February 2020
Review Article|
February 11 2020
Geometric perspective on quantum parameter estimation
Jasminder S. Sidhu
;
Jasminder S. Sidhu
a)
Department of Physics and Astronomy, The University of Sheffield
, Sheffield S3 7RH, United Kingdom
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Pieter Kok
Pieter Kok
b)
Department of Physics and Astronomy, The University of Sheffield
, Sheffield S3 7RH, United Kingdom
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a)
Electronic mail: [email protected]
b)
Electronic mail: [email protected]
Note: This paper is part of the special topic on Quantum Sensing and Metrology.
AVS Quantum Sci. 2, 014701 (2020)
Article history
Received:
July 15 2019
Accepted:
January 07 2020
Citation
Jasminder S. Sidhu, Pieter Kok; Geometric perspective on quantum parameter estimation. AVS Quantum Sci. 1 February 2020; 2 (1): 014701. https://doi.org/10.1116/1.5119961
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