Focusing of fast transverse modes in silicon and slow transverse modes in zinc

This paper presents focusing of fast transverse (FT) modes in silicon and slow transverse (ST) modes in zinc, both observed at utrasonic frequencies. Using a (001)‐oriented silicon disk, the FT modes are generated and detected by two tiny shear PZT transducers, both polarized in the [100] direction. One transducer fixed on the bottom surface acts as a source and the other serves as a detector scanning the top surface along the [100] direction across various points on the [010] axis at some distances away from the epicenter. The observed focusing pattern indicates strong concentration of FT modes on the narrow band about the (100) plane containing the source. For a (001)‐oriented zinc crystal, strong focusing of ST or quasi‐transverse (QT) modes toward the symmetry direction is observed: first in theoretical and experimental, epicentral Green’s functions; second with very small PZT source and PZT detector; finally with focused pulsed laser excitation and small PZT detector. The focusing patterns observed both in silicon and in zinc are consistent with the results predicted by the theory of phonon focusing. [Work supported by ONR.]